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santec Holdings

EstablishmentAugust 25, 1979
capital497856Ten thousand
number of employees184
addressAichi/Komaki-shi/Dacasuneyama Uesaka 5823
phone0568-79-3536
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last updated:Feb 19, 2026
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波長可変レーザ 波長可変レーザ
波長可変フィルタ 波長可変フィルタ
光学特性検査システム 光学特性検査システム
ビジネスソリューション ビジネスソリューション
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Optical 3D Measuring Instrument "OPS-1000"

An ultra-sensitive model with over 100 times the minimum light reception sensitivity compared to conventional methods!

The "OPS-1000" is an optical three-dimensional measuring device that applies the technology of high-speed wavelength-variable lasers to interferometric measurement. With high-speed measurement of up to 100,000 points per second, it enables complete automated inspection in the manufacturing process. Coaxial measurement allows for easy measurement of complex shapes. It achieves a minimum light reception sensitivity of 100 dB and a dynamic range of 70 dB. It offers world-class performance among three-dimensional measuring devices. 【Features】 ■ Ultra-high sensitivity - Minimum light reception sensitivity of 100 dB and a dynamic range of 70 dB ■ High-speed measurement - Enables complete automated inspection in the manufacturing process with high-speed measurement of up to 100,000 points per second ■ Coaxial measurement - Allows for easy measurement of complex shapes through coaxial measurement *For more details, please download the PDF or feel free to contact us.

  • 3D measuring device

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Wafer Thickness Distribution Measurement Device "TMS-2000"

Non-contact measurement of flatness with a repeatability of 1nm is possible!

The TMS-2000 is a super high-precision wafer thickness distribution measurement device with innovative hardware design and high resistance to environmental changes. It enables inline inspection of various wafer materials such as silicon (up to P+++), SiC, sapphire, glass, LiNb3, and SOI, allowing for a wide range of applications that take advantage of high throughput and compact size. It adopts a spiral scan method that balances high speed and high-density measurement. The compact design allows for space-saving placement. 【Features】 - Stable thickness measurement based on high resistance to environmental temperature changes and vibrations - Sub-nanometer repeat measurement accuracy - High flexibility in scanning methods to measure thickness distribution on the wafer surface - Measurement possible even when attached to jigs with light irradiation from one side - Differential analysis possible with multiple different wafers - Measurement of evaluation parameters compliant with SEMI standards *For more details, please download the PDF or feel free to contact us.

  • Other electronic measuring instruments

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Optical Coherence Tomography (High Resolution Type) 'IVS-2000-HR'

Even in a scattered medium, light can penetrate easily, making it suitable for measuring strongly scattering objects!

The "IVS-2000-HR" is an SS-OCT system with a high resolution centered at a wavelength of 1310nm. It has the highest resolution in the IVS series (less than 5um in vivo), enabling measurements with even higher resolution and clarity. The high axial resolution is less than 9um (in air), and the A-line rate is 20kHz. 【Features】 ■ Center wavelength: 1310nm ■ A-line rate: 20kHz ■ High axial resolution: less than 9um (in air) *For more details, please download the PDF or feel free to contact us.

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Optical Coherence Tomography Device 'IVS-2000-LC'

It is possible to perform 3D measurements of objects with varying heights all at once!

The "IVS-2000-LC" is an SS-OCT system with a deep imaging range centered at a wavelength of 1310nm. This wavelength range allows light to penetrate easily even in scattering materials, making it suitable for measuring highly scattering objects. With a deep imaging range (over 18mm in air), it is possible to perform three-dimensional measurements of objects with varying heights all at once. 【Features】 ■ Center wavelength: 1310nm ■ A-line rate: 50kHz ■ High axial resolution: less than 18um (in air) *For more details, please download the PDF or feel free to contact us.

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Optical Coherence Tomography (High-Speed Type) 'IVS-2000-HS'

Even in a scattered medium, light can penetrate easily, making it suitable for measuring objects with strong scattering!

