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Measuring Instrument Product List and Ranking from 1072 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:May 06, 2026～Jun 02, 2026
This ranking is based on the number of page views on our site.

Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:May 06, 2026～Jun 02, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. トリニティーラボ 中央事業所 Tokyo//Testing, Analysis and Measurement
  3. シロ産業 Osaka//Industrial Electrical Equipment
  4. 4 テストー Kanagawa//Testing, Analysis and Measurement
  5. 5 null/null
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Measuring Instrument Product ranking

Last Updated： Aggregation Period:May 06, 2026～Jun 02, 2026
This ranking is based on the number of page views on our site.

  1. Bite Feel Evaluation Measurement Device TL302 [*Free Demo Available*] トリニティーラボ 中央事業所
  2. What are the risks of "micro temperature excursions" in the cold chain? テストー
  3. Comprehensive Catalog of Color, Reflection/Transmittance, Gloss, Haze, Turbidity, and Chromaticity Measurement Instruments 日本電色工業
  4. 4 VR-6000 Series One-Shot 3D Shape Measuring Machine
  5. 5 Protein Purity Measurement Device "MyMassMP" ライフィクスアナリティカル

Measuring Instrument Product List

421～450 item / All 3381 items

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What should be done to eliminate the imbalance?

What should be done to eliminate the imbalance?

Explanation using a diagram! "Unbalance" refers to the state where the center of gravity of a rotating body is not on the axis of rotation.

This explains how to eliminate vibrations caused by imbalance. By bringing the center of gravity to the center of the rotation axis, vibrations caused by imbalance can be resolved. For example, by adding weights of the same amount at positions symmetrical to the imbalance with respect to the rotation axis, the center of gravity shifts onto the rotation axis, thereby eliminating vibrations caused by imbalance. *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Gloss Mobile GM-1 (Portable Gloss Meter)

Gloss Mobile GM-1 (Portable Gloss Meter)

Gloss Mobile GM-1 (Portable Gloss Meter)

This is a mobile gloss measurement device that can measure at three angles simultaneously. It easily measures at three angles of 20°, 60°, and 85° at once. Its palm-sized design makes it easy to carry, making it ideal for field measurements. It comes standard with wireless communication (Bluetooth), allowing measurement data to be sent in real-time to a remote computer, eliminating the need for connection cables (communication distance up to about 10 meters).

  • Optical Measuring Instruments
  • Analytical Equipment and Devices
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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M-TEST LL (Residual Magnetic Field Measuring Device)

M-TEST LL (Residual Magnetic Field Measuring Device)

Rapid and reliable measurement of remanent magnetism "M-TEST LL" (remanent magnetism measuring device). We promise a robust design and excellent finish.

The M-Test LL has been specially developed for easy and reproducible measurement of residual magnetism. Thanks to its robust design and excellent finish, the M-Test LL can be used in various applications both on-site and in the laboratory, and it is commonly used in the automotive industry, industrial production, and other fields. 【Features】 - High-speed detection of fine magnetic fields with LED display - Used in laboratories for development and production - Measurement of DC and AC magnetic fields - Automatic storage of maximum values for N and S poles - Selectable measurement units (A/cm, Gauss, mT) - High-quality aluminum housing with color touch screen - Up to 7 hours of battery life - Integrated analog interface

  • Company：パル
  • Price：100,000 yen-500,000 yen
  • Other electronic measuring instruments
  • Measuring Instrument

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Proposal for Aluminum Material Electrical Resistance Measurement Service (1) Resistance Measurement During 90A Current Flow

Proposal for Aluminum Material Electrical Resistance Measurement Service (1) Resistance Measurement During 90A Current Flow

You can specify the duration of the power supply! Please use it for investigating the electrical properties of materials.

What happens at the contact point during electrical measurements? How does the contact resistance change over time? What is the temperature rise when a large current, such as 400A, is flowing? What is the contact resistance value in a high-temperature environment of 300°C? By conducting actual measurements, it is possible to quantify what is really happening. Additionally, by combining several types of equipment, we can approach measurements that are closer to real-world conditions. We are also accepting requests for visits at any time. For more details, please contact us through our website. ○http://www.sankei-engineering.com/○

  • Special Steel
  • Other metal materials
  • alloy
  • Measuring Instrument

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Is that contact probe really okay?

Is that contact probe really okay?

Unstable data acquisition! Frequent probe replacements! Is that probe really suitable? The first 10 customers will receive free contact resistance measurements.

Improvement of the stability and durability of acquired data. This is determined by the contact resistance value between the contact probe and the device. However, the contact resistance value can easily change due to various conditions such as the material and surface treatment of the device. What is the contact probe suitable for the intended measurement? By accurately understanding the contact resistance value, the situation becomes clearer. Stabilizing the acquired data can lead to cost reduction, quality improvement, and increased reliability. Please take this opportunity to try our services.

