Atomic Force Microscope Product List and Ranking from 12 Manufacturers, Suppliers and Companies

Last Updated：Sep 03, 2025 Aggregation Period:Aug 06, 2025～Sep 02, 2025
This ranking is based on the number of page views on our site.

Atomic Force Microscope Manufacturer, Suppliers and Company Rankings

Last Updated：Sep 03, 2025 Aggregation Period:Aug 06, 2025～Sep 02, 2025
This ranking is based on the number of page views on our site.

日本カンタム・デザイン Tokyo//Testing, Analysis and Measurement
パーク・システムズ・ジャパン Tokyo//Testing, Analysis and Measurement
一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
4 オックスフォード・インストゥルメンツ Tokyo//Testing, Analysis and Measurement
5 東陽テクニカ Kanagawa//Testing, Analysis and Measurement 慶應義塾大学理工学部中央試験所・東陽テクニカ産学連携室ナノイメージングセンター

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Atomic Force Microscope Product ranking

Last Updated：Sep 03, 2025 Aggregation Period:Aug 06, 2025～Sep 02, 2025
This ranking is based on the number of page views on our site.

Atomic Force Microscope (AFM) 日本カンタム・デザイン
[New Release!] Atomic Force Microscope 'Park NX7' パーク・システムズ・ジャパン
Environmentally controlled, ultra-high performance AFM/SPM Cypher ES オックスフォード・インストゥルメンツ
High-performance atomic force microscope DriveAFM 日本カンタム・デザイン
4 Atomic Force Microscope (AFM) "Park NX-3DM" パーク・システムズ・ジャパン

Atomic Force Microscope Product List

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Atomic force microscope

Supports samples up to 100mm square in measurement modes such as C-AFM, KFM, and sMIM.

In addition to functions such as conductive AFM, Kelvin probe force microscopy (KFM), and scanning microwave impedance microscopy (sMIM), it supports samples up to 4 inches. ■ Sample size: Up to 100 mm square ■ Stage travel distance: 100 mm ■ XY scanning range: 100 μm (manufacturing dimensional tolerance +/- 10%) ■ Z scanning range: 9 μm (manufacturing dimensional tolerance +/- 10%) ■ XY scanning resolution: 24-bit control – 0.06 Angstroms ■ Z scanning resolution: 24-bit control – 0.006 Angstroms ■ Noise level: Typ: <0.01 mV RMS

Company：日本レーザー
Price：Other

Visual Inspection Equipment

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Compact AFM "NaioAFM" *Demo now available

Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

Company：日本カンタム・デザイン
Price：Other

Electron microscope

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Multifunctional Compact Atomic Force Microscope CoreAFM

Active vibration isolation built-in! It supports electrochemical measurements and environmental control simply by changing the stage.

"CoreAFM" is a multifunctional compact atomic force microscope that combines high performance with scalability to accommodate any type of measurement. The top-view camera makes it easy to align the measurement target, while the side-view camera allows for visual confirmation of the distance between the cantilever and the sample. Additionally, the cantilever holder can be easily attached and detached from the AFM head unit, allowing for safe cleaning or washing of just the holder. 【Features】 ■ Ready to use with immediate connection of the controller, power supply, and USB cable ■ High-resolution 24-bit ADC/DAC ■ Maximum scan range (X, Y, Z): 100μm, 100μm, 12μm ■ Z noise level: 40pm RMS value ■ Capable of supporting 32 standard measurement modes, including measurements in liquid, as well as various optional modes *For more details, please refer to the PDF document or feel free to contact us.

Company：日本カンタム・デザイン
Price：Other

Other microscopes

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High-speed atomic force microscope (high-speed AFM) 'MS-NEX'

Even those who are handling AFM for the first time can easily observe videos at the nanoscale!

The "MS-NEX" is a high-speed atomic force microscope (high-speed AFM) module system that allows for video observation of samples at the nanoscale and in real-time within a solution. It flexibly responds to requests such as "I need this function now" or "I won't use this function now." Depending on your research theme, progress, and budget, you can use a high-speed AFM that matches your current needs by combining various modules. 【Features】 ■ Capable of video observation at the nanoscale and in real-time ■ Various functions can be freely combined as needed ■ Modules can be added later ■ Equipped with various support functions ■ Easy to use even for those handling AFM for the first time *For more details, please refer to the PDF document or feel free to contact us.

Company：生体分子計測研究所
Price：Other

Microscope
others

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Atomic Force Microscope "Handy AFM"

Achieving overwhelming resolution! Measuring previously hidden minute phenomena.

