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microscope Product List and Ranking from 41 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. フローベル Kanagawa//Optical Instruments
  3. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  4. 4 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  5. 5 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
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microscope Product ranking

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

  1. White interference microscope equipped with laser microscope 'VK-X3000'
  2. All-in-one fluorescence microscope 'BZ-X1000 Series'
  3. Bilateral Microscope System "TOMOS Series" フローベル
  4. 4 All-in-one fluorescence microscope 'BZ-X800'
  5. 5 All-in-one fluorescence microscope BZ-X series

microscope Product List

121～135 item / All 655 items

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[Analysis Case] Evaluation of Si Anode in Lithium-ion Secondary Batteries

[Analysis Case] Evaluation of Si Anode in Lithium-ion Secondary Batteries

It is possible to evaluate the state of the electrodes before and after charging, as well as the presence and distribution of Li.

Silicon (Si) is one of the candidates for high-capacity anode active materials, but it is said to suffer from severe cycle degradation due to the very large volume changes during charge and discharge. We dismantled and observed the Si anode before and after charging under controlled atmospheric conditions. Furthermore, we created cross-sectional observation samples using the FIB micro-sampling method and conducted shape observation and EELS measurements with a Cs-corrected STEM device to evaluate the condition of the Si electrode and the distribution of Li within the electrode.

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  • Si負極の充電前後の表面形状観察.png
  • 充電後のSi負極のEELS測定結果.png
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[Analysis Case] Cross-sectional Observation and Elemental Analysis of Soft Materials

[Analysis Case] Cross-sectional Observation and Elemental Analysis of Soft Materials

Direct evaluation of the structure of solution samples through cryo-SEM observation and EDX analysis.

To observe and analyze the internal structure of organic materials and liquid samples that are sensitive to heat, it is necessary to suppress temperature increases caused by processing or electron beam irradiation and to conduct a series of analyses while maintaining the original structure of the sample. In this case study, we will introduce an example where a cosmetic was used as an evaluation sample, and structural analysis was performed from cross-section FIB processing to SEM observation and EDX analysis while maintaining a cooling environment.

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[Analysis Case] SCM Analysis of SiC Planer Power MOS

[Analysis Case] SCM Analysis of SiC Planer Power MOS

You can visualize the diffusion layer structure of SiC devices.

In SCM, it is possible to identify the p/n polarity of semiconductors and visualize the shape of the diffusion layer. This method has been utilized for Si devices, but it can also be applied to SiC devices in areas where the carrier concentration is sufficiently high. This document presents the results of SCM analysis conducted on a cross-section of a SiC Planar Power MOS.

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[Analysis Case] Observation of Emulsions in Cryo FIB-SEM Processed Food

[Analysis Case] Observation of Emulsions in Cryo FIB-SEM Processed Food

Observe the dispersion state of moisture and oil while maintaining the structure.

Emulsions are dispersion systems in which water-soluble and fat-soluble components are mixed without separation due to the action of emulsifiers, and various emulsion technologies are widely used in processed foods. Mayonnaise is a representative processed food of the O/W type (oil-in-water emulsion). As a result of evaluation using cryo FIB-SEM observation, we were able to visualize the distribution of water, oil, emulsifiers, and other components. By conducting magnified observations, we can evaluate the fine structure, which is expected to be applied to sensory evaluations such as the smoothness and flavor of food.

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[Analysis Case] Structural Evaluation of Magnetic Head MTJ Section

[Analysis Case] Structural Evaluation of Magnetic Head MTJ Section

High-resolution TEM observation using Cs-corrected TEM

By using a Cs-corrected TEM device that compensates for spherical aberration, it is possible to observe the cross-sectional structure of devices with high resolution. In this case, we present data from high-resolution (HR)-TEM observations of the MTJ: magnetic tunnel junction part, extracted from a commercially available hard disk. Thus, it is possible to clearly observe the structure even in multilayer structures of ultra-thin metal films.

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[Analysis Case] Atomic Level Structural Analysis of CIGS Thin-Film Solar Cells

[Analysis Case] Atomic Level Structural Analysis of CIGS Thin-Film Solar Cells

Atomic-level resolution EDX analysis using Cs-corrected STEM.

By using a Cs-corrected TEM device that compensates for spherical aberration, it is possible to observe the cross-sectional structure of devices with high resolution. This case presents data from high-resolution (HR)-STEM observation and EDX elemental distribution analysis of the light-absorbing layer of CIGS thin-film solar cells. In CIGS, which has a polycrystalline structure composed of four elements, atomic resolution EDX analysis was performed, visually revealing the distribution of atoms.

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[Analysis Case] Observation of Fine Structures under Ultra-Low Acceleration Voltage Conditions using SEM

[Analysis Case] Observation of Fine Structures under Ultra-Low Acceleration Voltage Conditions using SEM

Evaluation of separator structure by ultra-low acceleration SEM observation.

As exemplified by the separators used in lithium-ion secondary batteries, the microstructure of materials, such as porosity and shape, significantly influences the characteristics and functions of products. When materials have a low softening point, such as resins or polypropylene (PP), they may be damaged by electron beam irradiation during observation, leading to changes in their original structure. We will present a case where ultra-low acceleration SEM observation at an acceleration voltage of 0.1 kV was used to suppress alteration and evaluate the surface morphology of the sample in detail.

