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  3. アイテス
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Electronic Components and Semiconductors
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アイテス

EstablishmentJanuary 1, 1993
capital3000Ten thousand
number of employees106
addressShiga/Otsu-shi/1-60 Kuribayashi Town
phone077-599-5015
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last updated:Nov 27, 2025
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Defects and Physical Analysis Defects and Physical Analysis
Processing observation Processing observation
Surface and chemical analysis Surface and chemical analysis
Reliability test Reliability test
Electrical equipment repair Electrical equipment repair
Wafer processing Wafer processing
Solar panel inspection and testing equipment Solar panel inspection and testing equipment
Equipment held Equipment held
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Spectral radiance and chromaticity evaluation of liquid crystal displays.

Measurable contrast ratio and color temperature! Quantitative evaluation of changes in optical properties.

Our company can measure the optical properties of LCD displays and OLEDs using a spectroradiometer. By conducting measurements before and after testing, we can quantitatively evaluate changes in optical properties. Spectral radiance is measured in four patterns: white, red, green, and blue. It is possible to measure various optical properties such as luminance, chromaticity, and dominant wavelength. 【Measurement Device Overview】 ■ Measurement Items: Spectral radiation, luminance, chromaticity ■ Measurement Range: 0.0005 cd/m² to 5,000,000 cd/m² ■ Wavelength Measurement Range: 380 nm to 780 nm ■ Wavelength Resolution: 1 nm (Effective wavelength width [half-width]: 5 nm) ■ Installation Method/Fixtures: Vertical, horizontal, etc., depending on the shape *For more details, please refer to the PDF document or feel free to contact us.

  • Spectroscopic Analysis Equipment
  • Contract measurement

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Solder Heat Resistance Test (SMD)

Reproducing temperature stress during transportation! Evaluating the presence or absence of delamination and cracks through heat treatment.

Our company conducts a "Solder Heat Resistance Test (SMD)" to evaluate the heat resistance of surface mount devices (SMD) during the soldering process. We replicate moisture absorption prior to mounting through humidification treatment and assess the presence of delamination or cracks through heating treatment that corresponds to the thermal stress during soldering. As part of the post-test inspection, we perform the same inspection as the initial measurement, and if necessary, we also conduct analyses such as cross-sectional observation of defective areas. 【Flow of Solder Heat Resistance Test】 ■ Initial Measurement ■ Temperature Cycle (shipping condition) ■ Drying Treatment (Baking) ■ Humidification Treatment (Soaking) ■ Heating Treatment (Reflow) ■ Final Measurement *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices

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Analysis of defects in overseas manufactured displays.

Numerous achievements in defect analysis! Detailed analysis is possible, from confirming phenomena to hypothesizing the mechanisms of defect occurrence.

Our company conducts "defect analysis of overseas manufactured displays." We can perform detailed analysis from confirming the phenomenon, hypothesizing the defect occurrence mechanism, to narrowing down the production processes that caused the issue. We carry out lighting observations, panel disassembly, and optical microscope observations tailored to the defect symptoms. If it is necessary to narrow down the defective areas and conduct detailed analysis, we will propose appropriate methods. 【Examples of detailed analysis (partial)】 ■ Cross-sectional observation of wiring ■ Foreign object analysis ■ Liquid crystal component analysis ■ Electrical characteristic measurement *Additional costs will be incurred. *For more details, please refer to the PDF document or feel free to contact us.

  • LCD display

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Analysis of trace metal elements in liquid crystals

Depending on the panel size, it is possible to analyze using different ICP-AES/MS devices!

We will introduce a case where ICP measurement was conducted using panels before and after reliability testing, along with quantification. The liquid crystal molecules in an LCD are oriented within the panel, and the display is controlled by changes in the orientation state of the liquid crystal due to voltage. When ionic substances, such as metal elements, are present inside the panel, the liquid crystal does not operate correctly, leading to display defects. Ionic substances are known to increase due to contamination during manufacturing or long-term use, making it important to quantify and understand them as part of panel quality. Metal ions can be quantitatively analyzed using ICP analysis, and depending on the differences in pretreatment methods and detection sensitivity, ICP-AES and ICP-MS are used selectively. [Analysis Content] ■ Comparison of metal element content using ICP-AES analysis ■ Comparison of metal element content using ICP-MS analysis *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis Services

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Analysis of film property changes due to UV irradiation.

Investigating how the light transmittance of blue light cut film changes using a spectrophotometer!

Blue light cut film has the effect of suppressing the transmission of visible light, particularly light with a wavelength of 500nm or less, compared to regular PET film. Using a spectrophotometer, we examined how the light transmission of the blue light cut film changes under UV irradiation. The transmission of light in the wavelength range of 350 to 400nm decreased further due to UV irradiation. Additionally, we conducted an analysis of the reactions occurring within the film using GC-MS. [Analysis Content] ■ Light transmission characteristics of regular PET film and blue light cut film ■ UV irradiation on blue light cut film ■ GC-MS analysis of components within the film *For more details, please refer to the PDF document or feel free to contact us.

