アイテス List of Products and Services

Aites utilizes its 40 years of experience in repairing computer system boards to identify and repair faults in electronic devices that are no longer supported, guaranteed, or maintained by the manufacturer. In cases where "the control computer has failed and urgent recovery is needed," there is a possibility of extending its life through repairs. Please feel free to contact us if you have any requests. [We address issues such as the following] ■ Power does not turn on ■ OS does not boot ■ Display abnormalities ■ Unusual noises ■ Floppy disk not reading, etc. *For more details, please refer to the PDF document or feel free to contact us.

• Other machine tools
• Calibration and repair

Aites utilizes its 40 years of experience in repairing computer system boards to identify and repair faults in electronic devices that are no longer supported, guaranteed, or maintained by the manufacturer. In cases such as "the servo motor is not moving," there is a possibility of extending the lifespan through repairs. Please feel free to contact us if you have any requests. 【We address issues such as the following】 ■ Power does not turn on ■ Motor control error ■ Stops with "E9" error ■ Motor does not rotate, etc. *For more details, please refer to the PDF document or feel free to contact us.

• Calibration and repair

Aites utilizes its 40 years of experience in repairing computer system boards to identify and repair faults in electronic devices that are out of manufacturer support, warranty, or maintenance. In cases where "the panel computer is broken and the production equipment cannot be used," there is a possibility of extending its life through repairs. Please feel free to contact us if you have any requests. [We address issues such as the following] ■ Power won't turn on ■ Won't boot up ■ Monitor is too dark to see ■ Touch panel is unresponsive ■ Screen is cracked, etc. *For more details, please refer to the PDF document or feel free to contact us.

• Other processing machines
• Calibration and repair

At AITES, we use environmental testing equipment that conforms to standard specifications such as JIS, JEDEC, and MIL, and we accept commissioned testing for reliability evaluation of various electronics products, components, and materials. We offer a range of tests including electrical testing, non-destructive observation, and power cycle testing. 【Environmental Testing】 ■ Highly Accelerated Life Testing ■ Constant Temperature and Humidity Testing ■ Thermal Shock Testing ■ Liquid Bath Thermal Shock Testing ■ Temperature and Humidity Cycle Testing ■ In-Situ Continuous Measurement Reliability Evaluation Testing Service *For more details, please refer to the PDF materials or feel free to contact us.

• Analytical Equipment and Devices
• Analysis Services

At AITES, we propose and conduct contract analysis menus suitable for the purpose and sample, including the analysis of organic and inorganic substances, foreign substances, and surface analysis. In this department, we perform component analysis of microscopic foreign substances using advanced sampling techniques, as well as impurity analysis in samples, conducting both qualitative and quantitative analysis of organic and inorganic components. Additionally, we analyze the surface of samples for contamination and oxidation states. 【Service List】 ■ Component analysis of epoxy resin curing agents using Pyrolysis GC/MS ■ Analysis of microscopic organic foreign substances using Imaging FT-IR ■ Analysis of microscopic foreign substances using Micro-Raman spectroscopy ■ Ion Chromatography (IC) analysis, etc. *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices
• Analysis Services

At Aites, we undertake contract processing of cross-sections of various components and materials, including electronic components, mounted circuit boards, semiconductors, compound semiconductors, power devices, films, resin molded products, solar panels, and LCD glass. We also conduct observation and analysis of the produced cross-sections, providing contract analysis for defect analysis and quality evaluation. 【Service List】 ■Mechanical polishing ■CP processing ■Microtome ■FIB processing ■Analysis of semiconductor diffusion layers, etc. *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices
• Analysis Services

The hassle of removing PV cables for inspection of CIS thin-film panels has been eliminated. With high-speed checks from the panel surface during power generation, the efficiency of CIS inspections has dramatically improved. By simply replacing the sensor unit of the Solamente-iS SI-200, the Solamente CiS Adapter (optional) SC-200 allows for high-speed inspection of CIS thin-film panels when attached to the already widely used Solamente-iS (SI-200) in solar panel inspection sites. By utilizing the iS panel checker function, which detects power generation current from the panel surface, for CIS panels, economical CIS panel inspections have become possible. Without removing the PV cables, it is now easy to efficiently identify failures in CIS thin-film panels (such as bypass diode shorts) in a short amount of time.

• Other inspection equipment and devices

A new feature of Solamente that detects faulty panels during pre-power transmission inspections and power outage inspections. A new inspection method that links SZ-200 and SI-200. Inspection Method By linking Solamente-Z (SZ-200) and Solamente-iS (SI-200), sensors (SR-200) check the panels along the string circuit. Faulty panels are located where the sensor's response is interrupted.

