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Measuring Instrument Product List and Ranking from 1168 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated: Aggregation Period:Apr 15, 2026~May 12, 2026
This ranking is based on the number of page views on our site.

Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Apr 15, 2026~May 12, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. null/null
  3. FOSS JAPAN Co., Ltd. Tokyo//Testing, Analysis and Measurement
  4. 4 日本電色工業 Tokyo//Testing, Analysis and Measurement
  5. 5 シロ産業 Osaka//Industrial Electrical Equipment

Measuring Instrument Product ranking

Last Updated: Aggregation Period:Apr 15, 2026~May 12, 2026
This ranking is based on the number of page views on our site.

  1. VR-6000 Series One-Shot 3D Shape Measuring Machine
  2. Comprehensive Catalog of Color, Reflection/Transmittance, Gloss, Haze, Turbidity, and Chromaticity Measurement Instruments 日本電色工業
  3. Grain Near-Infrared Component Measurement Device "InfraTech NOVA" FOSS JAPAN Co., Ltd.
  4. 4 [OPIE'26 Exhibition] Lens Measurement: Optical 3D Surface Roughness Measurement Device
  5. 5 Fully Automatic Image Dimension Measuring Instrument 'IM-X1000 Series'

Measuring Instrument Product List

2131~2160 item / All 3835 items

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Dual Sample Thermal Expansion Rate Measurement Device 'DIL803/803L'

Introducing the "DIL802/802L," capable of high-precision dual sample measurement.

The DIL 803 is a dual-sample dilatometer that maximizes productivity by measuring two samples simultaneously. It can measure in vacuum or inert gas environments, while the DIL 803L is specialized for measurements in air. The horizontally arranged furnace ensures uniform temperature and eliminates the effects of air convection. A high-sensitivity LVDT is used to accurately measure even minute thermal expansion events.

  • Analytical Equipment and Devices
  • Measuring Instrument

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Vertical Thermal Expansion Rate Measurement Device "DIL820 Series"

Measurement of thermal expansion in the vertical direction is possible! The highest sensitivity is guaranteed by a high-resolution inductive sensor (LVDT).

The DIL820 series (DIL 821/822) is a high-precision vertical dilatometer belonging to the DIL 820 series from TA Instruments. These models are equipped with a new optical encoder that has a resolution of 1nm, making them particularly suitable for the analysis of challenging samples. The DIL 822 employs true differential measurement technology, providing the best sensitivity and accuracy for CTE (coefficient of thermal expansion) in the market.

  • Analytical Equipment and Devices
  • Measuring Instrument

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Optical Thermal Expansion Rate Measurement Device "DIL806"

Introducing the "DIL806," capable of measuring thermal expansion rates without contact. It is an ideal tool for measuring amorphous and soft samples.

The DIL 806 optical dilatometer is a high-performance thermal expansion and contraction measurement device provided by TA Instruments. By adopting optical measurement principles, this device enables non-contact measurements that were difficult with conventional dilatometers. The DIL 806 uses an absolute measurement process that is not affected by the expansion or contraction of the testing apparatus itself, eliminating the need to correct measurement results for different temperature programs. This device irradiates a wide planar light onto the sample using high-performance LEDs and detects the shadow of the sample with a high-resolution CCD sensor. A digital edge detection processor evaluates this signal, accurately and sensitively measuring the dimensional changes of the sample in response to temperature variations. The DIL 806 is ideal for measuring materials such as metals and plastics, and thin samples can be easily analyzed using a dedicated sample holder. The furnace allows for rapid heating up to 100°C/min and rapid cooling from 1400°C to 50°C in under 10 minutes. This enables efficient analysis of dynamic processes and tests that include multiple temperature steps.

  • Analytical Equipment and Devices
  • Measuring Instrument

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Analysis case: Measurement example of thermal insulation evaluation by thermal conductivity measurement.

This is an introduction to a case study of insulation material analysis by a specialist in analysis. This time, we will present a measurement case using a thermal conductivity measurement device.

Measurement capabilities offered by TA Instruments ☆ Thermal analysis / glass transition, crystallization, thermogravimetric analysis, curing reactions, expansion rate, thermal conductivity, shrinkage rate, effects of moisture, etc. ☆ Viscoelastic measurements (rheology) / viscoelasticity, elastic modulus, viscosity, stress relaxation, creep, master curve, residual strain, molecular weight, molecular weight distribution, etc. ☆ Microcalorimetry / intermolecular interactions, crystallization, amorphousness, aggregation/precipitation, dispersibility, solubility, compatibility, wettability, stability, adsorption, etc. ☆ Fatigue testing / tensile strength, temperature dependence, viscoelasticity, elastic modulus, viscosity, stress relaxation, creep, master curve, residual strain, etc.

