アイテス List of Products and Services

This document presents a case study on the observation, elemental analysis, and ultra-microhardness measurement of a broken crab claw due to long-term use. It includes clear photographs and diagrams illustrating "hardness comparison using an ultra-microhardness tester" and "the relationship between the surface analysis results of the fracture and ultra-microhardness (low load)." We invite you to read it. 【Contents】 ■ Observation of the broken crab claw ■ Hardness comparison using an ultra-microhardness tester ■ Relationship between the surface analysis results of the fracture and ultra-microhardness (low load) *For more details, please refer to the PDF document or feel free to contact us.

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SEM observation involves detecting secondary electrons and backscattered electrons generated when electrons irradiate the surface of the sample and scatter in the outermost layer of the sample. These are captured by a detector and displayed as an image on a monitor. There are various types of detectors for capturing electrons, each producing images that leverage their unique characteristics, and the appearance can change by varying the acceleration voltage. In this document, we introduce SEM images captured under various conditions. We encourage you to read it. [Contents] ■ Backscattered Electron Images - Backscattered electron images at high acceleration voltage (AsB detector) - Backscattered electron images at low acceleration voltage (EsB detector) ■ Secondary Electron Images - Differences in appearance based on acceleration voltage - Differences in appearance based on detector position *For more details, please refer to the PDF document or feel free to contact us.

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We will introduce the lamp heating test (infrared irradiation test). In the environmental test chamber, the test sample is placed, and while controlling the ambient temperature in a blown air state, up to seven infrared lamps are used to irradiate light, thereby controlling the temperature of the surface temperature sensor of the sample to be higher than the ambient temperature. For example, it can simulate the stress of being further overheated by sunlight in a car interior that has reached high temperatures during the day. 【Features】 ■ Capable of conducting infrared irradiation tests in a blown air environment within the environmental test chamber. ■ Can recreate an environment where the surface temperature of the sample is higher than the ambient temperature. *For more details, please refer to the PDF document or feel free to contact us.

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At Aites Co., Ltd., we conduct "FT-IR analysis" to confirm the degradation of resins. The degradation of resins can manifest as visible discoloration or invisible changes. Discoloration can be detected through visual changes, but invisible changes can lead to a decrease in strength and become the source of various issues. IR analysis allows us to understand the changes in molecular structure caused by these alterations. *For more details, please refer to the PDF document or feel free to contact us.*

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This presentation introduces the detection sensitivity related to differences in acceleration voltage during SEM-EDX analysis. When analyzing the gold-plated surface of a typical printed circuit board (PCB), there are instances where the underlying nickel is detected even though it is not exposed. This is related to the scattering depth of the electron beam, and it is essential to set appropriate acceleration conditions to obtain accurate analysis results. In this study, we conducted an examination of the EDX detection depth based on differences in acceleration voltage using Monte Carlo simulations. This is just one example, but it is important to consider how electrons scatter while setting the acceleration voltage to achieve accurate analysis results. [Test Board Overview] - The sample used is a gold-plated pad from a typical printed circuit board (PCB). - The layer structure consists of nickel plating and gold plating on copper wiring. - The thickness of the gold plating, as observed in cross-section, is 212 nm. *For more details, please refer to the PDF document or feel free to contact us.*

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This introduction covers the evaluation of transmittance and yellowing (yellowness) using a color difference meter. By making the product's constituent materials transparent and richly colored, necessary functional characteristics, artistic qualities, and design elements for the product's application are imparted. However, yellowing (discoloration) can occur due to the environment in which they are used, potentially compromising those characteristics. By quantifying transparency and color not through human perception but as numerical data, objective evaluation becomes possible. 【Overview】 ■ Principles of color difference measurement and acquired data (XYZ Yxy color space) - Light emitted from a light source passes through a transparent sample, and within an integrating sphere box, data on the transmitted wavelengths (transmittance) and converted color space data are obtained. *For more details, please refer to the PDF document or feel free to contact us.