• Other inspection equipment and devices

The Solar Panel Checker Solamente-iS SI-200 is an inspection device that detects cluster failures* by placing a sensor on the surface of panels during power generation. It senses the generated current flowing through the interconnector and displays it in musical notes and LED levels, allowing for instant identification of clusters that are not generating power. (*Cluster failures can occur due to initial defects, aging deterioration, lightning damage, etc.) With just a press of a button, the built-in illuminance sensor automatically adjusts the sensitivity. The measurement speed is approximately 5 seconds per panel, making it high-speed. With the super long extension pole (optional), it can reach panels up to 3.6 meters away.

• Other inspection equipment and devices

The String Checker Solamente-Z SZ-200 is an inspection device that probes each string P/N terminal of the connection box to detect strings with fault panels. It applies a special detection signal to the string circuit, measures the open circuit voltage and series resistance (impedance), and identifies strings with abnormalities. The SZ-200 achieves fast inspections, is resistant to changes in sunlight, and offers high operability, ensuring reliable results and significantly improving the efficiency of inspection work.

• Other inspection equipment and devices

At AITES Co., Ltd., we assist our customers in solving various challenges related to bare wafers and their processing. In response to the increasingly diverse semiconductor needs, we provide expertise and excellent responsiveness in the areas of wafer, film deposition processing, and reclaim processing in the front-end field. Additionally, we have started accepting orders for MEMS prototype processing using silicon and fine electroforming. 【Service Offerings (Partial)】 ■ Wafer film deposition processing ■ Wafer patterning processing ■ Wafer reclaim processing ■ Sales of bare wafers *For more details, please refer to the PDF materials or feel free to contact us.

• Prototype Services
• Ceramics

The PVX1000+POPLI-μ allows for photoluminescence observation of the fine structure of wafers during the solar cell manufacturing process using a microscope. In the case of PERC, it is possible to evaluate individual Local-BSFs based on PL intensity and assess the damage to the passivation layer around the laser contact holes. Additionally, defect location identification is possible through EL observation of the module using a DC power supply.

• Image Processing Equipment
• Defect Inspection Equipment
• Contract measurement

The PVX1000+POPLI-Octa can evaluate wafers during the solar cell manufacturing process using photoluminescence. It is capable of assessing the passivation effects of the PN junction layer after thermal diffusion, the AR layer deposition, surface contamination, as well as the protective effects of the rear insulation layer and the evaluation of Local-BSF. Additionally, by using a DC power supply for EL observation of the module, it is possible to pinpoint the locations of defects. By applying reverse bias to the module and observing LEAK points, defects that have caused PID can be easily identified.

• Image Processing Equipment

24 million pixel high-definition camera Auto focus Automatic power control Supports bulk measurement of large modules Easy yet high-performance image processing software Achieves a low price of one-third that of conventional models Free sample evaluation demo available.

• Microscope
• Image analysis software
• Defect Inspection Equipment

Free sample evaluation demo now available. POPLI is an advanced PL imaging device that adds a PL imaging unit as an option to the EL image inspection device PVX, achieving clear PL imaging and cost-effectiveness by utilizing the detection capabilities and software of the PVX.

• Image Processing Equipment
• Image Processing Software
• Defect Inspection Equipment

We provide repair and longevity services for computers used in production equipment, industrial devices, and panel computers (panecons) through our long-standing track record in computer repair and unique methods. Additionally, we also offer circuit board repairs, power supply repairs, monitor repairs, touch panel repairs, and overhauls.

• Notebook PC
• Desktop PC
• Industrial PCs

■Problem-Solving Ability Consulting that leads to solutions with knowledge and technology Supporting customer schedules with quick responses ■Investigative Ability Skills to pinpoint and visualize malfunctioning areas Deep insight and advanced, delicate sample processing techniques ■Specialized Equipment Liquid tank thermal shock testing at up to 180°C Power cycle testing essential for power semiconductors

• Transistor
• diode

■Comprehensive Capability Consistent evaluation resistance from reliability testing to electrical characteristic measurement, optical characteristic measurement, and further analysis. ■Rich Analytical Methods - Forward bias analysis / Reverse bias analysis - Detection from visible to infrared - Emission analysis / OBIRCH analysis ■Special Technology By filtering the visible light range, we can detect weak emissions from abnormal areas without missing them.