  • Analytical Equipment and Devices
  • Measuring Instrument

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Analysis case: List of thermal analysis devices and measurement cases for bio research.

This is an introduction to analysis cases and related devices for bio research by analysis specialists. This time, we will cover three devices: ITC, TAM, and NanoDSC!

Measurement capabilities offered by TA Instruments ☆ Thermal analysis / Glass transition, crystallization, thermogravimetric analysis, curing reactions, expansion rate, thermal conductivity, shrinkage rate, effects of moisture, etc. ☆ Viscoelastic measurements (rheology) / Viscoelasticity, elastic modulus, viscosity, stress relaxation, creep, master curve, residual strain, molecular weight, molecular weight distribution, etc. ☆ Microcalorimetry / Intermolecular interactions, crystallization, amorphousness, aggregation/precipitation, dispersibility, solubility, compatibility, wettability, stability, adsorption, etc. ☆ Fatigue testing / Tensile strength, temperature dependence, viscoelasticity, elastic modulus, viscosity, stress relaxation, creep, master curve, residual strain, etc.

  • Analytical Equipment and Devices
  • Measuring Instrument

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Powder rheology measurement case (graphite) rheometer

This is a case study analyzing battery graphite using the newly released powder rheology accessories from 2022.

Powder materials are used in various fields such as polymers, pharmaceuticals, and battery materials. In addition to general physical properties like particle size and density, these powders can take various forms such as storage, flow, and agglomeration, making it necessary to evaluate their physical properties while considering the environment in which they will be used. To effectively evaluate these physical properties with high precision and convenience, a new powder accessory for HR rheometers was launched in 2022. In this instance, we will focus on "graphite for batteries" and present a case study of powder rheology analysis.

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  • Analytical Equipment and Devices
  • Measuring Instrument

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Flatness measuring device "Optical Flat"

Flatness measuring instrument that measures flatness and parallelism by light interference.

Kemet Japan's "Optical Flat" is a flatness measuring device that utilizes interference fringes. It measures flatness and parallelism through light interference. By using "Monochromatic Light" in conjunction, the interference fringes become easier to see. 【Features】 ■ A wide range of sizes available ■ Choice of accuracy *For more details, please refer to the PDF document or feel free to contact us.

  • Other abrasives
  • Measuring Instrument

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IMPROMAT gamma ray measurement device

Shutting down environmental radiation! IMPROMAT gamma radiation measurement device.

Equipped with a NaI(Tl) scintillation detector, it amplifies the weak light emitted from the scintillator using a photomultiplier tube and converts it into an electrical signal to measure radiation. It is capable of detecting radioactive contaminants that emit gamma rays with energies ranging from 50 keV to 2000 keV, with a detection limit of 0.02 Bq/g (Co-60 equivalent) or better for steel samples under normal environmental radiation levels with a measurement time of 30 seconds. The detector and sample chamber are shielded by a 70 mm thick lead box, which blocks environmental radiation (gamma rays) and allows for high-precision measurement of the sample's inherent radioactivity. Additionally, after startup, it continuously measures the background radiation, accommodating fluctuations in the operating environment. Not only manual measurements but also integration into an automated robotic circle connected to a master PC via TCP/IP communication is possible. - NaI(Tl) scintillation detector - Capable of measuring approximately 0.02 Bq/g Co60-eq - Automation is possible through connection with automated robots - Software reflecting the half-life of standard samples - Data transfer to higher systems is possible - Compatible with a wide range of samples including steel, non-ferrous metals (copper, aluminum), and food.

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  • Radiation detector
  • Measuring Instrument

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Three-dimensional measuring machine for large structures (laser tracker)

It can be used for a wide range of applications, including measuring large structures, positioning various lines (assembly, welding, painting, inspection, transportation), and measuring the operation of medical devices!

The "SpaceTrac Series" is a three-dimensional measuring machine (laser tracker) for large structures that can be utilized in a wide range of applications, including the measurement of large structures such as aircraft, positioning of various lines (assembly, welding, painting, inspection, transportation), and motion measurement of medical devices. The laser from the measuring head is directed at an SMR (reflector), and the central coordinates (X, Y, Z) are precisely calculated from the reflection path. Despite being a compact and portable type, it achieves stable and accurate measurements even for large and long workpieces. 【Features】 ■ High precision: SMR (reflector) that does not break even if dropped ■ Ultra-compact: Compact size that can be carried with one hand ■ Mobility: Achieves a wide measurement range of 640° horizontally and 138° vertically ■ Three-dimensional numerical representation: Enables trajectory measurement and operation confirmation ■ Improved operational efficiency: Allows for quick measurements of large construction machinery *For more details, please refer to the PDF materials or feel free to contact us. The catalog also includes many case studies.