  • Ultraviolet irradiation equipment

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Reverse bias test of power devices (up to 2000V)

It is possible to set bad standards (current values)! Evaluate device degradation and characteristics through high temperature and high voltage power supply.

At AITES Co., Ltd., high-temperature reverse bias testing (HTRB) for evaluating the oxide film and junction of power devices can be applied up to 2000V. By monitoring the leakage current during the test, the degradation status of the device can be grasped in real-time. Since the power supply is independent, if one device fails during the test, it will not affect the other devices. Additionally, it is possible to set a failure criterion (current value) and to cut off the power supply of the device deemed faulty at the time of failure judgment. 【Features】 ■ Real-time monitoring of the leakage current during testing allows for understanding the degradation status of the device. ■ The independent power supply ensures that if one device fails during testing, it does not affect other devices. ■ The power supply of the device deemed faulty can be cut off at the time of failure judgment. *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices

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Surface observation of IC chips implemented on LCD panels.

The observation target is an IC chip connected to the LCD panel using the COG mounting method! The circuit surface was clearly visible.

We will introduce a case where precision planar grinding was applied to remove glass substrate wiring and conductive particles, allowing for the observation of IC chip circuits with minimal damage. Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. There are many samples, like the one in this case, where detailed observation has become possible through planar grinding, as well as samples that can be processed using FIB or CP techniques. If you have any samples you are struggling with, please consult us. We accept requests for planar grinding only, as well as requests that include observation and analysis. [Overview] <Planar Grinding and Optical Observation> ■ Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. ■ The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Inspection
  • Other contract services

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Analysis of impurities in organic solvents

The aldol reaction progresses under the influence of temperature, humidity, and light! Example of impurity analysis in ethanol and acetone.

This is an example of analyzing impurities confirmed from a solvent when high-purity products are stored in inappropriate environments, using liquid injection GC-MS. Ethanol stored in a light-protective reagent bottle in a cool, dark place was transferred to a used plastic wash bottle and left at room temperature for about a month. As a result, impurities such as triethyl borate and alkylbenzenes were detected. Additionally, acetone stored in a light-protective reagent bottle in a cool, dark place was transferred to a transparent glass bottle without light protection and left at room temperature for about a month, resulting in the detection of diacetone alcohol as an impurity. [Impurity Analysis in Ethanol] ■ Ethanol stored in a light-protective reagent bottle in a cool, dark place was transferred to a used plastic wash bottle and left at room temperature for about a month (the opening of the wash bottle was not sealed). ■ Result: Impurities such as triethyl borate and alkylbenzenes were detected. *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Contract Analysis
  • Other contract services

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Analysis of fragrance components by GC-MS.

GC-MS is used for qualitative and quantitative analysis of low molecular organic substances! Data was obtained and compared using incense and sandalwood!

Using fragrance as a keyword, we analyzed common incense and compared the characteristics of its molecular structure with other materials. The three representative fragrant woods obtained from trees are sandalwood, agarwood, and kyara, but this time we collected data on incense and sandalwood. With aldehyde groups and aliphatic cyclic structures as features, it is speculated that the woody scent is mainly due to the aliphatic cyclic structure. [Analysis Overview] ■ Analysis Samples: Incense, Sandalwood ■ Identification of fragrance components by thermal desorption GC-MS (180°C) - Confirmed peaks with the same detection time as sandalwood - Indicates that sandalwood is used as a fragrance in the incense *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Contract Analysis
  • Other contract services

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Cross-sectional hardness of aluminum welds (spot welding)

Cross-sectional observation and hardness measurement of the weld joint were conducted! It was found that the void in the center is a blowhole.

We conducted hardness measurements on aluminum spot welds after performing cross-sectional observations and investigated the trends based on Vickers hardness, Young's modulus, and elasticity ratio. From X-ray radiographic observations, voids were confirmed inside the weld. Cross-sectional observations revealed that the central void was a blowhole. Additionally, the hardness measurement results indicated that the area near the blowhole was hard but had low stiffness and was prone to deformation, while areas slightly away from the blowhole exhibited higher stiffness and were somewhat brittle. [Summary] ■ Observation case of aluminum spot welds: optical microscope images, X-ray images - Voids confirmed inside the weld from X-ray radiographic observations ■ Hardness measurements of aluminum spot weld cross-sections - Measurements conducted centered around the blowhole - Investigation of trends based on Vickers hardness, Young's modulus, and elasticity ratio *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • others

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Roundness / Circularity Measurement

We will respond to your request to evaluate roundness and circularity!