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[Analysis Case] Evaluation of Particle Size and Composition of Catalyst Materials using TEM and EDX

[Analysis Case] Evaluation of Particle Size and Composition of Catalyst Materials using TEM and EDX

Evaluation of catalyst particles using STEM-EDX.

The electrodes of fuel cells are supported by Pt particles or Pt alloy (such as PtRu) particles as catalysts on carbon. Due to the fine structure of these catalyst particles, which are on the order of a few nanometers, SEM and TEM analyses are used for morphological observation and compositional analysis. In addition to evaluations in the initial state, degradation after current application has been reported, including modulation of alloy composition, leaching of Ru, and an increase in the diameter of catalyst particles; HAADF observation and high-resolution EDX analysis are very effective for these evaluations. Furthermore, multi-field observation and analysis enable the assessment of particle size and compositional distribution.

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[Analysis Case] Atomic Column Observation of Strontium Titanate SrTiO3

[Analysis Case] Atomic Column Observation of Strontium Titanate SrTiO3

High-resolution STEM observation using Cs-corrected STEM

ABF-STEM images (scanning transmission annular dark field images) allow for the direct observation of atomic positions of light elements. Simultaneous acquisition with HAADF-STEM images enables more detailed structural analysis. In this case, we present an example of observing atomic columns of strontium titanate (SrTiO3). By combining EDX elemental distribution analysis, we can visually clarify the distribution of atoms. Measurement methods: TEM・EDX Product fields: LSI・Memory Analysis purposes: Shape evaluation・Structural evaluation For more details, please download the materials or contact us.

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[Analysis Case] Polarity Evaluation of GaN by ABF-STEM Observation

[Analysis Case] Polarity Evaluation of GaN by ABF-STEM Observation

Atomic-level observation is possible with the Cs collector-equipped STEM.

GaN, which is being utilized as a power device and optical device, has a hexagonal wurtzite structure and exhibits crystallographic asymmetry (Ga polarity and N polarity) in the c-axis direction. The growth processes of epitaxial films differ between Ga polarity and N polarity, and the surface physical properties and chemical reactivity of the crystal also vary. In this document, the polarity of GaN was evaluated through annular bright field (ABF)-STEM observation. As a result, the positions of the Ga sites and N sites were identified, allowing for a visual clarification of the characteristics of Ga polarity and N polarity. Measurement method: TEM Product fields: Power devices, optical devices Analysis objectives: Shape evaluation, structural evaluation, thickness evaluation For more details, please download the document or contact us.

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[Analysis Case] Atomic Resolution Analysis of Lithium-Ion Secondary Battery Cathode Materials

[Analysis Case] Atomic Resolution Analysis of Lithium-Ion Secondary Battery Cathode Materials

Atmosphere control + atomic-level observation under cooling

In MST, atomic-level TEM analysis is possible under atmosphere control (and cooling). This document presents a case where LiCoO2 particles, extracted from a lithium-ion secondary battery without exposure to the atmosphere, were processed using FIB and analyzed with TEM under atmosphere control and cooling. STEM observation and EDX analysis were conducted while cooling to -174°C, allowing for a visual confirmation of the atomic arrangement. This method can be applied to materials with low thermal stability and crystalline materials that undergo changes in the atmosphere for high-resolution analysis.

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[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

Visualization of nanoscale roughness on the skin surface using AFM.

In recent years, the development of alternative methods to animal testing for the efficacy and safety testing of pharmaceuticals and cosmetics has been progressing, with particular attention being paid to testing methods using three-dimensional cultured skin. In this case study, a percutaneous absorption test of a cosmetic (lotion) was conducted using three-dimensional cultured human skin, which was measured using AFM (Atomic Force Microscopy). This allows for a visual evaluation of the microstructure of the skin surface, and it is also possible to quantitatively assess the roughness of any specific area. By measuring under atmospheric conditions, it is possible to observe the samples while minimizing alterations that would occur under vacuum conditions.

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  • 測定方法.png
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[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

Visualization of structural changes in samples in the atmosphere and in aqueous solutions.

Polymers are known to exhibit diverse functions by altering their composition and structure, and they are utilized in various products. In the evaluation of polymers, assessment in real environments is crucial. This time, we will introduce a case where the shape of polymers on a substrate was visualized in the atmosphere and in aqueous solution using an environmental control atomic force microscope (AFM). Additionally, by combining data analysis, we quantified the dispersion of polymer particles.

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[C-SAM] Ultrasonic Microscopy Method

[C-SAM] Ultrasonic Microscopy Method

C-SAM is a non-destructive method for observing defects such as delamination within a sample.

C-SAM is also known as SAT: Scanning Acoustic Tomography. - It is effective for confirming the "bonding state of electrodes" and "adhesion of bonded wafers," which are difficult to verify with X-ray CT observations. - In addition to reflected waves, transmission waves can also be acquired.

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[Analysis Case] AFM Analysis of Smartphone Protective Films

[Analysis Case] AFM Analysis of Smartphone Protective Films

Quantitative evaluation of the quality of sensory products is possible.

The penetration rate of smartphones is increasing year by year, and along with that, the protective films applied to their surfaces are diversifying in functionality. In this instance, we will introduce a case where two types of films (A and B) with fingerprint prevention and anti-reflection features were quantitatively evaluated in terms of roughness, simulating the sensation of touch through AFM analysis.

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