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The polarizers used in LCD panels are made of multilayer films laminated with materials such as triacetyl cellulose, polyvinyl alcohol, and polyethylene terephthalate. This document presents a case study of the degradation analysis of panel polarizers after reliability testing, conducted through HS-GCMS analysis and thermal desorption GCMS analysis. Even invisible degradation might be detected with this analysis?! Please take a moment to read it. [Contents] ■ Reliability Testing ■ Outgassing Analysis via HS-GCMS ■ Low Boiling Point Component Analysis via Thermal Desorption GCMS *For more details, please refer to the PDF document or feel free to contact us.

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In research and development, analysis and evaluation are essential processes that serve as checkpoints, and the materials that make up the product often become key subjects of focus. Aites assists manufacturers in their research and development with a diverse range of analytical instruments, observation devices, reliability testing equipment, and accumulated knowledge and chemical reaction mechanisms. We are ready to support you with our extensive technology, knowledge, and equipment, so please feel free to contact us. 【Features】 <Examples of Analytical Instruments> ■ Microscopic IR ■ Microscopic Raman ■ (EGA/TD/Pyr) GC-MS ■ TOF-SIMS *For more details, please refer to the PDF document or feel free to contact us.

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We offer a "haze measurement and total light/diffuse transmittance measurement service" for transparent materials (transparent films/sheets, glass, ITO, etc.). We use a haze meter device to measure the degree of haze and the degree of light diffusion. The results are expressed as the ratio of total light transmittance (T.T), which includes both parallel components (P.T) and all diffuse components, to diffuse transmittance (DIF), which excludes the parallel components. Along with this service, we also provide data analysis and considerations from a molecular structure perspective. Please feel free to contact us when you need our services. 【Device Specifications】 ■ Device: Manufactured by Nippon Denko Kogyo Co., Ltd. ■ Applicable Standards: JIS K7136 / JIS K7136-1 / JIS K7105 / ASTM D1003 ■ Sample Size: 40×40 to 200×280 mm ■ Data Obtained: - Total light transmittance / Haze (degree of haze) / Parallel light transmittance / Diffuse transmittance *For more details, please refer to the PDF document or feel free to contact us.

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Lenses for glasses, cameras, and other devices are coated with various layers. In the case of glasses, multiple coating layers are applied, including a hard coat to protect plastic lenses, an anti-reflective coat to reduce light reflection, and a UV coat to block ultraviolet rays. These layers are applied as extremely thin films, so we observed their structure in cross-section. When observed with a scanning electron microscope (SEM), it was noted that a hard coat/multilayer film is applied on top of the lens substrate, and in the multilayer film, SiO and Nb films are alternately stacked. [Overview] ■ Cross-section preparation method - Prepared with a microtome - The lens removed from the frame was cut into small pieces and embedded in resin - Subsequently, a cross-section was prepared using a microtome, followed by optical microscopy observation, SEM observation, and EDX analysis. *For more details, please refer to the PDF document or feel free to contact us.

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We present an observation case of a large sample (expansion valve) measuring 65mm × 28mm. This sample uses magnetic materials, and due to distortion in the images during SEM observation, we primarily conducted observations using an optical microscope. From the appearance and X-ray radiographic observation, it was found that there are some areas that are not visible in the X-ray. [Overview] ■ Appearance and X-ray radiographic observation ■ Cross-sectional observation using an optical microscope *For more details, please refer to the PDF document or feel free to contact us.

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Here are some examples of observations of aluminum spot welds. In internal observations using X-ray radiography, voids were observed inside the weld, and in internal observations using X-ray CT, it was confirmed that the voids are located near the center of the weld (between the two aluminum plates). Additionally, by creating a cross-section of the same sample and combining mechanical polishing with chemical etching treatment, we were able to observe the condition of the weld more clearly. 【Overview】 ■ Internal observation using X-ray radiography - Non-destructive testing and X-ray radiographic observation were conducted - Voids were observed inside the weld ■ Internal observation using X-ray CT - Non-destructive testing and X-ray CT observation were conducted - It was confirmed that the voids are located near the center of the weld ■ Cross-sectional observation using optical microscopy and tabletop SEM - Mechanical polishing and chemical etching A cross-section suitable for the sample allows for clearer observation. *For more details, please refer to the PDF document or feel free to contact us.