Are you having trouble evaluating whether the axes and the formed holes are according to the design specifications? We attach samples to the KEYENCE "VR-6200" electric rotating unit, obtain 3D data by rotating it 360 degrees, and measure roundness from the profile. Additionally, we measure circularity using the image processing software "WinROOF2021." Please feel free to contact us when you need assistance. 【Features】 <Roundness Measurement Using VR-6200> ■ Attach the sample to the electric rotating unit and rotate it 360 degrees ■ Obtain 3D data and measure from the profile <Circularity Measurement Using Image Processing Software> ■ When measuring the circularity of commercially available probe pins using WinROOF2021, it was observed in the SEM image that they are not perfectly circular. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract measurement

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Material evaluation using ultra-micro hardness testing for metals, polymers, plastics, etc.

It is also possible to analyze many material properties such as Young's modulus, plastic hardness, plastic deformation amount, elastic ratio, and creep! Variations in hardness and other properties can be expressed using standard deviation.

Our company can perform ultra-microhardness measurements on various materials such as metals, polymers, plastics, and ceramics. Additionally, since hardness can be quantified, the characteristics of the materials become clearer. The ultra-microhardness tester "Fischer scope H100" measures by gradually increasing the load up to the set value, allowing for the continuous profiling of hardness and indentation depth from the surface, as well as information on the effects on the material. By determining the hardness value from the penetration depth of the indenter into the material and the load/penetration depth curve after unloading, it is possible to analyze many physical properties beyond hardness, such as Young's modulus, plastic hardness, plastic deformation amount, elastic ratio, and creep. Please feel free to contact us if you are considering evaluating the characteristics of materials. *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Solar Cell EL Image Measurement Device PVX330

Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.

24 million pixel high-definition camera Auto focus Automatic power control Supports bulk measurement of large modules Easy yet high-performance image processing software Achieves a low price of one-third of conventional models Free sample evaluation demo now available.

  • Microscope
  • Image analysis software
  • Defect Inspection Equipment

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Solar cell PL imaging unit POPLI-3C

Solar cell 6-inch cell compatible PL excitation light source. By combining with the EL image inspection device PVX series, PL observation becomes possible.

Free sample evaluation demo now available. POPLI is an advanced PL imaging device that adds a PL imaging unit as an option to the EL image inspection device PVX, achieving clear PL imaging and cost-effectiveness by utilizing the detection capabilities and software of the PVX.

  • Image Processing Equipment
  • Image Processing Software
  • Defect Inspection Equipment

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EL/PL imaging device PVX1000+POPLI-Octa

Wafer can be evaluated using photoluminescence during the solar cell manufacturing process.

The PVX1000+POPLI-Octa can evaluate wafers during the solar cell manufacturing process using photoluminescence. It is capable of assessing the passivation effects of the PN junction layer after thermal diffusion, the AR layer deposition, surface contamination, as well as the protective effects of the rear insulation layer and the evaluation of Local-BSF. Additionally, by using a DC power supply for EL observation of the module, it is possible to pinpoint the locations of defects. By applying reverse bias to the module and observing LEAK points, defects causing PID can be easily identified.

  • Image Processing Equipment

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Microscopic EL/PL imaging device PVX1000+POPLI-μ

Microscopic PL observation of the fine structure of wafers in the solar cell manufacturing process.

The PVX1000+POPLI-μ allows for photoluminescence observation of the fine structure of wafers during the solar cell manufacturing process using a microscope. In the case of PERC, it is possible to evaluate individual Local-BSFs based on PL intensity and assess damage to the passivation layer around laser contact holes. Additionally, defect location identification is possible through EL observation of modules using a DC power supply.

  • Image Processing Equipment
  • Defect Inspection Equipment
  • Contract measurement

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Wafer processing service

Aites wafer processing service that supports the birth of new technologies.

Aites' wafer business division offers professional wafer processing services that widely cater to a diverse range of test wafer needs. Aites boasts a dedicated 8-inch processing line as its flagship, providing services in the wafer processing field for over 12 years. We utilize our accumulated technical know-how and unique processing resources to comprehensively address processing requirements ranging from 2 inches to 12 inches. A notable feature of Aites' wafer services is the high number of repeat customers, as we gain strong trust from our clients by supporting wafer processing projects quickly and broadly.

  • Ceramics

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Measurement of inorganic particle size using dynamic light scattering method.

Determine particle size and particle size distribution! Example of measuring the particle size of silica and alumina particles in an aqueous medium.

