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microscope Product List and Ranking from 31 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. ピーテック Osaka//Medical Devices
  3. null/null
  4. 4 null/null
  5. 5 レイマー Osaka//Optical Instruments
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microscope Product ranking

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. White interference microscope equipped with laser microscope 'VK-X3000'
  2. All-in-one fluorescence microscope 'BZ-X1000 Series'
  3. Digital Phase Contrast Microscope "P-Scope V" ピーテック
  4. 4 Microscope "P-Scope PRO" ピーテック
  5. 5 All-in-one fluorescence microscope 'BZ-X800'

microscope Product List

46～60 item / All 355 items

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Infrared microscope "IR-1300RL"

Infrared microscope "IR-1300RL"

An infrared reflection microscope system for measuring the dimensions of various interface parts of silicon devices with clear images.

The "IR1300RL" is an infrared microscope that uses the Olympus BX53 microscope body. With a high-resolution infrared CMOS camera and image enhancement software, it can measure the dimensions of various parts of the interfaces of silicon devices with clear images. Additionally, the unique image enhancement software allows for the measurement of alignment mark shifts in bonded wafers. 【Features】 ■ Measures the dimensions of various parts of the interfaces of silicon devices with clear images ■ Uses the Olympus BX53 microscope body ■ Manual operation type for X, Y, and Z axes ■ Capable of measuring alignment mark shifts *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

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Ultra-high vacuum, ultra-low temperature, strong magnetic field scanning probe microscope system USM1300

Ultra-high vacuum, ultra-low temperature, strong magnetic field scanning probe microscope system USM1300

High-end model of ultra-low temperature and strong magnetic field STM! It is utilized both domestically and internationally, contributing to cutting-edge research in surface physics.

This is a high-performance STM that achieves the lowest reaching temperature and strong magnetic fields among commercially available products, actively contributing to the forefront of surface science research. It can be equipped with the necessary sample pretreatment systems tailored to research objectives. It is an essential research facility for cutting-edge superconductivity and low-temperature physics research.

  • Microscope
  • Analytical Equipment and Devices
  • others

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Ultra-high vacuum, ultra-low temperature scanning probe microscope USM1500

Ultra-high vacuum, ultra-low temperature scanning probe microscope USM1500

A mid-range model of an ultra-low temperature strong magnetic field compatible SPM, compacted from the USM1300 type.

This is a new type of ultra-low temperature strong magnetic field SPM system with a low overall height, excellent operability, and cost performance. AFM measurements can also be supported as an option.

  • Analytical Equipment and Devices

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Diamond Express 2 for Infrared Microscope (Micro IR)

Diamond Express 2 for Infrared Microscope (Micro IR)

Standard of Compression Cell

■ This is a diamond cell that can uniformly crush thick samples into thin layers. ■ By thinning the sample, it becomes possible to obtain spectra without saturation during FTIR microscopic measurements. ■ When sampling, using Axis Pro makes it easy to place the target object at the desired position in the center of the diamond cell. ■ If you want to transfer the pressed and thinly sliced object to the transmission window for micro IR, it can be done using Axis Pro. *For more details, please contact us via the related links below.*

  • Other electronic parts

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Field Ion Microscopy (FIM)

Field Ion Microscopy (FIM)

Field Ion Microscopy (FIM)

●Features The Field Ion Microscope (FIM) is a projection-type microscope that allows for easy observation of the surface atomic images of sharply pointed metal tips. It was invented in 1951 by Professor Erwin E. Mueller at Pennsylvania State University. This device operates in an ultra-high vacuum environment, gradually increasing the voltage applied to a metal tip (probe) set as the sample, which causes the FIM image to appear on a screen, allowing for the visual observation of the surface atomic irregularities of the needle-like sample magnified approximately one million times. Simultaneously, the application of voltage to the tip provides a cleaning effect that removes impurities adhering to the surface of the tip. Furthermore, by increasing the voltage applied to the tip, field evaporation can be induced, allowing individual atoms to be stripped away and enabling precise adjustment of the number of atoms at the tip. The excellent characteristics of this device are utilized not only for atomic-level observation of metals but also for tip evaluation in scanning tunneling microscopy, where a sharp metal tip is essential. It has a wide range of applications and is adopted in many research laboratories and university research facilities.

  • Analytical Equipment and Devices
  • Microscope
  • Other laboratory equipment and containers

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Observation of micro-nano domain morphology using High-Resolution Transmission Electron Microscopy (HR-TEM)

Observation of micro-nano domain morphology using High-Resolution Transmission Electron Microscopy (HR-TEM)

We provide contract analysis services equipped with devices for physical analysis, and we also offer on-site analysis.

