List of Semiconductor inspection/test equipment products

Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

• Other conveying machines

Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

• Other safety and hygiene products

It is a device that loads wafers one by one.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used for handling to perform P/N determination and visual inspection of silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device for inverting and transferring silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Classified by resistivity and thickness categories.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that detects the wafer edge using laser light and measures the diameter by comparing it with a calibration wafer (reference wafer).

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that detects the edge of a wafer and measures its diameter through image processing.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that measures the thickness of sapphire wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and rearranges them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of compound semiconductor wafers in sizes φ2”, φ4” or φ6”.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of various types of wafers below φ4"

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of Si, SiC, and other wafers with a diameter of φ100mm to φ150mm.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement device for silicon wafers with a diameter of φ200mm and φ300mm.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that removes silicon wafers from a dedicated cassette and measures the thickness at the set points.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for measuring the thickness of SiC wafers adhered to a glass plate and the thickness of the adhesive, as well as measuring the thickness of individual SiC wafers.

• Other semiconductor manufacturing equipment
• Semiconductor inspection/test equipment

The very popular TME series

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Large-diameter silicon wafer measuring instrument

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that extracts silicon wafers from a dedicated cassette using edge handling and measures the thickness of a set pattern.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Measurement of Si wafer thickness, front and back surface P/N determination.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

We provide advanced specialized technology as an integrated R&D foundry.

• Semiconductor inspection/test equipment
• Analytical Equipment and Devices
• Other contract services

A kit has been developed to modify the current FOUP load port for N2 purge functionality within 8 hours. There have been 3,000 units delivered.

• Other semiconductor manufacturing equipment
• Semiconductor inspection/test equipment

We will provide excellent products and services at a fair price, putting ourselves in the customer's position.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

We will introduce products related to semiconductors and cleanroom equipment.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment
• Other clean room equipment and facilities

Comprehensive catalog of electronic component production systems, cold forging automotive parts, and coolant-related machinery.

• Resist Device
• Etching Equipment
• Semiconductor inspection/test equipment

The semiconductor curve tracer is a state-of-the-art device capable of handling a maximum peak of 3000V and a maximum peak current of 1000A.

• Semiconductor inspection/test equipment

Low-cost solution for 1500A/5kV! 'Semiconductor Curve Tracer CS-5400' compatible with the latest power devices.

• Semiconductor inspection/test equipment