The "Handy AFM" is an atomic force microscope that can be used as a substitute for SEM and high-magnification 3D optical microscopes. It is ultra-compact, measuring 15 cm in both depth and width. The scanning head can be selected from two types: high-resolution and wide-area, and can be exchanged instantly. 【Features】 ■ Probe exchange can be performed in a few seconds ■ Carbon nanotube probes can also be auto-approached ■ Optional support for a compact automatic stage and inline fully automatic machines *For more details, please download the PDF or feel free to contact us.

Company：ソフトワークス
Price：Other

Other inspection equipment and devices
Other microscopes
Other measurement, recording and measuring instruments

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Environmentally controlled, ultra-high performance AFM/SPM Cypher ES

A model of the Cypher S, which boasts exceptional performance, with fully equipped enhanced environmental control features. It easily achieves temperature control, gas and liquid measurement, and flow management.

The Cypher ES AFM/SPM (Atomic Force Microscope) from Asylum Research is a model that expands the fully equipped environmental control features on the outstanding Cypher S platform. It maintains the same high resolution, speed, and stability as the Cypher S, while allowing for easy operation in controlled gas or liquid environments and harsh chemical conditions within a temperature range of 0 to 250°C. The Cypher ES is the ultimate AFM designed to meet the most demanding experimental requirements, capable of measurements even in environments that could potentially damage other AFMs. For more details, please contact us or refer to the catalog.

Company：オックスフォード・インストゥルメンツ
Price：10 million yen-50 million yen

Other measurement, recording and measuring instruments
Microscope

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[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

Visualization of nanoscale roughness on the skin surface using AFM.

In recent years, the development of alternative methods to animal testing for the efficacy and safety testing of pharmaceuticals and cosmetics has been progressing, with particular attention being paid to testing methods using three-dimensional cultured skin. In this case study, a percutaneous absorption test of a cosmetic (lotion) was conducted using three-dimensional cultured human skin, which was measured using AFM (Atomic Force Microscopy). This allows for a visual evaluation of the microstructure of the skin surface, and it is also possible to quantitatively assess the roughness of any specific area. By measuring under atmospheric conditions, it is possible to observe the samples while minimizing alterations that would occur under vacuum conditions.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

Visualization of structural changes in samples in the atmosphere and in aqueous solutions.

Polymers are known to exhibit diverse functions by altering their composition and structure, and they are utilized in various products. In the evaluation of polymers, assessment in real environments is crucial. This time, we will introduce a case where the shape of polymers on a substrate was visualized in the atmosphere and in aqueous solution using an environmental control atomic force microscope (AFM). Additionally, by combining data analysis, we quantified the dispersion of polymer particles.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

Evaluate the shape change of the sample surface in situ.

Polymers can change shape depending on environmental factors such as temperature, humidity, and solvents, and by varying the environmental conditions during evaluation, we can deepen our understanding of their physical properties. In this study, we conducted heating and cooling experiments using polycaprolactone (PCL), which is known for its biodegradability. PCL has a melting point of approximately 60°C, and we continuously observed through video how it changes from a crystalline state to an amorphous state upon heating, and how it recrystallizes upon cooling. Measurement method: AFM Product fields: Biotechnology, Pharmaceuticals, Daily Goods, Food Analysis purpose: Shape evaluation For more details, please download the materials or contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement

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Atomic Force Microscope 'LiteScope 2.0'

Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.

"LiteScope 2.0" is an atomic force microscope that can be easily integrated with scanning electron microscopes. It can be easily mounted on SEMs and is immediately usable, and it can also be used as a standalone AFM. It is compatible with FIB, GIS, EDS, and other common SEM accessories. 【Features】 ■ Extension of SEM functionality ■ Highly precise correlated imaging ■ Quick and easy alignment to areas of interest ■ Elimination of sample contamination risk ■ Extension of 2D SEM images to 3D *For more details, please refer to the PDF document or feel free to contact us.

Company：東陽テクニカ慶應義塾大学理工学部中央試験所・東陽テクニカ産学連携室ナノイメージングセンター
Price：Other

Electron microscope
Other microscopes
Other inspection equipment and devices

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Atomic Force Microscope "Park NX-Wafer"

Automatic defect inspection function, low noise, high throughput! Introducing an accurate atomic force microscope!