  • alloy
  • Engine parts
  • Measuring Instrument

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Portable Immobilization Degree Measuring Device "Sten Checker II Mini"

Portable Immobilization Degree Measuring Device "Sten Checker II Mini"

A diagnostic doctor that protects stainless steel from rust and corrosion! Repairable in a very short processing time.

The "Sten Checker II Mini" is a portable passivation degree measuring device that has been improved to eliminate the need for switch operation at the start and end of measurement; it starts when the electrode chip is pressed against the specimen and stops the timer when released. It is extremely suitable not only for production management but also for acceptance inspection by clients troubled by issues of rust and corrosion in stainless steel. The "Sten Checker II" mentioned in the attached PDF document has been discontinued. 【Features】 ■ Easy to operate and non-destructive ■ Quick measurement time of about 1 minute ■ Portable and battery-free ■ No need for cutting or grinding, allowing measurement on equipment that is in operation ■ Easy measurement of the sides and ceiling surfaces of equipment *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Ultrasonic Vibration Sorting Measurement Device Robot Shifter RPS-01 Model

Ultrasonic Vibration Sorting Measurement Device Robot Shifter RPS-01 Model

Always advanced technology - Automatic sorting measurement robot Shifter.

This is a frequency-variable measuring device that automates everything from sample input, sieve separation measurement, weighing, to output of calculation results. It performs separation using ultrasonic waves, allowing for efficient classification in a short time compared to vibration and rotary tapping methods (see the principle of ultrasonic waves). Weighing after separation is done by a robotic hand, and the calculation results are automatically printed out and displayed on the operation panel. The newly enhanced robotic shifter has become faster and more user-friendly. Please make use of it for process management, quality inspection, and streamlining.

  • Other measurement, recording and measuring instruments
  • Sieve/Shaker
  • Other weight measuring instruments
  • Measuring Instrument

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Product Catalog of the Screening Equipment Series

Product Catalog of the Screening Equipment Series

The sorting equipment you are looking for is here! Seishin's sorting equipment series.

This catalog introduces the "Sifting Equipment Series" from Seishin Corporation, which manufactures and sells equipment related to powder engineering. We offer a variety of products tailored to our customers' needs, including the electromagnetic vibration sifter, the Ro-Tap sifter, and the automatic control ultrasonic sifting measurement device. [Featured Products] ■ Electromagnetic Vibration Sifter "Octagon 200" ■ Ro-Tap Sifter "Dura Tap" ■ Automatic Control Ultrasonic Sifting Measurement Device "GA-6/GA-8" ■ Cyclone Airflow Sifting Classifier "Spin Air Sieve" and others *For more details, please refer to the PDF document or feel free to contact us.

  • Sieve/Shaker
  • Food Testing/Analysis/Measuring Equipment
  • Other powder equipment
  • Measuring Instrument

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Multi-functional Powder Property Tester "Multi Tester MT-02"

Multi-functional Powder Property Tester "Multi Tester MT-02"

A highly versatile measuring device that supports various measurement and evaluation methods with a single unit.

The "Multi Tester MT-02" is a device for measuring the physical properties of powders. With this single device, you can measure many important powder physical property factors that are essential for evaluating powders, designing particles, and designing grinding systems and powder transport systems. The analysis of measurements and physical property values can evaluate flowability, fluidity, and adhesion using "Carr's index" and "Kawakita's equation," providing high versatility. 【Features】 ■ Complies with Japanese Pharmacopoeia standards ■ Improved measurement accuracy for angle of repose, angle of collapse, and spatula angle ■ Logging of measurement environment using temperature and humidity sensors (to confirm if the measurement environment is appropriate) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices
  • Measuring Instrument

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Absorbance measurement device

Absorbance measurement device

Absorbance measurement device

This is a spectrophotometer that allows for easy measurement of absorbance. With a light source and CCD spectrometer, it enables fast and high-precision absorbance measurements in the range of 200nm to 1100nm. By simply setting the included cell containing the solution into the main unit, you can immediately obtain the absorbance.

  • Microscope
  • Measuring Instrument

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Tabletop 3D Measuring Device 'Fulcrum'

Tabletop 3D Measuring Device 'Fulcrum'

3D measurement anywhere! Desktop 3D measuring instrument.