Dynamic light scattering allows for the measurement of particle size and size distribution of nanoparticles dispersed in a liquid without separating the particles. Here, we present an example of measuring the particle size of silica and alumina particles in an aqueous medium. Particles in a solution exhibit Brownian motion that depends on their size, and the fluctuations in the scattered light produced when the particles are illuminated depend on their size as well. By observing and analyzing these fluctuations, we can determine the particle size and size distribution. [Alumina Measurement Results and Discussion] - As alumina approaches neutrality from strong alkaline conditions, it nears its isoelectric point. - The surface charge of the particles decreases. - The repulsion between particles diminishes. - It can be inferred that particle aggregation is occurring. *For more details, please refer to the PDF document or feel free to contact us.*

  • Contract measurement

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Analysis of Liquid Crystal Display Materials

We propose analytical methods tailored to materials and purposes! Here are examples of chemical analysis for each component, such as liquid crystals and sealing materials.

Liquid crystal displays use various organic materials, including liquid crystals, sealing materials, encapsulants, and polarizers. Considering the material properties and degradation mechanisms of each component from a chemical perspective is important for product evaluation and defect analysis. This document presents examples of chemical analysis for the components of liquid crystal displays. [Examples of Chemical Analysis] ■FT-IR: Principal component analysis ■EDX: Elemental analysis ■GCMS: Liquid crystal component analysis ■HS-GCMS: Outgassing analysis (degradation analysis) and more *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Other contract services

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One-shot 3D shape measuring device "VR-6200"

With this one device, you can measure various things! It can reproduce cross-sectional shapes without cutting, and it can also measure glossy surfaces!

Aites Co., Ltd. has introduced the KEYENCE manufactured one-shot 3D shape measuring device 'VR-6200'. It comes with an electric rotation unit, allowing for the reproduction of cross-sectional shapes without cutting. The HDR scanning algorithm enables measurement of glossy surfaces as well. From profile measurement to flat measurement, volume area, and comparative measurement, this single device can perform various measurements. 【Measurable Items】 ■ Profile Measurement ■ Flat Measurement ■ Volume Area ■ Line Roughness Measurement ■ Surface (Flatness) Measurement ■ Comparative Measurement *For more details, please refer to the PDF document or feel free to contact us.

  • 3D measuring device

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Raman spectroscopy acquisition service for minerals in rocks

Assist in the study of rocks and minerals! Raman spectroscopy is very effective for identifying and analyzing mineral species in rocks.

Introducing our Raman spectrum acquisition service for rocks. If you send us thinly sliced rock samples or extracted minerals and specify the measurement locations, we will obtain the Raman spectra for the specified locations. We also offer thin sectioning, elemental analysis (EDX/EPMA), and EBSD analysis. Please feel free to contact us when needed. 【Features】 ■ Raman spectra are very effective for identifying and analyzing mineral species in rocks. ■ If you send us thinly sliced rock samples or extracted minerals and specify the measurement locations, we will obtain the Raman spectra for the specified locations. ■ We also offer thin sectioning, elemental analysis (EDX/EPMA), and EBSD analysis. *For more details, please refer to the PDF document or feel free to contact us.

  • Other contract services

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Announcement of the Introduction of FIB-SEM Helios 5 UC

Cross-section production of soft materials has also been realized! 3D reconstruction is possible with Auto Slice & View!

The introduction of the "FIB-SEM Helios 5 UC" is scheduled to start service in November! We will provide shorter delivery times and reliable feedback than ever before. We will achieve high-throughput cross-sectional observation and analysis of a wide range of materials, from semiconductor devices such as power devices, ICs, solar cells, and light-emitting elements, to electronic components like MLCCs and soft materials. With a high-quality beam of up to 100nA, we can process large areas quickly, and by finishing the FIB at low acceleration, it is possible to produce high-quality samples with minimal damage layers. 【Main Features of Helios 5 UC】 ■ High-speed, large-area FIB processing ■ Reduced damage layers through low-acceleration finishing ■ Cryo-FIB processing ■ 3D imaging ■ Complete automation of TEM sample preparation *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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[Data] Measurement of the birefringence of laminate film

Explaining the effects of combining PET and EVA! Introducing measurement results using laminated film.

"Laminating film" is used in various industries to protect the display surface while maintaining the visibility of printed materials by utilizing highly transparent materials. During processing, heat bonding is performed, so it is assumed that the molecular state changes compared to before processing. In this study, we attempted to clarify the residual stress remaining in the product by comparing conditions with and without heat applied to the laminating film, using birefringence. This document presents measurement results using a laminating film composed of polyethylene terephthalate (PET) and ethylene-vinyl acetate (EVA) as an example. [Contents] ■ Measurement of glass transition temperature by DSC ■ Measurement of birefringence by WPA ■ Effects of combining PET and EVA *For more details, please refer to the PDF document or feel free to contact us.

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[Data] GC-MS analysis by solvent extraction

I will introduce examples of comparing the components of color developers contained in thermal paper using solvent extraction!