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As a case study of EBSD, we conducted an analysis of the cross-section of an aluminum welding joint from the cross-sectional direction, which I would like to introduce. For a sample where an aluminum plate was spot welded to an aluminum case, we prepared a cross-section of the weld and performed EBSD analysis. In the distribution of grain sizes, it was confirmed that the weld area has a greater number of larger grains compared to the base material. [Analysis Overview] ■ Visualization of Grain Structure - It is evident that the shape and size of the grains in the weld area differ from those in the base material. ■ Distribution of Grain Sizes - It can be confirmed that the weld area has a greater distribution of larger grains compared to the base material. *For more details, please refer to the PDF document or feel free to contact us.

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In the testing environment, whisker observation is an important evaluation, but whiskers are very delicate and sensitive to vibrations and air fluctuations, so care must be taken in handling them during transportation and storage after testing. Our company consolidates the testing chamber, storage, and observation areas on one floor to reduce the risks associated with movement and storage, creating an environment where whiskers do not fall off or disappear. Additionally, we also offer migration observation before and after reliability testing, as well as solder surface observation, so please feel free to contact us. 【Features】 ■ Consistent service from reliability testing to observation ■ Consolidation of testing chamber, storage, and observation areas on one floor ■ Reduced risks associated with movement and storage ■ Whiskers do not fall off or disappear ■ Support for migration observation and solder surface observation before and after reliability testing *For more details, please refer to the PDF document or feel free to contact us.

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If solvents, low molecular organic substances, or unreacted materials remain in the constituent materials, packaging materials, or cushioning materials of a product, they may outgas, diffuse, or permeate into the constituent materials, potentially affecting the product's lifespan, characteristics, and the environment or human health. The headspace method of GCMS is effective for qualitative and quantitative analysis of trace residual substances. This document presents a case study of the qualitative analysis of outgassing components from polarizers used in liquid crystal panels. We encourage you to read it. [Contents] ■ Headspace GC-MS analysis method ■ Analysis of outgassing components from polarizers in liquid crystal panels *For more details, please refer to the PDF document or feel free to contact us.

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We would like to introduce our "Dye and Pry Test for Embedded Components." For confirming the breakage and delamination of packages and embedded components, there are non-destructive testing methods (such as transmission X-ray and CT) and cross-sectional observation. However, these methods make it difficult to capture the spread of delamination in the "plane" of the broken layers. In the Dye and Pry Test, by permeating a colored or fluorescent liquid, we can observe the broken and delaminated layers. Please feel free to contact us if you have any inquiries. 【Flow of the Dye and Pry Test】 ■ Dye immersion ■ Pry ■ Observation using optical microscopy or SEM *For more details, please refer to the PDF document or feel free to contact us.

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I would like to introduce the topic of "Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX." We conducted cross-section preparation of the joint area of the copper crimp terminal fixture for resistance measurement, applied chemical etching to the prepared cross-section, and observed the metal structure before and after etching. As a result, we infer that the detected elements are P (phosphorus), Ag (silver), and Cu (copper), indicating that it is a silver-containing phosphorus copper solder material. *For more details, please refer to the PDF document or feel free to contact us.*

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At Aites Co., Ltd., we conduct analysis of resin materials (for semiconductor LED applications). Resin materials such as epoxy resin and silicone resin are widely used in semiconductor products like MOSFETs and ICs, as well as in LED packages. The characteristics of these materials significantly contribute to the performance of the products. Our company is capable of analyzing these resin materials and evaluating the characteristics that affect product performance. 【Analysis and Evaluation Methods】 ■DSC ■TMA ■GCMS ■SEM-EDX ■TG-DTA ■FT-IR *For more details, please refer to the PDF document or feel free to contact us.