• Bullet-shaped LED
• Chip type LED
• LED Module

Aites is a solution-oriented company that sincerely addresses customer challenges in cutting-edge industrial fields. We utilize various owned devices to provide optimal solutions. ■ Product Analysis / Defect Analysis / Failure Analysis Morphological observation, electrical characteristic measurement, defect analysis, failure analysis, sample processing ■ Reliability Evaluation Testing Reliability evaluation testing, ESD/latch-up testing, strength testing, optical characteristics ■ Physical Analysis / Chemical Analysis Physical analysis, surface analysis, chemical analysis

• Contract Analysis

【Testing, Evaluation, Analysis】 　●Reliability Testing 　　■Temperature Cycle Testing 　　■Thermal Shock Testing 　　■High-Temperature Storage Testing 　　■Highly Accelerated Life Testing 　　■Preconditioning 　　■Hot Oil Testing 　　■In-situ Continuous Measurement 　　■Ion Migration Testing 　　■Electromigration Testing 　　■Test Consulting 　●Evaluation Testing 　　■Bond Strength Testing: Pull/Shear Testing 　　■Mechanical Strength Testing: Vibration/Shock/Fall Testing/Compression Strength/Shear Strength 　　■ESD/Latch Up/CDM Testing 　　■Electrical Characteristic Measurement 　　■Salt Spray Testing 　●Analysis 　　■X-ray Transmission Observation 　　■Ultrasonic Microscope Observation 　　■Luminescence Analysis (EMS/IR-OBIRCH) 　　■Scanning Electron Microscope (SEM) 　　■Transmission Electron Microscope (TEM) 　　■Surface Contamination Analysis (TOF-SIMS) 　　■Foreign Substance Analysis (FT-IR)

• Other contract services

Unreliable LCD displays are causing problems in the market. At Aites, we solve our customers' reliability issues through our extensive experience and state-of-the-art equipment, conducting reliability test design and visual inspections before and after testing. Furthermore, we provide support from failure mode classification to failure analysis and material analysis.

• Contract Inspection
• Testing Equipment and Devices
• Contract Analysis

We perform optimal preprocessing for power devices such as diodes, MOS FETs, and IGBTs of all sizes and shapes, and identify and observe defective areas through backside IR-OBIRCH analysis and backside emission analysis. ■ Preprocessing for analysis - Backside polishing - We accommodate various sample forms. Si chip size: 200um to 15mm square ■ Defective area identification - Backside IR-OBIRCH analysis and backside emission analysis - IR-OBIRCH analysis: Supports up to 100mA/10V and 100uA/25V Emission analysis: Supports up to 2kV * We address a wide range of defect characteristics such as low-resistance shorts, micro leaks, and high voltage breakdown failures. ■ Pinpoint cross-sectional observation of leak areas - SEM/TEM - We select SEM or TEM observation based on the predicted defects and can conduct physical observation and elemental analysis of leak defect areas with precision.

• Contract Analysis
• Transistor
• Analytical Equipment and Devices

TEM can perform not only high-magnification observation but also elemental analysis using EDS and EELS, as well as analysis of crystal structure, surface orientation, lattice constants, and more through electron diffraction.

• Contract Analysis
• Other semiconductors
• Other contract services

The joints of electronic components have a significant impact on the overall reliability of the circuit board. Particularly at solder joints, it is important to observe not only the shape but also the metal structure.

• Contract Analysis
• Other contract services
• Contract measurement

A new method for structural analysis of electronics products manufactured with nanoscale precision, such as semiconductor devices, MEMS, and TFTs: We propose cross-beam FIB for cross-sectional observation.

• Contract Analysis
• Other contract services
• Electron microscope

■High Accelerated Life Test: 5 units ■Thermal Shock Test: 24 units ■Constant Temperature and Humidity Test: 22 units ■Liquid Tank Thermal Shock Test: 3 units ■High Temperature Storage Test ■Hot Oil Resistance Evaluation Test ■Insulation Resistance Continuous Monitoring Evaluation ■Continuity Resistance Continuous Monitoring Evaluation ■Electromigration Continuous Monitoring Evaluation ■Microfocus X-ray Transmission Observation ■Ultrasonic Microscope Observation ■ESD Evaluation Test ■CDM Evaluation Test ■Universal Tensile Evaluation Test ■Cross-section (Polishing) Observation Service (Evaluation before and after environmental testing is also possible) ■Solar Cell (Crystalline Silicon/Amorphous Silicon/Compound/Organic Thin Film, etc.) EL Emission Phenomenon ■Heat Generation Observation

• Contract Inspection
• Testing Equipment and Devices
• Other inspection equipment and devices

We provide testing services to evaluate the resistance to ESD damage and latch-up damage, which are important for the reliability of semiconductor devices and electronic components that include them. ■ We accommodate products such as IC modules, electronic components, and subsystems with up to 512 pins. ■ We offer tests in accordance with standards such as JEDEC, EIAJ, and ESDA. ■ We propose and conduct tests tailored to your requests and objectives. ■ In the event of any issues with resistance, we assist with failure analysis and problem resolution.