As a pre-treatment for GC-MS analysis, solvent extraction can sometimes allow for highly sensitive analysis of target substances. This document introduces examples of component comparison of dirt wiped with a cloth and component comparison of color developers contained in thermal paper using solvent extraction. In addition to solvent extraction, we can propose suitable methods from various pre-treatment techniques tailored to your samples and analysis targets, so please feel free to contact us. [Contents] ■ Comparative analysis of dirt components and surrounding materials ■ Component comparison of color developers contained in thermal paper *For more details, please refer to the PDF document or feel free to contact us.

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Introduction to Cross-Section Processing and Observation Methods

Mechanical grinding allows for a wide range of processing and observation! We will propose appropriate processing and observation methods or combinations.

We will introduce sample processing using mechanical polishing and mechanical polishing combined with ion milling treatment. Mechanical polishing is a common and long-established method for creating cross-sections, allowing for a wide range of cross-sectional production. Additionally, by combining it with ion milling treatment, it is possible to create observation surfaces comparable to those produced by CP processing. At Aites, we propose appropriate processing and observation methods or combinations based on our accumulated know-how. Please feel free to contact us for consultations or inquiries. 【Features】 ■ Mechanical polishing allows for extensive processing and observation. ■ By repeating mechanical polishing and imaging, three-dimensional observation is possible. ■ Observation at any desired location can be performed based on the constructed 3D image. ■ After mechanical polishing, depending on the sample, observation comparable to that of CP processed samples is possible. *For more details, please refer to the PDF materials or feel free to contact us.

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[Data] Measurement of resin molecular weight by high-temperature GPC (SEC)

The analysis device also supports the analysis and evaluation of polymers! Information on the configuration and principles of high-temperature SEC equipment is provided!

The molecular weight of resins such as plastics is not a single value but is composed of multiple molecular weights. By understanding this molecular weight and its distribution, it leads to a better understanding of the characteristics and degradation mechanisms of the resin. In this document, we will introduce a case study where we measured polypropylene resin (PP) samples with and without ultraviolet (UV) irradiation using a high-temperature GPC device suitable for measuring polyolefin-based materials that are difficult to dissolve in solvents at room temperature, and conducted data analysis. We encourage you to read it. [Contents] ■ Configuration and principles of high-temperature SEC ■ Analysis case: Molecular weight measurement of PP subjected to UV irradiation ■ Application examples ■ Specifications and considerations for high-temperature SEC *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Analysis and evaluation of organic materials and polymer materials.

Essential materials alongside metals and inorganic materials! Introducing examples of analysis and evaluation services for organic materials.

Organic materials such as solvents, additives, pharmaceuticals, and plastics are essential materials alongside metals and inorganic materials. They have a wide variety of types due to combinations of light elements, and their specificity arises from structures, intermolecular forces, and electron behavior. However, it seems that chemical instrumentation analysis and evaluation are necessary for a fundamental understanding of their properties. This document presents examples of analysis and evaluation services for organic materials. [Contents] ■ FT-IR analysis ■ GC-MS analysis ■ Molecular weight distribution evaluation by GPC (SEC) *For more details, please refer to the PDF document or feel free to contact us.

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[Information] GC-MS Analysis Device Guide

Introducing the sample introduction device and the types of analytical samples and analysis content that each device specializes in!

GC-MS analysis is a method commonly used for the analysis of organic components and organic structure analysis. With auxiliary devices, it is capable of a wide range of analyses, from low molecular substances like solvents to high molecular substances like plastics. In this document, we will introduce the sample introduction devices owned by Aites, as well as the types of analysis samples and analysis content that each device specializes in. We invite you to read it. 【Contents】 ■ Overview ■ Conditions ■ Samples ■ Data Obtained ■ Analysis Examples *For more details, please refer to the PDF document or feel free to contact us.

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[Example of TOF-SIMS] Wide-area image map

Wide-area image map driven by stage! Introducing a measurement example that visualizes the distribution of magic.

We will introduce a case of TOF-SIMS that enables wide-area image map measurement by combining it with an electric stage. We conducted wide-area (30mm × 30mm) image mapping measurements by drawing with two types of black markers on a metal plate. It is difficult to distinguish between the two types of markers in optical images, but by confirming the image map with characteristic secondary ion peaks for each marker, we can visualize the distribution of the markers. Additionally, there are cases where detailed analysis results were obtained from spectra after wide-area image map measurements using TOF-SIMS. [Overview] ■ Standard measurements (beam scan measurements) target sizes of 500μm × 500μm or smaller. ■ By combining with an electric stage, wide-area image map measurements are possible. *For more details, please refer to the PDF document or feel free to contact us.

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3D construction by mechanical polishing

Introducing the advantages and disadvantages of 3D construction using X-ray CT and FIB slice cross-sections, as well as the 3D construction method using mechanical polishing!