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At Aites Co., Ltd., we conduct 1H NMR analysis of phthalate esters. NMR analysis is an effective method for distinguishing compounds with similar molecular structures and elucidating structures such as the bonding positions of side chains and substituents, as well as branching structures. In organic synthesis and polymer synthesis, it is an essential analysis to confirm whether the desired molecular structure has been obtained. The characteristic effects and efficacy of pharmaceuticals, supplements, food, and fibers are influenced by the positions of substituents in the molecular group and the molecular structure. Our skilled team will provide in-depth organic molecular structure analysis. *For more details, please refer to the PDF document or feel free to contact us.

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At Aites Co., Ltd., we conduct 1H NMR analysis of phthalate esters. NMR analysis and GCMS analysis are effective for distinguishing and identifying compounds with similar structures. In this analysis, we can obtain information about the number of protons from the integral values, structural features such as functional groups from the chemical shifts, and the positional relationships with surrounding protons from the coupling patterns and coupling constants. *For more details, please refer to the PDF document or feel free to contact us.

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At AITES Co., Ltd., we conduct material degradation analysis. We propose appropriate analytical methods based on the condition of polymer materials and samples. By analyzing the degradation process that the material has undergone and optimizing the polymer materials and usage environment, it is possible to extend the product's lifespan. *For more details, please refer to the PDF document or feel free to contact us.

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This document introduces "Load Removal Mode & Color Filter Measurement Examples Using a Ultra-Micro Hardness Tester" by Aites Co., Ltd. It explains the results obtained from hardness measurements using graphs. Additionally, it includes examples of measuring the hardness of Red, Green, and Blue color resists by extracting color filters from discarded displays, accompanied by photos and graphs. Please feel free to download and take a look. [Contents] ■ Results obtained from hardness measurements ■ Examples of hardness measurement of color filters within displays *For more details, please refer to the PDF document or feel free to contact us.

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We would like to introduce our "High-Temperature Latch-Up Testing." In recent years, there has been an increasing demand for latch-up testing under maximum operating ambient temperature conditions for devices. In particular, for automotive components under AEC standards, the testing conditions are limited to Class II (maximum operating ambient temperature), and for devices that require operation in high-temperature conditions, high-temperature latch-up testing is recommended. 【Main Standards for Latch-Up Testing (Excerpt)】 ■ JEDEC (JESD78E) - Current pulse application method, power supply overvoltage application method - Class I: Room temperature, Class II: Maximum operating ambient temperature ■ JEITA {JEITA ED4701/302 (Test Method 306B)} - Current pulse application method, power supply overvoltage application method - Class I: Room temperature, Class II: Maximum operating temperature *For more details, please refer to the PDF document or feel free to contact us.

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In a typical thermal decomposition GCMS, samples are heated to detect volatile components; however, analyzing components that do not volatilize upon heating or those with low detection sensitivity is challenging. Therefore, by adding a special reagent to the sample and heating it, it becomes possible to detect substances that are usually difficult to identify. For example, in the analysis of polymers, thermal decomposition of the polymer results in the detection of a large number of decomposition products, and in some cases, peaks may overlap with other additives, making analysis difficult. However, by performing reactive thermal decomposition GCMS, it is possible to detect the methyl esters of monomers and to separate and analyze them from the additives. Thus, even when the target analytes are difficult to detect using conventional analysis, reactive thermal decomposition GCMS allows for sensitive detection by selecting appropriate reagents for the analytes. [Examples] - Analysis of phthalate esters (DIDP) - Analysis of polymers (polyethylene terephthalate) - Analysis of copper corrosion inhibitors (BTA) *For more details, please refer to the PDF document or feel free to contact us.

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This document introduces methods for preparing cross-sections. When conducting observations, analyses, or evaluations, there may be a need to prepare cross-sections. By selecting or combining methods that are appropriate for the purpose, material, and structure, it is possible to obtain highly reliable results. In mechanical processing, we include main cross-section preparation methods such as "mechanical polishing" and "microtome." In ion beam processing, methods like "FIB" and "ion polisher (CP)" are also featured. We encourage you to read it. [Contents] ■ Main cross-section preparation methods ■ Processing conditions ■ Advantages & disadvantages *For more details, please refer to the PDF document or feel free to contact us.