  • Company:TACC
  • Price:Other
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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[Laser Tracker Case Study] Measurement of the Power Shovel Arm

Enables short-term measurements of large construction machinery, improving operational efficiency! Measurements can be taken easily and with high precision.

We would like to introduce a case study of utilizing our large structure three-dimensional measuring machine (laser tracker) from the 'SpaceTrac series' in construction machinery. The arm of a power shovel requires delicate and precise movements. With our product, it is possible to easily and accurately measure the position of the bearings at the joints that support such arm movements. Since it does not rely on fixed measuring instruments, it reduces travel time and contributes to improved operational efficiency. 【Features】 ■ High precision: SMR (reflector) that does not break even if dropped ■ Ultra-compact: Portable size that can be held in one hand ■ Mobility: Achieves a wide measurement range of 640° horizontally and 138° vertically ■ Three-dimensional numerical representation: Enables trajectory measurement and motion verification ■ Improved operational efficiency: Suitable for measuring and positioning large structures *For more details, please refer to the PDF document or feel free to contact us.

  • Company:TACC
  • Price:Other
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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[Laser Tracker Case Study] Measurement of Thermal Power Plant Casing

Demonstrating power in the measurement of steam turbine casing where high precision is required! Quick measurements are possible.

We would like to introduce a case where our three-dimensional measuring machine for large structures (Laser Tracker), the 'SpaceTrac series', is utilized in energy applications. Measuring the inner diameter of steam turbine casings requires precision to the hundredth of a millimeter to achieve maximum efficiency in power generation through pressurization. Our product is ultra-compact and can be set up in the desired position, allowing for quick measurements. It demonstrates great power not only in measuring the inner diameter of the casing but also in measuring diameter and axial distances. 【Features】 ■ High precision: SMR (reflector) that does not break even if dropped ■ Ultra-compact: Compact size that can be carried with one hand ■ Mobility: Achieves a wide measurement range of 640° horizontally and 138° vertically ■ Three-dimensional quantification: Enables trajectory measurement operation confirmation ■ Improvement in work efficiency: Suitable for measuring and positioning large structures *For more details, please refer to the PDF document or feel free to contact us.

  • Company:TACC
  • Price:Other
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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[Laser Tracker Case Study] Motion Measurement of Cutting-Edge Medical Equipment

High-precision measurement of the bed position/inclination angle is crucial for particle beam therapy!

We would like to introduce a case study of our large structure three-dimensional measuring device (laser tracker) from the 'SpaceTrac series' utilized in cutting-edge medical applications. Particle beam therapy devices require precise irradiation of the treatment zone with millimeter accuracy, necessitating the measurement and control of the bed's position and orientation with high precision down to 0.01 millimeters. By placing an SMR (reflector) on the bed and measuring the bed's position in real-time with our product, we can minimize the errors that occur during particle beam irradiation. 【Features】 ■ High precision: SMR (reflector) that does not break even if dropped ■ Ultra-compact: Portable size that can be held in one hand ■ Mobility: Achieves a wide measurement range of 640° horizontally and 138° vertically ■ Three-dimensional quantification: Enables trajectory measurement and operation verification ■ Improved operational efficiency: Suitable for measuring and positioning large structures *For more details, please refer to the PDF document or feel free to contact us.

  • Company:TACC
  • Price:Other
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Precision particle size distribution measurement device "Multisizer 4e"

Simple, accurate, and easy-to-understand measurement of particle size distribution! Strict detection of fine and coarse particles.

The "Multisizer 4e" is a precision particle size distribution measurement device that counts particles one by one to form a distribution. It detects subtle differences that cannot be measured by laser diffraction or scattering methods, as well as accurately identifies fine and coarse particles. It can measure the size and number of particles based on their exact volume. 【Features】 ■ Compliant with ISO 13319-1 ■ Measurement range: 0.2 to 1,600 micrometers ■ Electrical detection zone method = Coulter principle ■ Factors such as particle shape, color, and refractive index are not required ■ Capable of measuring low concentration samples *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Light loss measurement device

Prism Coupler Type Optical Loss Measurement Device (Achieving World’s Highest Precision of 0.01 dB/cm!)

● Up to four lasers can be simultaneously mounted, including 633nm, 830nm, 1310nm, and 1550nm. ● Low price, with a one-year manufacturer warranty. ● Holds TL-9000 and ISO-9001 certifications. ● If you send us a sample, we will conduct a demo measurement.