"Fulcrum" is a compact tabletop 3D measuring device. [Features] ■ Direct measurement on-site No complicated setup is required; simply set the workpiece and start measuring immediately. It can output various types of inspection reports, completing the process from machining to measurement inspection to report output on-site. ■ Stable accuracy The arm section is made of carbon material, allowing it to adapt to changes in temperature and humidity. By registering the temperature environment at the installation site during measurement, you can obtain measurement results that reflect the thermal expansion coefficient of the work material. ■ Diverse measurement menu It is equipped with a variety of measurement menus. By measuring multiple elements, you can check the distances and angles between them, and you can also measure the virtual intersection points between the measured planes. *Please view the PDF data from the download button below.

  • 3D measuring device
  • Measuring Instrument

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Thermomechanical Analysis Device TMA/SDTA2+

Thermomechanical Analysis Device TMA/SDTA2+

Enables thermal mechanical analysis over a wide measurement temperature range with easy operation.

The Mettler Toledo TMA/SDTA 2+ offers a wide range of temperature capabilities and a broad selection of strength parameters for both compression and tension modes, making it suitable for various applications. Therefore, the TMA/SDTA 2+ can quickly provide information on the properties of numerous sample types, including very thin films, large sample cylinders, fine fibers, films, plates, soft and hard polymers, and single crystals.

  • Analytical Equipment and Devices
  • Measuring Instrument

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Portable Total Organic Carbon (TOC) Sensor '450TOC'

Portable Total Organic Carbon (TOC) Sensor '450TOC'

A portable real-time TOC measurement device that reduces the time required for system and component verification as well as profiling by up to 75%.

MetraTredo's portable total organic carbon (TOC) sensor '450TOC' <Quick performance verification> Measurement range (concentration): 0.05 ppb – 1,000 ppb Response time: 60 s Detection limit: 0.025 ppb

  • Analytical Equipment and Devices
  • Measuring Instrument

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Measurement, weighing, and barcode reading device "TLX Series"

Measurement, weighing, and barcode reading device "TLX Series"

Logistics solutions for industrial use, accommodating a wide range from letters to cargo. Providing complete data profiles related to invoices, sorting, tracking, and loading plans.

The "TLX Series" dimension measurement, weighing, and barcode reading device from Metra Toledo allows you to choose appropriate dimension measurement/barcode reading settings, operation modes, and integration options according to your application. The TLX can be integrated into sorting lines as a fully automated system or set up with consideration for manual intervention.

  • Other conveying machines
  • Measuring Instrument

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Digital weaving density measurement device 'FX3250-II Pick Counter'

Digital weaving density measurement device 'FX3250-II Pick Counter'

The measurement values are displayed digitally! It is suitable not only for use in the laboratory but also for measurements in the manufacturing site.

The "FX3250-II Pick Counter" is a measuring device that can quickly, easily, and accurately measure the fabric density of textiles and wire mesh. It is suitable not only for use in laboratories but also for measurements in manufacturing environments. Although it is handheld, it can accommodate high-density fabrics and serves as an alternative to traditional magnifying glasses and striped plates for measuring fabric density. 【Features】 - Quickly, easily, and accurately measures the fabric density of textiles and wire mesh - Suitable for use in laboratories as well as for measurements in manufacturing environments - Accommodates high-density fabrics - Serves as an alternative to traditional magnifying glasses and striped plates for measuring fabric density - Measurement values are displayed digitally *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices
  • Analytical Equipment and Devices
  • Measuring Instrument

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Laser Micrometer "SUPER-MECLAB+.X"

Laser Micrometer "SUPER-MECLAB+.X"

High flexibility! Capable of measuring various components and dimensions without gauge remastering.

"SUPER-MECLAB+.X" is a high-precision measuring instrument for ultra-high precision diameter measurement. It employs NO-VAR technology, ensuring no measurement drift due to temperature changes. Through feed measurement allows for easy and quick multi-diameter measurement. Additionally, it enables checking multiple dimensions for high flexibility in measurement, allowing users to choose from various measurement types. 【Features】 ■ Capable of measuring details that cannot normally be detected ■ Can measure various components and dimensions without remastering the gauge ■ Reduces inspection time and improves measurement performance ■ Provides objective and highly reproducible measurement results that do not depend on the operator's skill ■ Non-contact measurement that does not damage or scratch the workpiece *For more details, please refer to the PDF materials or feel free to contact us.

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  • Other measurement, recording and measuring instruments
  • Other machine elements
  • Other inspection equipment and devices
  • Measuring Instrument

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Optical Interference Measuring Instrument 'NCG'

Optical Interference Measuring Instrument 'NCG'

Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

The "NCG" is a thickness measurement device using optical interference technology. It calculates and measures the thickness of layers through the interference caused by the reflection of light waves at the joint surface of the workpiece. It is designed to manage the thickness of different materials such as glass, plastic, and silicon wafers. This product can be connected to various machines, allowing for high-precision and high-speed management of component thickness, and can be used in dry or wet environments within the specified limits of the specifications, either on the machine or inside the machine. 【Features】 ■ Guarantees processing accuracy within the desired tolerance ■ Reduces cycle time ■ Control for maintaining stable production under controlled conditions ■ Compensation for mechanical variations ■ History of measurement results *For more details, please refer to the PDF document or feel free to contact us.

