List of Semiconductor inspection/test equipment products

We provide comprehensive support from design to manufacturing and maintenance!

• Contract manufacturing

It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...

• Sensors

It is a positioning support unit that allows for precise positioning of workpieces and other items at each stage of the manufacturing process quickly and simply.

• Conveyor
• Semiconductor inspection/test equipment
• Wafer processing/polishing equipment

SiC semiconductor evaluation device using photoluminescence (PL) imaging method

• Semiconductor inspection/test equipment

This device measures the thickness of wafers fixed to ceramic plates without contact, using optical probes/sensors.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This machine is a device for measuring the thickness of φ8” silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This machine is a device that performs macro and micro inspections of φ8-inch wafers in the semiconductor manufacturing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device for drying wafers that have been stripped and cleaned.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a semi-automatic device for visual inspection of 8-inch silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a fixture for visual inspection of the front and back surfaces of the quartz mask.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for visual inspection and thickness measurement of 8-inch silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that performs macro inspection of wafers and micro inspection using a microscope.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for surface inspection of wafers after polishing.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for visually inspecting the edges of φ300 mm silicon wafers (chip and chipping inspection).

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Pass/Fail Judgment Device

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

A device capable of performing three types of operations.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for drying 300mm wafers that have been cleaned after double-sided polishing.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for simple cleaning (brush + water) of φ300 mm silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Loading and unloading of φ150 mm and φ125 mm silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for storing φ300 mm wafers, which have completed processing, one by one into a Teflon cassette for submersion.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that loads wafers one by one.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used for handling to perform P/N determination and visual inspection of silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device for inverting and transferring silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Classified by resistivity and thickness categories.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that detects the wafer edge using laser light and measures the diameter by comparing it with a calibration wafer (reference wafer).

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that detects the edge of a wafer and measures its diameter through image processing.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that measures the thickness of sapphire wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and rearranges them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of compound semiconductor wafers in sizes φ2”, φ4” or φ6”.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of various types of wafers below φ4"

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of Si, SiC, and other wafers with a diameter of φ100mm to φ150mm.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement device for silicon wafers with a diameter of φ200mm and φ300mm.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that removes silicon wafers from a dedicated cassette and measures the thickness at the set points.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for measuring the thickness of SiC wafers adhered to a glass plate and the thickness of the adhesive, as well as measuring the thickness of individual SiC wafers.

• Other semiconductor manufacturing equipment
• Semiconductor inspection/test equipment

The very popular TME series

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Large-diameter silicon wafer measuring instrument

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that extracts silicon wafers from a dedicated cassette using edge handling and measures the thickness of a set pattern.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Measurement of Si wafer thickness, front and back surface P/N determination.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

We provide advanced specialized technology as an integrated R&D foundry.

• Semiconductor inspection/test equipment
• Analytical Equipment and Devices
• Other contract services

A kit has been developed to modify the current FOUP load port for N2 purge functionality within 8 hours. There have been 3,000 units delivered.

• Other semiconductor manufacturing equipment
• Semiconductor inspection/test equipment

We will provide excellent products and services at a fair price, putting ourselves in the customer's position.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

We will introduce products related to semiconductors and cleanroom equipment.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment
• Other clean room equipment and facilities