We will introduce a case study of a 3D construction method using mechanical polishing. Ceramic capacitors have a structure where thin film electrodes are stacked internally, and X-ray CT cannot confirm the internal electrodes as they appear transparent. Additionally, 3D construction using FIB slice cross-sections is limited to localized confirmation due to the sample being only a few millimeters thick. The 3D construction method using mechanical polishing can complement the areas where X-ray CT and FIB slice cross-sections are not effective, allowing for 3D construction in some cases. [Case Study of 3D Construction of Ceramic Capacitors Using Mechanical Polishing] ■ X-ray CT image: Internal electrodes cannot be confirmed ■ 3D construction using FIB slice cross-sections: Limited to localized confirmation ■ 3D construction using mechanical polishing: Internal electrodes can be confirmed, allowing for extensive 3D observation *For more details, please refer to the PDF document or feel free to contact us.

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[Analysis Example by EDS] Bonding Interface of Cu Pad

It is possible to view the distribution of each element in two dimensions! This can also be effective when analyzing multilayer samples.

We would like to introduce a case study of EDS analysis at the Cu pad interface. In qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds, the concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray. For intermetallic compounds, it is possible to estimate the formed compounds based on the calculated concentration ratios. Additionally, in line analysis, it is possible to profile the concentration distribution of each element along a specified line in the SEM image, allowing for the observation of changes in element concentration at the analysis location. 【Features of EDS Analysis】 ■ Qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds - Concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray - Intermetallic compounds can be estimated based on the calculated concentration ratios ■ Line analysis - Concentration distribution of each element along a specified line in the SEM image can be profiled - Changes in element concentration at the analysis location can be confirmed *For more details, please refer to the PDF document or feel free to contact us.

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Energy Dispersive X-ray Spectroscopy (EDS)

Detecting characteristic X-rays! An effective analytical method for obtaining elemental information in micro-regions and small foreign substances.

"Energy Dispersive X-ray Spectroscopy (EDS or EDX)" is a method that detects characteristic X-rays generated by electron beam irradiation using a detector attached to an electron microscope (SEM or TEM), allowing for the acquisition of elemental information about samples or foreign substances. When characteristic X-rays generated by irradiating a material with an electron beam enter the detector, a number of electron-hole pairs equivalent to the energy of the characteristic X-rays are produced. By measuring this number (current), it is possible to determine the energy of the characteristic X-rays, and since the energy varies by element, it is possible to investigate the elemental information of the material. [Analysis by EDS (partial)] ■ Qualitative analysis of intermetallic compounds (point analysis) - By examining which elemental characteristic X-ray energy corresponds to the characteristic X-rays in the measured spectrum, the types of elements can be investigated. ■ Semi-quantitative analysis of intermetallic compounds - By examining the intensity (count number) of each characteristic X-ray, the concentration of the contained elements can be calculated. *For more details, please refer to the PDF document or feel free to contact us.

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Solar Panel Measurement Device Reuse Checker RUC-100

【Easy for Beginners】Instantly determine the feasibility of reusing solar panels! Reduce processes and costs associated with sorting for reuse or disposal/recycling!

The "Reuse Checker RUC-100" is a simple diagnostic device designed to allow individuals without electrical expertise to determine defective solar panels. It automatically assesses five measurement items comprehensively and displays the results as pass/fail on an LCD screen, making it easy to sort and judge. Measurement items can be saved in the device's built-in memory for each panel, and CSV data can be output. 【Features】 ■ Displays pass/fail results on an LCD screen ■ Easy sorting and judgment ■ Five measurement items can be saved in the device's built-in memory for each panel ■ CSV data can be output *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
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Raman analysis of carbon materials

Measure the Raman spectrum! It is possible to obtain information about the structure and crystallinity of carbon materials.

Carbon materials include various types such as graphite, activated carbon, and carbon fibers, and are widely used in applications such as the active material for the negative electrode of lithium-ion batteries, additives for conductive plastics, inks, and CFRP. Our company evaluates the structural differences of carbon materials through Raman analysis. In the case of carbon black (CB) and activated carbon, the G-band peak becomes broader compared to graphite, and the full width at half maximum increases. This indicates that the crystallite size differs, with graphite having a larger crystallite size than CB and activated carbon. **Differences in Raman spectra due to carbon materials:** - Graphite shows a strong and sharp G-band around 1580 cm-1. - It indicates the disorder in the hexagonal structure, which is the unit cell of graphite, and the stacking of layers is more disordered. - In CB and activated carbon, the G-band peak is broader compared to graphite, and the full width at half maximum is larger. - Graphite has a larger crystallite size than CB and activated carbon. *For more details, please refer to the PDF document or feel free to contact us.*

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[Data] Analysis of Additive Defects in Polymers Using Thermal Desorption GC-MS

It is possible to analyze with good sensitivity using thermal desorption GC-MS analysis! We propose methods tailored to the symptoms of issues and objectives.