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This document introduces the cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope). Samples with magnetic properties, such as neodymium magnets, cannot be observed in a magnetized state using SEM; however, by applying demagnetization treatment, SEM observation and elemental analysis can be performed. Please take a moment to read it. 【Contents】 ■ Demagnetization of neodymium magnets and cross-sectional observation using SEM (Hitachi High-Tech TM3030Plus) - Demagnetization treatment (SEM observation of the magnet in a magnetized state is not possible, so demagnetization is performed) - Cross-sectional observation - Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

• Electron microscope
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Introducing "Crack Observation Using Tabletop SEM (Scanning Electron Microscope)." In the evaluation of product reliability, cross-sectional observation of cracks is essential. While optical microscopy may overlook small cracks, SEM observation allows for clear identification. Moreover, with a tabletop SEM, no conductive treatment is necessary, enabling quick and detailed observation. 【Features】 ■ No need for deposition ■ Easy visibility of crystal grains ■ Fine cracks are easily visible *For more details, please refer to the PDF document or feel free to contact us.

• Electron microscope
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We handle the tabletop SEM (scanning electron microscope) 'TM3030Plus' manufactured by Hitachi High-Tech. It has been half a century since SEM observation became common, and it has become an important observation method in various fields. With the "charge reduction mode" of the tabletop SEM, it is possible to observe and analyze samples that cannot be observed with FE-SEM. This capability is applicable not only in the semiconductor and electronic components fields but also in life sciences and biological fields. 【Features】 - For conductive samples such as semiconductors and electronic components, SEM observation is mainly recommended in normal/conductive mode. - For non-conductive samples such as plastics, paper, rubber, ceramics, and biological samples containing moisture or oil, SEM observation in surface/normal/charge prevention mode is recommended. *For more details, please refer to the PDF document or feel free to contact us.

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This document introduces the cross-sectional observation of solar cell modules. An inspection was conducted on a solar cell module that underwent thermal shock testing, and upon performing a cross-sectional observation of the identified abnormal areas, it was confirmed that the interconnector solder joint had fractured. [Contents] - Cross-sectional observation of the fracture - Element map of the fracture *For more details, please refer to the PDF document or feel free to contact us.

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This document introduces processing damage caused by mechanical polishing methods. Mechanical polishing is a long-established technique for cross-section preparation, capable of producing cross-sections over a wide range, from a few centimeters to about 10 centimeters. However, damage such as altered layers, steps, elongation (stretching), and embedding can occur during processing, leading to issues like "something that should be there is missing" and "something that shouldn't be there is present." At Aites, we perform highly reliable cross-section preparation based on the technology and experience we have cultivated over many years. [Contents] ■ Main processing damages in mechanical polishing methods ■ Importance of polishing finishes tailored to material characteristics ■ Case studies involving solder (BGA) *For more details, please refer to the PDF document or feel free to contact us.

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At AITES Co., Ltd., we offer "HAST testing for power devices." 【Features】 ■ Capable of conducting unsaturated vapor pressure tests with a maximum voltage of 1000V ■ Evaluation of metal wiring corrosion and migration through current flow under high temperature and high humidity conditions ■ Real-time monitoring during testing to assess sample degradation

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By mechanically polishing commercially available rectangular Li-ion batteries and observing them with optical microscopy and ultra-low acceleration FE-SEM, detailed structural analysis and elemental analysis can be performed. The materials introduce the overall structure of the Li-ion battery and detailed structural observations of the Li-ion battery using SEM and ultra-low acceleration FE-SEM through photographs. [Analysis Overview] ■ Overall structure of the Li-ion battery and SEM observation ■ Detailed structural observation of the Li-ion battery using ultra-low acceleration FE-SEM *For more details, please refer to the PDF materials or feel free to contact us.

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While lead-free solder is becoming widespread, whiskers formed from Sn plating or solder joints have a significant impact on the reliability of electronic components. Our company observes whiskers using a digital microscope with depth composition capabilities and conducts three-dimensional measurements to evaluate whisker growth. By collaborating with the reliability testing group, we can implement whisker evaluations quickly and eliminate transportation risks. 【Features】 ■ Support from observation to three-dimensional measurement in reliability testing ■ Observation of whiskers using a digital microscope with depth composition capabilities ■ Ability to conduct whisker evaluations quickly and eliminate transportation risks *For more details, please refer to the PDF document or feel free to contact us.