The main equipment includes "HR-TEM," "Q-pole type SIMS," "μESCA," and "RAMAN." We have accumulated know-how in micro and nano-level surface analysis, allowing us to provide reliable data in a short period. We also offer advice on the analysis of unknown samples. 【Observation of Micro Areas - High-Resolution Transmission Electron Microscopy (HR-TEM)】 ○ A method that irradiates a thinly processed sample with a high-speed electron beam, providing magnified images and information on crystal structures through the imaging of transmitted and scattered electrons. ○ It is suitable for evaluating the structure and crystallinity of thin films. High-resolution observation enables the examination of crystal structures. ● For more details, please download the catalog or contact us.

  • Food Testing/Analysis/Measuring Equipment

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Synchrotron Radiation Scanning Transmission X-ray Microscope 'STXM'

Synchrotron Radiation Scanning Transmission X-ray Microscope 'STXM'

Diverse sample environments such as gas filling and UHV! Hard and soft collaboration with the synchrotron beamline is possible.

The "STXM" is a compact and rigidly designed scanning transmission X-ray microscope for synchrotron radiation. It features a combination of detection methods such as transmission, fluorescence, and electron yield. Utilizing a zone plate, it boasts a high spatial resolution of 20 to 100 nm. We customize and develop user-friendly data acquisition software according to our customers' needs. 【Features】 ■ High spatial resolution using a zone plate ■ Position stability of less than 5 nm ■ Compact and rigid design ■ Combination measurement of detectors ■ User-friendly data acquisition software ■ Hardware and software integration with synchrotron beamlines *For more details, please refer to the PDF document or feel free to contact us.

  • Optical microscope
  • Electron microscope
  • Laser microscope

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Video microscope

Video microscope

Video microscope

Video microscope with a C-mount adapter and a rotatable optical tube section that can rotate 360 degrees. 【Features】 ○ Optical Tube Section - 360-degree rotation with C-mount adapter - Manual 4-hole revolving nosepiece - Built-in 1X imaging lens - Coaxial reflected illumination mount (light source: optional) ○ Focusing Section - Uniaxial manual coarse and fine focus handle (movement: 50mm/coarse focus 1 rotation: 3.8mm/fine focus 1 rotation: 0.1mm) ○ Objective Lens - LDM series long working distance infinity-corrected optical system (common focal point: 95mm/image side focal point: 200mm design) ○ Stand - Pole-type stand, flat stage or mechanical stage, selectable as an option ● For other functions and details, please download the catalog.

  • Electron microscope
  • Other microscopes

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Wireless Digital Microscope '3R-WM601WIFI'

Wireless Digital Microscope '3R-WM601WIFI'

Achieving wireless operation! It performs well even in environments where the cord made it difficult to use the microscope.

The "3R-WM601WIFI" is a wireless digital microscope that displays images captured by the microscope on a tablet or smartphone with WiFi functionality. Captured data can also be saved directly within the device. Additionally, it supports both wireless and wired connections, allowing you to choose the connection method according to the usage environment, such as using a wired connection in environments with wireless restrictions. 【Features of the dedicated app】 ■ Can compare with dual screen display ■ Allows continuous measurement within the same image ■ Measured values can be used in other images ■ Can save correction results ■ Scale display is possible *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

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Optical microscope transmission phase-shift laser interference microscope

Optical microscope transmission phase-shift laser interference microscope

Optical microscope transmission phase-shifting laser interference microscope

This is a new type of microscope positioned above conventional optical microscopes, capable of measuring refractive index distribution and thickness structure quickly and quantitatively, and visualizing it in three dimensions. 【Features】 ○ By applying laser interference methods, it can non-contact measure the refractive index and height of samples. ○ High speed… measurement time is a few seconds ○ High precision… phase measurement accuracy ±(1/150) λ, refractive index difference measurement accuracy ±0.0001, height measurement accuracy ±0.2μm ○ Spatial resolution… equivalent to optical microscopes ● For more details, please contact us or download the catalog.

  • Optical microscope

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FT-IR and QCL Microscope "HYPERION II Series"

FT-IR and QCL Microscope "HYPERION II Series"

A research and development FT-IR microscope with flexible expandability. It is possible to incorporate imaging functions using QCL infrared lasers into a single device.

HYPERION II is a technological innovation in infrared microscopy. It has achieved diffraction-limited infrared imaging and set a standard in micro ATR. Furthermore, it is the world's first system that integrates both FT-IR microscopy and infrared laser imaging microscopy (ILIM) functionalities in a single device for all measurement modes: transmission, reflection, and ATR. *For more details, please refer to the PDF document or feel free to contact us.*

  • Spectroscopic Analysis Equipment

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