Various additives are used in polymers to improve stability and processability; however, due to environmental impact and long-term storage, additive components may precipitate on the polymer surface, or the additives themselves may undergo chemical changes, leading to discoloration and degradation. This document presents examples of analyzing the bleed-out of additives and the chemical changes of additive components due to UV irradiation using thermal desorption GC-MS. Although additive components are present in only small amounts compared to the main polymer components, they can be analyzed sensitively using thermal desorption GC-MS. We propose methods tailored to specific issues or objectives, such as predicting product degradation in combination with reliability testing, thermal analysis, and main component analysis. Please feel free to contact us. [Contents] ■ Analysis of additive components bled out from nitrile rubber ■ Analysis of additive components in nylon 66 subjected to UV irradiation *For more details, please refer to the PDF document or feel free to contact us.

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[Information] Differentiating Between Optical Microscopes and SEM

Comparing optical microscopes and SEM with the same sample! I will explain the advantages and disadvantages.

Optical microscopes and SEM (scanning electron microscopes) are commonly used for sample observation, but each has its own characteristics, so it is important to choose the appropriate device according to the purpose. In this document, we compare optical microscopes and SEM using the same sample and introduce the generally mentioned advantages and disadvantages. Please take a moment to read it. 【Contents】 ■ Features of Optical Microscopes ・ Advantages / Disadvantages ・ Recommended for this type of observation ■ Features of SEM (Scanning Electron Microscope) ・ Advantages / Disadvantages ・ Recommended for this type of observation *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Analysis of Polycarbonate Degradation by Reaction Thermal Decomposition

For material evaluation and defect analysis! We will discuss the applied load and degradation mechanisms based on the differences in decomposition products.

Polycarbonate is a material that excels in impact resistance, weather resistance, and transparency, making it widely used in everything from industrial materials to everyday products. However, even polymers with excellent properties can undergo chemical changes, commonly referred to as degradation, due to the usage environment and the passage of time. This document presents examples of degradation analysis of polycarbonate materials subjected to UV irradiation and constant temperature and humidity testing. [Contents] ■ Thermal decomposition GC-MS analysis of polycarbonate *For more details, please refer to the PDF document or feel free to contact us.*

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[Case of EBSD] Comparison of two brass materials

Visualizing the differences between two samples based on differences in crystal structure! Introducing a case study of EBSD analysis.

Here is a case study comparing two types of brass with similar elemental compositions. When spectral analysis was performed using SEM-EDX, it was found that brass mainly consists of Cu (copper) and Zn (zinc), and the elemental compositions of both samples appeared to be relatively similar. Additionally, an EBSD analysis was conducted, and the phase map revealed the presence of a β phase with a different crystal structure in part of Sample 1. [Case Overview] <Comparison of Two Brass Materials through Elemental Analysis> ■ Analysis Method: SEM-EDX Analysis ■ Results - Spectral analysis indicated that brass mainly consists of Cu (copper) and Zn (zinc), and the elemental compositions of both samples appeared to be relatively similar. - Surface analysis was conducted for elements Cu and Zn, and no bias in the in-plane distribution was observed. *For more details, please refer to the PDF document or feel free to contact us.

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Quantitative analysis of low molecular weight siloxanes

Confirmation methods for low molecular weight siloxanes! It is also possible to analyze the amount of occurrence.

It is known that low molecular siloxanes emitted from silicone products can cause the generation of silicon dioxide, an insulator, due to the heat of electrical sparks when present around the contacts of electronic components, leading to contact failures. Here, we introduce outgassing quantitative analysis using HS-GCMS as a method for confirming low molecular siloxanes. HS-GCMS analysis can determine whether there are materials around the electronic components that generate low molecular siloxanes and to what extent they are emitted. Please feel free to contact us regarding sample size and conditions. 【HS-GCMS Analysis of Silicone Adhesive Tapes】 - Tapes using silicone adhesives are sealed in a vial. - After heating at 130°C for 30 minutes, the emitted outgas is analyzed using headspace GCMS. - For the detected low molecular siloxanes, quantification was performed based on the equivalent of cyclic siloxane D5. *For more details, please refer to the PDF document or feel free to contact us.*

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Screening analysis of phthalate esters

The regulatory limit is 1000 ppm! You can easily check for the presence or absence of regulated compounds.

Phthalate esters are used as additive components, such as plasticizers, in many plastic products. However, under the revised RoHS directive, four new types of phthalate esters have become regulated substances. Our "screening analysis" allows for a simple examination of the presence or absence of regulated compounds. If a concentration of 500 to 1500 ppm is estimated, a more detailed quantitative analysis will be conducted for confirmation. In addition to the four types regulated by the RoHS directive, we can also perform a simple "screening analysis" for DNOP, DINP, and DIDP, which are regulated under JIG and the Food Sanitation Act. Please feel free to contact us for details about the samples and target compounds. 【Screening analysis of phthalate esters in bubble cushioning materials using Py-GC/MS】 ■Judgment criteria: Semi-quantitative values - Below 500 ppm: Determined as non-detect - Above 1,500 ppm: Determined as detect - 500 to 1,500 ppm: Re-examination will be conducted through quantitative analysis by solvent extraction *For more details, please refer to the PDF document or feel free to contact us.