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Foreign substances that significantly affect the yield of electronics products must be analyzed promptly. Our company utilizes various sample processing techniques to provide rapid analysis results. The materials introduce the excavation of foreign substances buried in multilayer films and an overview of micro cutting tools. 【Micro Cutting Tool Specifications】 ■ Cutting edge width: 50μm or 100μm ■ Cutting depth: Approximately 2 to 300μm ■ Cutting targets: Resins, glass, Si wafers, metals, etc. *For more details, please refer to the PDF materials or feel free to contact us.

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At Aites Co., Ltd., we perform section preparation using a microtome. A "microtome" is a device that slices samples thinly with glass or diamond knives to create cross-sectional observation samples for TEM, SEM, OM, and LM. It is not suitable for hard materials, but it is ideal for preparing sections of soft materials such as films. [Examples of Cross-Section Observation] ■ Liquid Crystal Polarizers ■ Aluminum Cans ■ Telephone Cards ■ Mobile Phone Cases ■ Flexible Cables ■ Yogurt Lids *For more details, please refer to the PDF document or feel free to contact us.

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A defective toggle switch component was found where the operating lever does not switch. Upon performing X-ray fluoroscopic observation, it was observed that the internal metal plate was misaligned, revealing the cause of the defect. In this case, the metal plate is supposed to move like a seesaw around the central terminal to switch the circuit, but due to the misalignment of the metal plate in the defective product, the lever could not switch to the opposite side, preventing the circuit from being switched. CT observation provides not only a 3D image but also arbitrary slice cross-sectional images in the X, Y, and Z directions. [Observation Case] ■ Subject: Toggle Switch ■ Observation Method: X-ray fluoroscopic observation, orthogonal CT observation ■ Cause of Defect: Misalignment of the internal metal plate *For more details, please refer to the PDF document or feel free to contact us.

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By observing shapes clearly that might be overlooked by the inspector's visual inspection alone, it is possible to accurately grasp defects. Wide-range bulk observation and partial magnification are also possible, accommodating various types of observation. Additionally, we have IPC-A-610 certified IPC specialists on staff who can assist with observations in accordance with international standards, provide consultations, and address various observation-related concerns. 【Features】 ■ Wide-range bulk observation and partial magnification are possible ■ Accommodates various types of observation ■ Clear magnified observation is possible regardless of the location after overall observation ■ Additional observation of unexpected areas is also easy ■ IPC-A-610 certified IPC specialists are on staff *For more details, please refer to the PDF document or feel free to contact us.

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It is possible to investigate the layer composition of organic films using FT-IR imaging through transmission of organic multilayer membranes that have been sectioned with a microtome. The document introduces imaging FT-IR analysis of high-performance multilayer film cross-sections using photos and graphs. [Imaging FT-IR Analysis of High-Performance Multilayer Film Cross-Sections] ■ Sample: High-performance multilayer film ■ Measurement Area: Transmission/Reflection method 175μm, ATR method 35μm ■ Spatial Resolution (Pixel Size): Transmission/Reflection method 5.5μm, ATR method 1.1μm *For more details, please refer to the PDF document or feel free to contact us.

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Based on imaging obtained from FT-IR spectra using the ATR method, cross-sectional analysis of organic multilayer films such as aluminum laminate film can be performed. The ATR method (Attenuated Total Reflection) is a technique that involves closely adhering a micro ATR crystal to the sample, allowing for analysis near the surface through total internal reflection of infrared light. Due to the influence of the refractive index of the crystal applied to the sample, the apparent spatial resolution is enhanced, enabling the analysis of smaller foreign substances. 【Features of the ATR Method】 ■ A technique that analyzes near the surface through total internal reflection of infrared light ■ Enhanced apparent spatial resolution due to the influence of the refractive index of the crystal applied to the sample ■ Enables the analysis of smaller foreign substances *For more details, please refer to the PDF document or feel free to contact us.