The "IVS-2000-HS" is an SS-OCT system capable of high-speed measurements in the center wavelength range of 1310nm. With high-speed (100kHz) measurements, it can reduce measurement time in inline inspections and other applications. It achieves a high axial resolution of less than 18um (in air), allowing for highly accurate tomographic measurements. 【Features】 ■ Center wavelength: 1310nm ■ A-line rate: 100kHz ■ High axial resolution: less than 18um (in air) *For more details, please download the PDF or feel free to contact us.

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Smart Glasses "M400"

24-bit color, 12 million pixels. Smart glasses are changing the field.

The "M400" is a smart glass equipped with an organic EL display. Its main specifications include an 8 Core 2.52GHz Qualcomm XR1 CPU, 6GB of RAM, 64GB of flash memory, and a weight of 68g (body only). By using Vuzix View, it is also possible to mirror the smart glass screen on a computer. 【Set Contents】 ■ Main unit ■ Frame-mounted battery ■ Frame without lenses ■ Ear hook ■ Carrying case ■ USB Type C to C cable, etc. *For more details, please download the PDF or feel free to contact us.

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AR device "Magic Leap 2"

Visualizing a 1:1 scale model. Effective training, skill enhancement, and increased employee retention.

"Magic Leap 2" is an AR device for businesses that merges the real and digital worlds. Collaborative work using this product enables a natural sense of distance and presence due to its realistic immersion, which not only enhances productivity but also contributes to cost reduction. Additionally, AR training is used for acquiring and developing new employees, as well as for upskilling and retaining the workforce. [Features] ■ Achieves unrestricted remote support ■ Solves issues of knowledge transfer and labor shortages ■ Large-scale models can be manipulated effortlessly *For more details, please download the PDF or feel free to contact us.

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Measuring device "OCT System"

Non-contact, non-destructive, non-invasive!

The OCT system is a real-time non-destructive optical coherence tomography device that utilizes the interference of backscattered near-infrared light, allowing for the visualization of internal structures in biological tissues and samples without the need for them to be transparent in the visible range, and without taking or destroying the samples, unlike electron microscopes or stereo microscopes. The OCT system is a cutting-edge tomographic device that follows X-ray CT, MRI, ultrasound, and confocal microscopy, enabling non-contact, non-destructive, non-invasive, and high-speed measurements. Additionally, 3D imaging is also possible. 【Features】 ■ Non-contact, non-destructive, non-invasive ■ High speed ■ High functionality ■ Wide range ■ 2D and 3D cross-sectional measurement *For more details, please refer to the catalog or feel free to contact us.

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LCOS-based Programmable Optical Filter

LCOS-based Programmable Optical Filter

WSS-2000 is an LCOS-based optical filter that can generate any optical spectrum programmatically. Santec’s proprietary LCOS technology achieves highly flexible bandwidth tuning, attenuation control, and switching operation. It also supports phase control function. WSS-2000 is suitable for evaluation and verification of next-generation optical networks, and can be used for various measurements as an optical equalizer for high-speed signals, DWDM (optical wavelength division multiplexing) and OFDM (orthogonal frequency division multiplexing) channel selection filter, and WSS emulator. Demo units for evaluation are also available.

  • Other optical parts

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High Performance Tunable Laser "TSL-570"

A wavelength-variable laser that achieves higher speed, higher performance, and higher quality than conventional models.

The TSL-570 is a wavelength-tunable light source of the 7th generation standard model that has improved performance and quality. By renewing the laser resonator and control circuits, it has achieved higher speed, higher performance, and higher quality compared to conventional models. As a result, it has become an ideal tool not only for the characterization of optical components used in the fields of optical communication and photonics science but also for various applications such as photonic integrated circuit testing, quantum photonics, spectroscopy, and sensors. ■ Features - High-speed sweeping: 200 nm/s sweep - High wavelength accuracy: ±2 pm (Type P) - High wavelength resolution: 0.1 pm - High signal-to-noise ratio: 90 dB/0.1 nm

  • Other lighting equipment

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Optical Characteristic Inspection System "Swept Test System"

High-speed, high-precision, and high-resolution evaluation of IL/WDL/PDL is possible!