  • Optical Measuring Instruments
  • Microscope
  • Other optical parts
  • Measuring Instrument

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LED lamp temperature-dependent optical characteristic change measurement device

Measurement of changes in optical performance due to temperature rise of the LED lamp.

Various characteristics of LED lamps, including temperature dependence, can be measured with a single device.

  • Optical Measuring Instruments
  • Analytical Equipment and Devices
  • Microscope
  • Measuring Instrument

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Inline particle size distribution measurement device

Real-time process monitoring is possible through inline particle size measurement.

This is a groundbreaking laser diffraction dry particle size measurement device that enables inline measurement. It performs real-time dry sampling of products and semi-finished products during air transport, demonstrating advantages in collecting particle size distribution data for quality control purposes. Additionally, it can be integrated into the plant's control system, allowing not only for particle size management but also for the control of the plant itself. It is an effective system for predicting and preventing process troubles.

  • Other measurement, recording and measuring instruments
  • others
  • Measuring Instrument

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Non-contact surface resistance tester

Up to 20mm! Measurement is possible with a wide measurement gap!

This is a non-contact surface resistance measuring device that can be used both online and offline, utilizing eddy current magnetic fields from the German company NAGY. It can measure with a wide measurement gap of up to 20mm, which allows it to accommodate various applications from our customers compared to other products.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Inline non-contact film thickness measurement device

It measures the thickness of metal coils, transparent films on metal containers, opaque films, wet films, and dry films non-contactly.

- Inline compatibility (no problem with fluctuations) - Non-contact measurement of paint and coating thickness (measurable film thickness: 0.2 to 250 µm) - Capable of measuring both wet and dry films - Can reduce the cost of paint/coating materials - Improvement of production throughput

  • Coating thickness gauge
  • Weight related measuring instruments
  • Measuring Instrument

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Carbon dioxide permeability tester

We measure the carbon dioxide that permeates from the liquid filled in the bottle to the outside of the bottle.

- The measurement environment (temperature, humidity) can be set. - It can measure down to the world's smallest detection limit (0.0013 to 100 cm3·pkg-1·24h-1).

  • Other packaging equipment, materials and tools
  • Measuring Instrument

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Surface electrical resistance measuring instrument (DVS 2929 compliant product)

Measurable with a test sequence in accordance with DVS 2929 of the German Welding Society.

This is one of the resistance measuring devices from the German company Schuetz, a specialist in micro-resistance measurement for parts used in automobiles, aircraft, and power cables. It measures the surface contact electrical resistance value of the test material while the electrodes are pressed against it with a specified pressure. It is ideal for evaluating weldability and surface treatment after the etching process of aluminum and aluminum alloy materials and panels in the automotive and aerospace industries. The pressure applied to the sample by the electrodes and the resistance measurement time are variable. It is also possible to measure the surface contact resistance values of materials other than aluminum.

  • Other inspection equipment and devices
  • Measuring Instrument

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Terahertz multilayer film thickness measurement device

Instantly and non-contactly measure film thickness of up to 7 layers automatically.

The automation by robots and the simultaneous measurement of multilayer films using terahertz technology improve the efficiency of the measurement process. It enables real-time quality assessment, leading to early detection of anomalies and reduction of waste. This is a non-contact multilayer film measurement technology that utilizes terahertz waves and a unique algorithm, bringing innovation to quality control in the painting process. It can non-destructively and non-contactly measure the thickness of multiple layers of paint or coating. It achieves high precision of ±1μm and enhances measurement efficiency by integrating with automated equipment using robotic arms. It accommodates various substrates and can measure curved surfaces as well.

  • Coating thickness gauge
  • Measuring Instrument

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Digital S-Line Multi-Height MHG-60M

Accuracy equivalent to a three-dimensional measuring machine, faster and more conveniently!

1. The role of the three-dimensional measuring machine (precise dimension measurement in both vertical directions) 2. The role of the indicator (measurement of flatness and eccentricity) 3. The role of the long caliper (measurement of the outer and inner diameters of large workpieces) The digital S-line multi-height solves it all with one unit. "Constant measurement pressure & measurement in both vertical directions × combination of 14 measurement items × a wide range of optional parts available for purchase" By multiplying the three functions, it can handle various measurements with just one unit. Using the surface plate as a reference, it quickly measures the length, height, and shape of the workpiece with simple operations. It is also capable of calculating hole diameters, cylindrical diameters, and distances between centers, covering the roles of multiple measuring machines with one unit. Eliminating the three bottlenecks that occur with three-dimensional measuring machines: 1. Time bottleneck Because it does not take time to start up, measurements can be taken at the desired timing. It eliminates the "waiting for the setup of the three-dimensional measuring machine." 2. Quantity bottleneck Taking advantage of its space-saving and low-cost features, the introduction of multiple units can be considered. It eliminates the situation of "only one unit available and waiting in line." 3. User bottleneck No advanced skills are required, making it easy for anyone to use. It eliminates the situation where "only specific people can handle it."