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"Ion Chromatography Analysis" allows for qualitative and quantitative analysis of trace ionic components in aqueous solutions. Separation is performed using a column filled with ion exchange resin, and by measuring electrical conductivity, trace ionic components in aqueous solutions can be detected with high sensitivity. Solid samples are dissolved in pure water to measure the ionic components. 【Main Specifications】 ■ Anions: Cl-, Br-, NO2-, NO3-, organic acids, etc. ■ Cations: Li+, Na+, K+, Mg2+, Ca2+, etc. ■ Quantification limit: Approximately 100 ppb (varies by ion species) ■ Detection limit: Approximately 10 ppb (varies by ion species) ■ Detector: Electrical conductivity (suppressor type) *For more details, please refer to the PDF document or feel free to contact us.

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We conducted observations using SEM on the fracture surface of a crab claw that was damaged due to long-term use. At the edge of the fracture surface, traces of plastic deformation (dimples) were observed, suggesting that it fractured due to being pulled. In the central area of the fracture surface, the appearance was different, with only a slight presence of dimples, and there were almost no signs of having been pulled apart. It can be inferred that there may have already been voids present in the central area. Various other observations are also possible, so please feel free to contact us. [Overview of Fracture Surface Observation] ■ Edge of the Fracture Surface - Traces of plastic deformation (dimples) were observed. ■ Central Area of the Fracture Surface - Almost no signs of having been pulled apart were observed. - It could be inferred that there may have already been voids present. *For more details, please refer to the PDF document or feel free to contact us.

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Regarding the separator used in commercially available Li-ion batteries, after conducting material analysis using FT-IR, we confirmed its function of blocking polymer melting at high temperatures. The document presents the material analysis of Li-ion battery separators and observations of the state changes of the separators under high-temperature conditions using graphs and photographs. [Analysis Overview] ■ Material analysis of Li-ion battery separators ■ Observation of state changes of separators under high-temperature conditions - The state changes of the separator were observed over time at a constant temperature of 135°C using FIB/SEM. *For more details, please refer to the PDF document or feel free to contact us.

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Traditionally, sampling of liquid foreign substances has been considered very difficult. In the liquid foreign substance sampling technique for FT-IR analysis, sampling is performed using a capillary and surface tension, making FT-IR analysis possible. 【Sampling Procedure】 ■ Liquid foreign substances on the substrate ■ Sampling with a capillary ■ Transferring the liquid onto a Si wafer for FT-IR analysis ■ Sampling in progress with the capillary ■ Transferring to the Si wafer *For more details, please refer to the PDF document or feel free to contact us.

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FT-IR spectra sensitively reflect the bonding states of organic materials, making it possible to monitor the progress of adhesive curing reactions (degree of curing). The procedure for measuring the degree of curing of the resin involves comparing the spectra of unreacted materials with those of materials after 100% reaction to identify the changing regions. The degree of curing for unreacted materials is set at 0%, and that for reacted materials is set at 100%. The peak intensity of the measurement sample spectrum is interpolated to determine the reaction rate (degree of curing). 【Procedure for Measuring Degree of Curing】 ■ Compare the spectra of unreacted materials with those of materials after 100% reaction to identify the changing regions. ■ Set the degree of curing for unreacted materials at 0% and that for reacted materials at 100%. ■ Interpolate the peak intensity of the measurement sample spectrum to determine the reaction rate (degree of curing). *For more details, please refer to the PDF document or feel free to contact us.

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We would like to introduce the equipment owned by Aites Co., Ltd., the Focused Ion Beam (FIB). The "FIB (Focused Ion Beam)" is a device that narrows Ga ions to less than a few micrometers and scans the beam to eject atoms from the sample surface while processing micro-regions. It is capable of cross-sectional processing of micro-regions and the production of TEM samples for semiconductors, MEMS, liquid crystal glass, build-up substrates, and more. 【Available Equipment】 ■ Crossbeam FIB "Carl Zeiss 1540XB" ■ Single Beam FIB "SEIKO SMI 2200" *For more details, please refer to the PDF document or feel free to contact us.

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