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Comparison Analysis of HDPE and LDPE

Analysis of material structure and material properties, as well as discussions on defects and degradation phenomena using various analytical methods.

There are two main types of polyethylene resin: high-density polyethylene (HDPE) and low-density polyethylene (LDPE). While the basic molecular structure of each is the same, the differences in the number of branching structures and other factors result in different properties as polymers. Here, we present examples comparing HDPE and LDPE from various analyses. Our company not only analyzes material structures and properties but also examines variations in process conditions, defects, and degradation phenomena through various analytical methods. [Case Study Content] ■ Comparative analysis of main skeleton using FT-IR ■ Comparative analysis of thermal decomposition temperature using EGA-MS ■ Comparative analysis of thermal decomposition products using thermal decomposition GC-MS *For more details, please refer to the PDF document or feel free to contact us.

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Thermal shock test

Not only the joints of electronic components, but also the evaluation of fixed parts such as screws!

At AITES Co., Ltd., we conduct "Thermal Shock Testing." By repeatedly exposing samples to high and low temperatures, not only does stress occur due to thermal effects, but also due to the expansion and contraction of various parts. Repeated stress also adds to the overall stress. This test is conducted not only for the joints of electronic components but also for evaluating fixed points such as screws. 【Main Specifications of the Thermal Shock Testing Equipment】 ■ Internal dimensions: W650×H460×D370mm, Temperature range: -65 to 0/+60 to 200℃ ■ Internal dimensions: W650×H460×D670mm, Temperature range: -65 to 0/+60 to 200℃ ■ Internal dimensions: W970×H460×D670mm, Temperature range: -65 to 0/+60 to 200℃ *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices

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Ultrasonic Microscope 'SAM'

Non-destructive observation is possible! It is effective in detecting defects in internal conditions and adhesion states!

We would like to introduce our ultrasonic microscope, the SAM (Scanning Acoustic Microscope). It is highly effective in detecting defects in the internal conditions and adhesion states of semiconductor packages, substrates, and electronic components. Observation can be performed non-destructively, and defects such as delamination can be detected from the reflected waves of the ultrasonic waves incident on the sample. 【Specifications (excerpt)】 ■ Pulse Receiver: 500MHz ■ Observation Methods: Compatible with both reflection and transmission methods ■ Acoustic Lenses / Reflection Method: 15, 25, 30, 50, 80, 100, 230MHz ■ Acoustic Lenses / Transmission Method: 15, 25, 30, 50, 100MHz *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

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[Data] Verification of overlap degree and molecular weight difference through IR analysis.

A reference peak was established in the ethylene section, focusing on the peaks involved in the ether bond!

This document introduces the analysis by Aites Inc. titled "Verification of Degree of Polymerization and Molecular Weight Differences through IR Analysis." Polyethylene oxide (PEO) is used in a wide range of applications due to its properties derived from its polar structure, including as an insulating material and electrolyte in lithium-ion polymer secondary batteries, surfactants, cosmetics, and synthetic detergent raw materials. In this study, we analyzed PEO with different degrees of polymerization and molecular weights using IR analysis, attempting to interpret the differences from the spectra and conduct data analysis. We invite you to read it. [Contents] ■ Polyethylene Oxide ■ Data analysis through overlaying IR spectra of each obtained sample ■ Other analytical methods are also possible *Please feel free to contact us.

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CDM Test for Low Humidity Environment

Achieving humidity below 30% with dry air! Introducing the humidity requirements and specifications of major standards in CDM testing.

In ANSI/ESDA/JEDEC JS-002-2014, it is required that the relative humidity near the device during testing be kept below 30%. The verification method involves installing temperature and humidity sensors in two locations near the sample to continuously monitor temperature and humidity, and the test begins when the relative humidity falls below 30%. The AEC standards also explicitly state in the 2019 revision that they comply with ANSI/ESDA/JEDEC JS-002, and it is expected that the demand for low humidity environments will continue to increase in the future. 【Humidity Requirements for Major CDM Test Standards】 ■ ANSI/ESDA/JEDEC JS-002-2018: Relative humidity below 30% ■ AEC-Q100-011 Rev-D・AEC-Q101-005 Rev-A: Relative humidity below 30% ■ JEITA ED-4701/302A (Test Method 305D): Ambient temperature 25°C ± 5°C *For more details, please refer to the PDF document or feel free to contact us.

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