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  • Optical Measuring Instruments
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Dice Diameter Measurement Device "D-Lab"

Dice Diameter Measurement Device "D-Lab"

Measure dice diameter easily, quickly, and with high precision. Achieve stable and high-precision measurements in just 1 second, regardless of skill level.

D-Lab is a high-performance and user-friendly die diameter measurement device. It employs a telecentric optical system, LED collimated lighting, and image analysis using a 2D CMOS sensor to measure the diameter and ovality of dies with high precision and non-contact. Equipped with a robust all-in-one PC, it provides stable and reproducible measurement results in a factory environment, independent of the operator's skill level. ■ Features Management of various types of dies: Supports measurement of different types of dies without reconfiguration. Rapid quality assessment: Instant pass/fail determination through color display by comparing with set reference values and tolerance ranges. Data management and report generation: PC storage of measurement results, output in CSV/text format, and printing of statistical reports. *For more details, please refer to the PDF document or feel free to contact us.

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  • D-Lab-software_02.jpg
  • Other processing machines
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Radiation Detector 6150ADT

Radiation Detector 6150ADT

Survey meter for detecting radioactive materials and contamination.

We offer different types depending on the application, such as remote probe type, compact waterproof type, and underwater measurement type.

  • Radiation detector
  • Measuring Instrument

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Radiation Detector IF104

Radiation Detector IF104

Survey meter for detecting radioactive materials and contamination.

We offer different types depending on the application, such as remote probe type, compact waterproof type, and underwater measurement type.

  • Radiation detector
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [NC-10]

Resistance rate / Sheet resistance measuring instrument [NC-10]

Resistance rate / Sheet resistance measuring instrument [NC-10]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [WS-3000]

Resistance rate / Sheet resistance measuring instrument [WS-3000]

Resistance rate / Sheet resistance measuring instrument [WS-3000]

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [CRESBOX]

Resistance rate / Sheet resistance measuring instrument [CRESBOX]

Resistance rate / Sheet resistance measuring instrument [CRESBOX]

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Napson Co., Ltd. Business Introduction

Napson Co., Ltd. Business Introduction

We propose a resistance measurement device to solve your problems.

Napson Co., Ltd. is a company engaged in the research and development, manufacturing, sales, export, and import of electronic mechanical devices (semiconductor-related measurement equipment). There are contact and non-contact methods for measuring resistivity and sheet resistance, and our company is actively involved in the development, manufacturing, and sales of both methods. We offer a wide range of products, from manual to fully automatic, non-stop inline systems, and we also provide detailed customization options that are not available from competing companies. Please feel free to contact us. 【Business Activities】 ■ Research and development, manufacturing, sales, export, and import of electronic mechanical devices (semiconductor-related measurement equipment) *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment
  • Measuring Instrument

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Non-contact resistance tester "NC-700"

Non-contact resistance tester "NC-700"

Embedded non-contact (eddy current method) sheet resistance measurement module (for film samples)

The "NC-700" is a measuring instrument that continuously measures the sheet resistance of conductive films on substrates such as PET film in-line. It can be manufactured with the required number of lines (i.e., probes), making it suitable for a wide range of applications from research and development to production lines. Due to its offset-free specification, it can perform continuous measurements for up to 24 hours without shifting measurement values. It is also compatible with existing transport devices and film deposition equipment. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ In-line type (non-contact) ■ Embedded measurement module ■ Supports a wide range of applications ■ Continuous measurement for up to 24 hours is also possible *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment
  • Measuring Instrument

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Measuring instrument "FLA-200"

Measuring instrument "FLA-200"

Wafer flatness measurement system!

The "FLA-200" is a non-contact flatness and thickness measurement system. It measures the flatness (TTV, BOW, WARP) and thickness of wafer samples. It supports measurements of thickness, TTV, BOW, warp, site flatness, and global flatness (in accordance with ASTM standards), and data output in CSV format is also possible. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Software compatible with 2-D and 3-D mapping display ■ High-precision measurement using a 5mmφ core capacitive probe ■ High-speed measurement of 12,000 points in under 60 seconds *For more details, please contact us or download the catalog.

  • Other measurement and measuring equipment
  • Semiconductors and ICs
  • Measuring Instrument

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