  • Other inspection equipment and devices
  • Distance measuring device
  • 3D measuring device
  • Measuring Instrument

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Film Thickness Measurement Device "LF-1000"

Film thickness measurement device capable of measuring film thickness on wafer glass substrates and mirror substrates.

The "LF-1000" is a non-contact automatic film thickness measurement device equipped with a spectrometer and optical interference film thickness analysis software, enabling film thickness measurement by setting various parameters. This analysis software allows for non-contact automatic measurement and mapping of the thickness, refractive index, and absorption coefficient of transparent or translucent thin films by analyzing the interference waveforms from the surface of the thin film and the interface with the substrate. 【Features】 - Capable of measuring film thickness not only on wafers and glass substrates but also on other mirror-like substrates. - Various film thickness measurements can be performed by setting the optical constants of the film. - Excellent for measuring thin film oxide layers, SOI, EG films, color filters, etc. - Comes with an auto stage compatible with standard 3, 4, 5, 6, 8, and 12-inch wafers. - Loader specifications can also be accommodated as an option (consultation available for cassette/FOUP and number of ports). - Capable of measuring film thickness from thin films to thick films depending on the measurement head specifications. - GEM communication is optional. *For more details, please refer to the PDF materials or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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"Crystallization Rate Measurement Device" Clearly captures the crystallization process of resin materials.

Automatic and easy measurement of crystallization rate of resin materials / Polymer crystallization by temperature jump / Visualization with images and graphs / Compact design

The crystallization rate measurement device from Mikyo Manufacturing Co., Ltd. is designed to melt film-like resin materials and measure the rate at which they crystallize. By continuously quantifying the crystallization process through image processing, it automatically and accurately measures the crystallization rate of polymers. ◆ Polymer Crystallization via Temperature Jump ◆ A film-like sample is sandwiched between glass covers and set in a sample holder. Once the heating furnace reaches the melting temperature, the sample holder is inserted. The fully melted film automatically drops into an oil bath, achieving a temperature jump through quenching. This device realizes a temperature jump during quenching in an oil bath for the melted film under conditions that cannot be replicated by conventional thermal analysis equipment. Polarizing microscopes for measurement and reference capture the crystallization process. The screen can display a scale bar, allowing for real-time measurement of spherulite size. ◆ Key Points ◆ - Automatic measurement with just temperature and time settings - Clear visualization of dark crystallization behavior - User-friendly and compact design For more details, please refer to the catalog or contact us.

  • Testing Equipment and Devices
  • Measuring Instrument

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Wafer thickness measurement device

It is equipped with transfer functionality and thickness measurement functionality.

This is a wafer thickness measurement device equipped with transfer and thickness measurement functions. It is capable of measuring the thickness at each point within the specified wafer. It supports 6-inch and 8-inch wafers. 【Features】 ■ Equipped with transfer and thickness measurement functions ■ Supports 6-inch and 8-inch wafers ■ Capable of measuring up to 2000 points (Thickness measurement points can be set arbitrarily) ■ Equipped with real-time monitoring function for acquired data

  • Other semiconductor manufacturing equipment
  • Measuring Instrument

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Signal gauge

Signal gauge

■S-5 - With a resolution of 0.001mm, it is suitable for measuring and distinguishing precision finishing parts. - The use of bearings in the spindle moving parts ensures excellent durability. - The floating circuit design blocks other leakage currents. ■S-7 - It has a resolution of 0.01mm and is commonly used. - The pointer is designed to be shock-resistant, providing stable division signals. - The use of bearings in the spindle moving parts ensures excellent durability. - The floating circuit design blocks other leakage currents.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Constant Pressure Thickness Measuring Instruments FFG, FFA, FFD Series

Three types are available according to the purpose (FFG, FFA, FFD series).

The constant pressure thickness measuring instruments of the FFG, FFA, and FFD series are measuring devices that can perform inspections in accordance with JIS standards for various sheets, films, artificial leather, polyurethane foam, and more. We offer three types to suit different applications: the compact handheld type "FFG series," the stand type "FFA series," and the digital type "FFD series," allowing you to choose from a wide range of models. For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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