List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
91～135 item / All 675 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
A belt grinding machine that has been in use for about 50 years since 1973. In addition to trust and proven results, the lineup is also extensive.
- Other machine tools
Belt grinding machine "Veda Machine" has high durability and a wide range of service parts.
The "Bader Machine" is our belt grinder that boasts excellent polishing performance for each individual unit. By selecting models and types according to the shape and size of the workpiece, and by equipping it with a polishing belt suitable for the task, it can flexibly accommodate a wide variety of items across various fields. Please make extensive use of it for high-efficiency polishing and grinding, reduction of work time, labor-saving, and standardization of tasks. 【Lineup】 ■ Portable type BP-K (air motor type) ■ Made-to-order machine PC-1 (wheel centerless), BC (standard dust cover) ■ Installed type BM (basic type), SBA-1, BH-2 ■ Wheel type SBD-4S, SBD-7, BWd *For more details, please download the PDF or contact us.
Now, we can measure the acceleration tests of semiconductors that could not be measured in real time until now.
- Semiconductor inspection/test equipment
High-performance semi-automatic prober capable of measuring microcurrents at the fA level.
- Other physicochemical equipment
- Semiconductor inspection/test equipment
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A new technology for active alignment of camera modules significantly improves the throughput of module manufacturing using 3D charts.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
- Other semiconductors
Exhibited at SEMICON Japan 2021 Hybrid.
Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.
If you're looking for low-cost, high-performance semiconductor IC testers, choose CCTECH. We're revealing the reasons why we can provide extensive support!
- Semiconductor inspection/test equipment
Inspection of semiconductor defects, unevenness, and stains is handled by a single machine using the same inspection process.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
- Visual Inspection Equipment
Exhibited at SEMICON Japan 2021 Hybrid.
Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.
Hexa EVO+ is a device that inspects both the front and back sides of semiconductor IC packages and packages them for taping and other purposes.
- Binding/Packing Machine
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Exhibited at SEMICON Japan 2021 Hybrid.
Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.
Power semiconductor tester for low-voltage discrete devices at Si level. Increases throughput by testing 16 sites simultaneously.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
- Tester
Exhibited at SEMICON Japan 2021 Hybrid.
Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.
Customize the optical integrated circuit you want to measure! It can also be used for spectral analysis and functional testing.
- Semiconductor inspection/test equipment
Achieving ultra-thin, high rigidity, and high precision.
- Semiconductor inspection/test equipment
Adopting a low-dust structure, ideal for clean environments! Achieving high speed, high rigidity, and long-term maintenance-free operation!
- Semiconductor inspection/test equipment
It is used in a wide range of industries such as machinery, semiconductor and LCD manufacturing equipment, industrial robots, medical and welfare, transportation equipment, construction, and aerospace...
- Other machine elements
- Milling machine
- Semiconductor inspection/test equipment
Can be used for various applications! Such as patterning of organic devices and cutting of metal wiring for ICs, etc.
- Semiconductor inspection/test equipment
It is a UV irradiation device that can utilize DUV light up to 248nm and allows for wavelength selection and switching.
- Semiconductor inspection/test equipment
Achieving high magnification, high resolution, and high density resolution! Compact X-ray TV inspection device.
- Semiconductor inspection/test equipment
Equipped with SOFTEX original X-ray generator! An X-ray inspection device that can be installed anywhere.
- Semiconductor inspection/test equipment
Image recomposition time is approximately 10 seconds! A 3D CT unit that can be integrated into standard X-ray equipment.
- Semiconductor inspection/test equipment
Overall alignment accuracy ±2.5μm! Inspection equipment for large individual pieces/quarter panels.
- Semiconductor inspection/test equipment
LUL can provide proposals tailored to your specifications! We accommodate a variety of automation requirements.
- Semiconductor inspection/test equipment
Double table/shuttle type! Inspection equipment for FC-CSP/large individual chip substrates.
- Semiconductor inspection/test equipment
Practical application of ultrasonic ultrasonic technology mounted on a spin sheet device!
- Semiconductor inspection/test equipment
Maximum size up to 1,200mm × 3,600mm can be produced. Can be made in either glass or resin.
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- others
Cam and gear software
- Other machine tools
- gear
- Semiconductor inspection/test equipment
It is also possible to impart water-repellent properties to the tapered surface on the outer circumference to improve ESI efficiency!
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
Would you like to achieve efficiency in repair and maintenance inspection operations and improve customer satisfaction with the core business package "ServAir" for after-sales service?
- Semiconductor inspection/test equipment
ServAir Cloud V4.3 has released the "BI Option."