• Contract Analysis

■ We support products such as IC modules, electronic components, and subsystems with up to 512 pins. ■ We provide testing that complies with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. ■ We propose and conduct tests tailored to our customers' requests and objectives. ■ In the event of any issues with reliability, we assist with failure analysis and problem resolution.

• Contract Inspection
• Other contract services
• Other inspection equipment and devices

■ We will support each standard waveform for JEDEC, JEITA (EIAJ), and AEC through unit replacement. ■ We support both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). ■ The contact state confirmation function of the applied pins ensures reliable application. ■ Destruction judgment support is also possible using the diode characteristic judgment method (consultation required).

• Contract Inspection
• Other contract services
• Other inspection equipment and devices

In-situ continuous measurement reliability evaluation tests involve applying stress while measuring characteristics to conduct reliability assessments. ● Accurate understanding of failure time is possible In a read-out method where samples are taken from a stress environment at a fixed time, failure can only be understood at the timing of the read-out, making it impossible to know the exact failure occurrence time. In-situ measurement allows for an accurate understanding of failure time. ● Detection of recoverable failures is possible Recoverable failures can cause significant issues in the market. In most cases, the read-out method makes it nearly impossible to detect these recoverable failures, whereas in-situ measurement enables the detection of recoverable failures, allowing for accurate judgment and assessment. ● Monitoring of stress application conditions on samples is possible The stress application status and measurement data can be confirmed in real-time.

• Contract Inspection
• Testing Equipment and Devices
• Other inspection equipment and devices

Some overseas manufactured parts and products may initially operate without issues, but can cause malfunctions and lead to failures and breakdowns in a short period of time. Before adopting or using overseas products, please consider AIT's parts and product quality evaluation services. ■ Examples of overseas parts evaluation - Reliability evaluation during the parts procurement and selection stage - Comparative evaluation between parts and product manufacturers - Reliability evaluation when replacing current parts with alternative parts (cost reduction) ■ Examples of applicable parts - Active components (transistors, diodes, thyristors, etc.) - Passive components (capacitors, resistors, etc.) - LCDs - Circuit boards - Power supplies - Etc.

• Contract Inspection
• Testing Equipment and Devices
• Other inspection equipment and devices

■Service Overview 1. Micro ATR Method IR data acquisition of foreign substances is possible if they are approximately 5um or larger. 2. Surface Distribution Image Observation of the in-plane distribution of organic substances is possible. 3. Temporal Changes Measurement of the state of organic substances that change on a second-by-second basis is possible.

• Contract Analysis
• Analytical Equipment and Devices
• Other contract services

■Special Sampling Techniques for Foreign Substances in Multilayer Films - Foreign substances buried in metal films on substrates Metal film etching ⇒ Transfer to Si wafer ⇒ FT-IR analysis - Foreign substances in multilayer films Cutting off the surface layer ⇒ Transfer to Si wafer ⇒ FT-IR analysis Microtome/FIB thinning ⇒ Transfer to Si wafer ⇒ FT-IR analysis

• Contract Analysis
• Analytical Equipment and Devices
• Other contract services

■TOF-SIMS Three Analysis Modes - High-resolution mass spectrum - Depth profile analysis - Surface mapping analysis

• Analytical Equipment and Devices
• Contract Analysis
• Other contract services

● Comprehensive technical services covering the entire product life cycle We provide support throughout the entire product life cycle, including raw material evaluation during development necessary for improving the quality of electronic components, reliability testing and result analysis, timely feedback of failure analysis and results to the development and manufacturing sites after shipment, and consulting for quality problem resolution. ● Prompt analysis and reporting of reliability test results For defects identified in reliability testing, we assist in accurate and timely cause identification and analysis through a rich and efficient analysis menu. ● Use only the services you need, as much as you need You can freely choose from a range of services, including conducting tests and inspections based on a predetermined evaluation plan, developing evaluation and analysis plans for problem resolution, result analysis, cause investigation, and consultation, according to your needs.

• Contract Analysis
• Contract Inspection
• Analytical Equipment and Devices

■ We support products such as IC modules, electronic components, and subsystems with up to 512 pins. ■ We provide testing that complies with major domestic and international standards such as JEDEC, JEITA, and AEC. ■ We propose and conduct tests tailored to our customers' requests and objectives. ■ In the event of any issues with reliability, we assist with failure analysis and root cause investigation to resolve the problem.

• Contract Inspection
• Other contract services
• Other inspection equipment and devices