The Swept Test System, which combines a wavelength-tunable light source (TSL series), a multi-port power meter (MPM series), a polarization control unit (PCU-110), and dedicated software, serves as an optimal evaluation tool for both research and development of optical devices and production environments. By referencing the output power from the wavelength-tunable light source in real-time and simultaneously acquiring the optical power transmitted through the DUT, high-precision measurements of IL/WDL/PDL can be achieved. This system calculates PDL using the Mueller matrix method. ■ Features - Rescaling algorithm (high resolution 0.1 pm) - Real-time power reference (reproducibility 0.02 dB) - High-precision wavelength monitor built into the light source (absolute wavelength accuracy 3 pm)

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Swept Photonics Analyzer ”SPA-110”

Wavelength-sweeping photonics analyzer using OFDR technology

This product functions as an add-on module for the santec wavelength-tunable laser (TSL series) and provides an analytical device that offers three functions required for photonics device evaluation: reflection point measurement, wavelength-dependent loss measurement, and proximity sensing. ■Features Reflection point measurement: High resolution of 5 μm Wavelength-dependent loss measurement: Wide dynamic range of 80 dB Proximity sensing: Distance measurement between fiber probe and device

  • Optical Measuring Instruments

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Laser Servo Controller "LLP-100"

It significantly improves the frequency stability of the santec wavelength-variable laser (TSL series).

This product is a laser servo controller designed to stabilize the oscillation frequency of lasers, allowing the oscillation frequency of our wavelength-tunable lasers (TSL series) to be locked to a frequency reference owned by the user. Since it is optimized for the TSL series, the oscillation frequency can be stabilized easily using our provided GUI without complex adjustments. It supports various frequency references such as gas absorption cells and Fabry-Perot (FP) resonators, and can be used in various feedback control methods including the Pound-Drever-Hall (PDH) method and the side-fringe locking method.

  • Servo

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High-Speed Spatial Light Modulator

High-Speed Spatial Light Modulator

The SLM-210 is an LCOS-type spatial light modulator that achieves high-speed optical control with an optical response speed of less than 10 ms. It boasts a high-resolution WUXGA (1920 × 1200) and high reproducibility with phase stability of less than 0.002 π (typical value), and enables precise 10-bit phase control (1024 gradations). This makes it useful for applications such as holographic reconstruction, wavefront correction, optical beam shaping and manipulation, biosensing, and quantum computing. In particular, the optical response speed of less than 10 ms enables smooth and fast real-time holographic reconstruction.

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High-Power Spatial Light Modulator (200 W Power Handling)

High-Power Spatial Light Modulator (200 W Power Handling)

The SLM-300 is an LCOS-type spatial light modulator compatible with high-output lasers up to the 200W class. It boasts high-resolution WUXGA (1920 × 1200) and high reproducibility of phase stability of 0.003 π or less (typical value), and enables precise 10-bit phase control (1024 gradations). Water cooling ensures stable operation even over long periods of time. Compatible wavelengths are 532 nm, 800 nm, and 1064 nm, and it is suitable for a wide range of high-power applications, including laser processing, 3D printers, and IC laser trimming, as well as metal processing and bio-optical research. There is also the SLM-30 model, designed specifically for integration into equipment (compact and low cost).

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UV Hardened Spatial Light Modulator

UV Hardened Spatial Light Modulator

The SLM-250 is spatial light modulator with liquid crystal and optical thin film structure optimized for the UV wavelength range. It boasts high-resolution WUXGA (1920 × 1200) and high repeatability of phase stability of 0.003 π or less (typical value), and enables precise 10-bit phase control (1024 levels). It provides high-precision light control in a wide range of applications that require UV compatibility, such as photolithography, wavefront correction, optical beam shaping and manipulation, and biosensing.

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Standard Spatial Light Modulator

Standard Spatial Light Modulator

The SLM-200 is a high-performance spatial light modulator based on LCOS technology. It is a standard model ideal for a wide range of applications that require precise light control. It boasts high-resolution WUXGA (1920 × 1200) and high reproducibility of phase stability of less than 0.001 π (typical value), and enables precise 10-bit phase control (1024 levels). It is used for applications such as wavefront correction, phase pattern control, pulse shaping, and beam shaping, and achieves high-precision optical control in a variety of fields, from research and development to industrial applications. There is also the SLM-20 model, designed specifically for integration in equipment (compact and low cost).

