List of Contract Services products
- classification:Contract Services
316~360 item / All 4703 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
Reducing the burden of inspection work! We will carefully answer any questions related to inspections.
- Contract Inspection
We can address the issue of requesting the creation of data necessary for radio wave applications! We accept measurements starting from just one unit.
- Contract measurement
Addressing challenges such as having little know-how in measurement tests and wanting assistance with measurement methods!
- Contract measurement
Basically, you just need to prepare the test specimen! The measurement frequency range is 0.8 to 4.9 GHz.
- Contract measurement
Basically, customers only need to prepare the test specimens! We can accommodate measurements starting from just one unit.
- Contract measurement
High-sensitivity analysis of exhaust gas is possible with the gas concentration device.
- Contract Analysis
- Contract measurement
It is effective to differentiate between the two methods depending on the surface structure of interest.
- Contract Analysis
- Memory
High-sensitivity analysis of various solutions, such as pure water and wafer cleaning liquids, is possible.
- Contract Analysis
- Wafer
- Water quality testing
Evaluation of the composition and bonding state of the outermost surface is possible.
- Contract Analysis
Technical information "Evaluation of Dental Implants using XPS" and two other items have been released.
We have published the following three analysis cases on the MST website: - Evaluation of dental implants using XPS - Evaluation of gas barrier films for plastic containers using XPS For more details, please visit the MST website. http://www.mst.or.jp/
Evaluation of gas release components from organic films and temperature dependence assessment are possible with TDS.
- Contract Analysis
Technical Information: Release of 'Distribution Evaluation of Powder Particle Surfaces by TOF-SIMS' and 3 other items.
We have published the following three analysis case studies on the MST website: - Distribution evaluation of powder particle surfaces using TOF-SIMS - Evaluation of thermal treatment temperature dependence of organic films using TDS - Degassing evaluation of resist films using TDS For more details, please visit the MST website. http://www.mst.or.jp/
You can evaluate the condition of the surface coating film.
- Contract Analysis
Technical information "Observation of the surface microstructure of injection needles using AFM" and two other items have been released.
We have published two analysis case studies on the MST website: - Observation of the surface microstructure of injection needles using AFM - Valence evaluation of Sn oxide using XPS For more details, please visit the MST website. http://www.mst.or.jp/
It is possible to evaluate the distribution of the crystalline state of carbon within the sample surface.
- Contract Analysis
Technical Information: Publication of 'Evaluation of Material Structure of Organic EL (OLED)' and two other items.
We have published two analysis case studies on the MST website: - Evaluation of the material structure of organic EL (OLED) - Raman mapping of carbon materials For more details, please visit the MST website. http://www.mst.or.jp/
By using a combination of processing, elemental analysis of the interface is possible.
- Contract Analysis
High-sensitivity analysis using ICP-MS.
- Contract Analysis
Technical Information "De-gassing Evaluation of Plating Samples (C0464)" and 4 other items published.
We have published the following five analysis case studies on the MST website: - Degassing evaluation of plating samples (C0464) - TDS analysis examples by representative materials and purposes (B0232) - Peptide sequence analysis using LC/MS/MS (C0466) - Metal contamination evaluation of Si wafer surfaces (B0233) - Metal contamination evaluation in SiN films (C0465) For more details, please visit the MST website. http://www.mst.or.jp/
It is possible to analyze desorbed gases by temperature increase even with transparent samples that allow infrared rays to pass through.
- Contract Analysis
ICP-MS: Inductively Coupled Plasma Mass Spectrometry
- Contract Analysis
Possible to dismantle and preprocess while maintaining the atmosphere, up to the introduction of equipment.
- Contract Analysis
Preventing oxidation degradation during cutting processing under N2 atmosphere.
- Contract Analysis
In addition to detailed condition assessment, film thickness calculation is possible.
- Contract Analysis
Evaluation of catalyst particles using STEM-EDX.
- Contract Analysis
XPS: X-ray Photoelectron Spectroscopy AES: Auger Electron Spectroscopy
- Contract Analysis
Evaluation will be conducted under measurement conditions tailored to the purpose.
- Contract Analysis
Evaluation of the sp2/(sp2+sp3) ratio using C1s waveform analysis.
- Contract Analysis
Identifies the components of foreign substances without the influence of the substrate or base material.
- Contract Analysis
UPS: Ultraviolet Photoelectron Spectroscopy
- Contract Analysis
Evaluation of bonding state and electronic state using XPS and UPS.
- Contract Analysis
- Contract Inspection
Continuous evaluation of crystallinity and orientation using electron diffraction.
- Contract Analysis
- Contract Inspection
Measurement avoiding the influence of high concentration layers using SSDP-SIMS.
- Contract Analysis
- Contract Inspection
It is possible to evaluate the depth distribution of H in the IGZO film with high sensitivity.
- Contract Analysis
- Contract Inspection
It is possible to obtain the dopant concentration profile from the SiC substrate side.
- Contract Analysis
Measurement avoiding the influence of high concentration layers using SSDP-SIMS.
- Contract Analysis
Analysis is possible even for special shapes through innovative fixing methods.
- Contract Analysis
Estimation of film thickness using the average free path of photoelectrons.
- Contract Analysis
Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.
- Contract Analysis
Quantitative analysis of the main components of sheet-like active substances is possible.
- Contract Analysis
- Contract measurement
It is possible to evaluate the change in crystallinity while increasing the temperature.
- Contract Analysis
XRD measurement can be performed while increasing the temperature.
- Contract Analysis
Evaluation of the depth direction of surface modification layers of polymers, resins, and films using TOF-SIMS is possible.
- Contract Analysis
Proposal for the use of standard samples with aligned thermal history.
- Contract Analysis
Principles and Applications of Pyrolysis GC/MS
- Contract Analysis
Estimation of film thickness using the average free path of photoelectrons.
- Contract Analysis
Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.
- Contract Analysis
X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.
- Contract Analysis
The process will be carried out from pretreatment to XPS measurement under an inert gas atmosphere.
- Contract Analysis
Chemical state analysis using XPS and morphological observation using TEM.
- Contract Analysis