The "Park NX-Wafer" is an atomic force microscope that performs defect imaging and analysis fully automatically, improving productivity in defect inspection by 1,000% through AFM measurement techniques. It is a low-noise atomic force profiler for accurate and high-throughput CMP profile measurements. It measures sub-Å surface roughness with extreme accuracy, minimizing variation between chips. 【Features】 ■ Fully automated AFM solution for defect imaging and analysis ■ Up to 1,000% increase in productivity for defect review ■ Achieves accurate and high-throughput CMP measurements with a low-noise atomic force profiler ■ Extremely accurate sub-Å surface roughness measurement, minimizing variation between chip-to-chip ■ Atomic force profiler *For more details, please refer to the PDF document or feel free to contact us.

Company：パーク・システムズ・ジャパン
Price：Other

Other microscopes
Electron microscope

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[Research Material] Global Market for Surface Measurement Equipment & Tools

World Market for Surface Measurement Instruments & Tools: Atomic Force Microscopes (AFM), Stylus Profilometers, 3D Optical Microscopes, Mechanical Testers, Light ...

This research report (Global Surface Measurement Equipment and Tools Market) investigates and analyzes the current state and outlook for the global market of surface measurement equipment and tools over the next five years. It includes information on the overview of the global surface measurement equipment and tools market, trends of major companies (sales, selling prices, market share), market size by segment, market size by major regions, and distribution channel analysis. The market segments by type include Atomic Force Microscopes (AFM), Stylus Profilometers, 3D Optical Microscopes, Mechanical Testers, and Optical Coordinate Measuring Machines, while the segments by application cover Optical, Automotive, Electrical & Electronics, and Others. The regional segments are divided into North America, the United States, Europe, Asia-Pacific, Japan, China, India, South Korea, Southeast Asia, South America, the Middle East, and Africa, to calculate the market size of surface measurement equipment and tools. The report also includes the market share of major companies in surface measurement equipment and tools, product and business overviews, and sales performance.

Company：マーケットリサーチセンター
Price：Other

Other services

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AFM platform with optical microscope

Achieves high-speed scanning and high resolution imaging using atomic force microscopy. Compatible with measurements in air and liquid.

This is an AFM platform equipped with an optical microscope. It allows imaging with an atomic force microscope targeting areas observed with the optical microscope. It adopts a vertical optical path design, and the gas-liquid dual-use probe holder can be used simultaneously in both air and liquid. (Liquid measurement option required) *For more details, please contact us.*

Company：日本レーザー
Price：Other

probe

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Atomic Force Microscope (AFM)

Introduction of atomic force microscopes (AFM) capable of proposing customized solutions for various systems, from research use to production sites.

Our company offers a user-friendly atomic force microscope (AFM) that allows for easy and quick measurement of surface shapes. We have a lineup of models including the "CoreAFM," which features an active vibration isolation mechanism and supports a variety of measurement modes, and the compactly designed "NaioAFM," which allows for smooth cantilever replacement using dedicated tools. Customization options are available, ranging from small models for research environments to large stage models for production sites, as well as automated systems for quality control. 【Lineup (excerpt)】 ◎ Desktop Atomic Force Microscope "CoreAFM" 　■ Equipped with active vibration isolation and wind protection 　■ Capable of supporting 32 types of measurement options ◎ Compact Atomic Force Microscope "NaioAFM" 　■ Integrates controller, XY stage, wind protection, and vibration isolation 　■ Equipped with a high-resolution top-view optical camera *We are currently distributing a catalog summarizing the scanning probe microscopes we handle. Detailed information can be viewed via "PDF Download."

Company：日本カンタム・デザイン
Price：Other

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High-performance atomic force microscope DriveAFM

Equipped with the off-resonance measurement mode "WaveMode" using photothermal excitation! Achieves high stability and performance!

"DriveAFM" is a high-performance atomic force microscope that dramatically accelerates research in both material science and life science. It enables high-speed imaging with atomic resolution while covering a very wide scan range of 100μm. It boasts high stability even in liquid environments. With "WaveMode," off-resonance measurements can be performed at speeds over 20 times faster, and the time required for imaging a single field of view is less than one minute. 【Features】 ■ Wide-range and high-resolution scanning using the proprietary "Direct drive" piezo scanner ■ Off-resonance mode "WaveMode" utilizing photothermal excitation developed by Nanosurf ■ WaveMode is useful even for soft samples like polymers ■ Equipped with photothermal excitation for the cantilever called "Clean-Drive" ■ Clearly images the periodic double helix structure of DNA *For more details, please refer to the PDF document or feel free to contact us.