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SS-OCT wavelength-sweeping light source "HSL-2100"

Wide wavelength tunable range! A wavelength-swept light source for SS-OCT that achieves high stability and low cost.

The "HSL-2100" is a wavelength-swept light source for SS-OCT configured using a polygon scanner. With high reproducibility and linearity, it does not require k-trigger for data acquisition, allowing for a simpler overall system configuration. This achieves high stability and low cost. 【Features】 ■ Wavelength band of 1.31μm ■ Wide wavelength tunable range (170nm @ 1.31μm band) ■ Selectable scan speeds (3kHz to 50kHz) ■ High linearity and reproducibility ■ Operable with standard data acquisition cards *For more details, please refer to the PDF document or feel free to contact us.

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SS-OCT light source "HSL-20"

Stable high-speed scanning at 100kHz is possible! Light source using MEMS technology.

The "HSL-20" is a light source that is smaller and capable of high-speed scanning compared to conventional technologies, thanks to MEMS technology. Our unique design allows for stable high-speed scanning at a maximum of 100kHz. Additionally, this product is equipped with built-in "k-trigger" and "start-trigger" for synchronization with the system. 【Features】 ■ Wavelength band of 1.31μm ■ Our proprietary MEMS technology ■ Wide bandwidth & long coherence length ■ Built-in k-trigger ■ Unidirectional scanning *For more details, please refer to the PDF document or feel free to contact us.

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OCT probe

A wide variety of probes are available, including handheld types and microscope types!

We offer "probes" that can be used as custom options for the SS-OCT system and OEM products. We have a variety of probes in our lineup, including the "handheld type," which is used by pressing it against the sample, and the "microscope type," which allows for measurements while confirming the measurement position. 【Features】 ■ Handheld Type - Measures by pressing against the sample held in hand - Distance to the measurement object can be changed with attachments, enabling 3D measurements ■ Microscope Type - High-precision sample positioning using an XYZ stage - Allows for measurements while confirming the measurement position *For more details, please refer to the PDF document or feel free to contact us.

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SS-OCT System 'IVS-1000/200'

Basic research and development for product commercialization! An SS-OCT system that can be used in various fields and applications.

This catalog features products handled by Santec, a pioneer in optical technology. We offer a variety of products, including the SS-OCT systems 'IVS-1000/200', which can be used in various fields and applications, and the all-in-one portable SS-OCT system 'IVS-300'. Our light sources not only enable high-speed, high-resolution, and high-sensitivity OCT but are also widely adopted in many diagnostic devices due to their high reliability. [Featured Products (Excerpt)] ■ SS-OCT System 'IVS-1000/200' ■ SS-OCT System 'IVS-300' ■ OCT Probe ■ Wavelength Swept Light Source for SS-OCT 'HSL-20' ■ Wavelength Swept Light Source for SS-OCT 'HSL-2100' *For more details, please refer to the PDF document or feel free to contact us.

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Fault Measurement Device OCT System Inner Vision

A tomographic measurement device that can visualize internal structures in real time without being transparent in the visible range and without taking or destroying biological samples!

Santec's OCT system "Inner Vision" is a device that can be used in various fields and applications, including research purposes and foundational studies for commercialization. OCT utilizes the interference of backscattered light in the near-infrared spectrum, allowing for real-time visualization of internal structures without the need to extract or damage biological samples, even if they are not transparent in the visible range, unlike electron microscopes or stereo microscopes. It is expected to be a next-generation tomographic measurement device following X-ray CT, MRI, and ultrasound, as well as confocal microscopy. Santec's OCT employs the principle of Swept Source OCT (also known as Optical Frequency Domain Imaging or OFDI), enabling high-sensitivity and high-speed imaging, which allows for real-time high-resolution imaging. An optional LabVIEW operating software is also included, allowing for customization by the customer.

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