We are pleased to announce the release of the after-sales service core business package, ServAir Cloud V4.3. In V4.3, we will offer a new BI (Business Intelligence) option. You will be able to analyze various data from ServAir and create graphs using the BI tool QuickSight provided by AWS Japan (Amazon Web Services Japan LLC). ServAir's data will be available in a format that can be easily utilized on QuickSight, allowing you to perform data analysis, forecasting, create various graphs, and manage KPIs on your own. This enables you to manage, analyze, and share data tailored to your business goals. V4.3 is scheduled to go on sale on December 15, 2023, and to start shipping on January 26, 2024. Please feel free to contact us for an introduction to the product, including the new features of V4.3.
We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We will exhibit at the 2024 Japan Proteomics Society Annual Meeting and the 20th Joint Meeting of the Japanese Clinical Proteogenomics Society.
Our company will be exhibiting at the Joint Conference of the 2024 Annual Meeting of the Japanese Proteomics Society and the 20th Annual Meeting of the Japanese Clinical Proteogenomics Society, which will be held at Link Station Hall Aomori from June 26 to 28, 2024. At our booth, we will showcase a complete set of interfaces that enable high-sensitivity measurements using capillary electrophoresis-mass spectrometry (CE-MS). We invite anyone using CE-MS, as well as those who own an MS and are interested in utilizing capillary electrophoresis, to visit our booth.
CDSEM, boasting an overwhelming market share, along with the Hitachi S8000 and S9000 series. We have a constant inventory of equipment and a complete demonstration system in place.
- Semiconductor inspection/test equipment
Sheet substrate electrical testing system! (Continuity testing, insulation testing, four-terminal testing, micro-short detection) FPC, flexible substrates, PCB, PKG
- Other inspection equipment and devices
- Circuit Board Inspection Equipment
- Semiconductor inspection/test equipment
【TTL】Board Power-On Test Device 'TY-CHECKER DS401' Semi-Automatic Type, a power-on testing machine for printed circuit boards, capable of high-frequency testing in a semi-automatic manner (continuity testing, insulation testing, four-terminal testing, micro-short detection).
The "TY-CHECKER DS401" is a powered inspection system that adds X-direction movement (horizontal movement) to the conventional Y-direction step-and-repeat transport. Since the device is semi-automatic, the entire front of the machine is almost open, making it easy to handle the workpieces. It is designed to be useful in product development and manufacturing environments. Transitioning to mass production can also be done smoothly by adopting the AT type. *We also assist with the supply of jigs! It supports both a unique dedicated plate holding method that does not apply tension and a tension holding method, allowing selection according to the product. By swapping the measurement unit, high-frequency characteristic testing can be performed either on sheets or individual pieces, leveraging the advantages of jig fixation to achieve stable automatic/semi-automatic high-frequency testing. 【Features】 ■ Maximum substrate size: 305mm x 510mm ■ Step-and-repeat transport in the XY direction ■ Contributes to downsizing of jig head (reducing jig costs) ■ Continuity, insulation, 4-terminal testing, micro-short detection ■ High-frequency characteristic testing compatible with 'VNA, LCR, TDR' *For more details, please refer to the PDF document or feel free to contact us.
Fusing the "design capabilities" of machinery, electronics, and software! We respond to needs in a one-stop manner.
- Semiconductor inspection/test equipment
Zirconia (ZrO2) has high bending strength and compressive strength at room temperature, and its fracture toughness is extremely high.
- Fine Ceramics
- Mounter
- Semiconductor inspection/test equipment
OYM-401 is a manual prober compatible with optical microscopes. It is equipped with multiple positioners, allowing for easy probing.
- Semiconductor inspection/test equipment
It is a device that automatically supplies semiconductor wafers to the inspection machine. It employs a vibration isolation mechanism to prevent vibrations during inspection.
- Semiconductor inspection/test equipment
266nm CW (continuous wave) laser 10mW - 550mW @ 266nm Compact head Air-cooled, low noise
- Semiconductor inspection/test equipment
Anisotropic conductive sheet
- Semiconductor inspection/test equipment
- Other semiconductors
- others
W-CSP inspection probe card
- Semiconductor inspection/test equipment
- Other semiconductors
- Printed Circuit Board
Consolidating decades of technology developed with contact probes for semiconductor testing!
- Semiconductor inspection/test equipment
- Other semiconductors
- Printed Circuit Board
We will introduce product information by genre for various precision tools and fixtures used in semiconductor manufacturing, as well as individual product specifications.
- Semiconductor inspection/test equipment
- Other semiconductors
- Printed Circuit Board