ナプソン List of Products and Services

The "PVE-80" adopts the pulse voltage excitation method as its measurement principle, making it a super low-resistance range sheet measurement system that can measure without damaging the sample. It features a space-saving design for the main body casing and a portable, removable stage. Simple measurement operations and data storage/management are achieved through a PC (with dedicated software). Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Uses a measurement method (pulse voltage excitation method) developed in collaboration with Chiba University ■ Capable of measuring without damaging the sample ■ Space-saving design for the main body casing and a portable, removable stage ■ Measurement display units can be changed according to application (sheet resistance, electrical conductivity, electrical conductivity) *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

The "SRS-2010" is a spreading resistance measurement system using a two-probe method. It is capable of determining the resistivity distribution in the depth direction of the sample, the thickness of epitaxial layers, the depth of PN junctions, and the carrier concentration distribution. Analysis can be performed on areas of a few millimeters square, down to pattern areas of several hundred micrometers. The low efficiency is calculated from the measured spreading resistance using a calibration curve. It can be customized in various ways according to customer requests. 【Features】 ■ Two-probe method ■ Capable of analyzing pattern areas ■ Calculation of resistivity *For more details, please contact us or download the catalog.

• Semiconductors and ICs
• Other measurement and measuring equipment

The "PN-8LP" is a pen-type non-contact PN detector using a photoelectric method. Since it uses laser light for non-contact measurement, it does not damage the sample. It is battery-operated (using AA batteries), making it convenient to carry. Additionally, PN detection can be performed simply by pressing a button. It can be customized in various ways according to customer requests. 【Features】 ■ Pen-type ■ Non-contact ■ Battery-operated ■ Simple operation *For more details, please contact us or download the catalog.

• Semiconductors and ICs
• Other measurement and measuring equipment

The "FLA-200" is a non-contact flatness and thickness measurement system. It measures the flatness (TTV, BOW, WARP) and thickness of wafer samples. It supports measurements of thickness, TTV, BOW, warp, site flatness, and global flatness (in accordance with ASTM standards), and data output in CSV format is also possible. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Software compatible with 2-D and 3-D mapping display ■ High-precision measurement using a 5mmφ core capacitive probe ■ High-speed measurement of 12,000 points in under 60 seconds *For more details, please contact us or download the catalog.

• Other measurement and measuring equipment
• Semiconductors and ICs

The "NC-700" is a measuring instrument that continuously measures the sheet resistance of conductive films on substrates such as PET film in-line. It can be manufactured with the required number of lines (i.e., probes), making it suitable for a wide range of applications from research and development to production lines. Due to its offset-free specification, it can perform continuous measurements for up to 24 hours without shifting measurement values. It is also compatible with existing transport devices and film deposition equipment. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ In-line type (non-contact) ■ Embedded measurement module ■ Supports a wide range of applications ■ Continuous measurement for up to 24 hours is also possible *For more details, please contact us or download the catalog.

• Semiconductors and ICs
• Other measurement and measuring equipment

"DUORES" is a handy type sheet resistance measuring device that is easy to carry and easy to use for measurements. It features two types of probes (non-destructive and contact) that can be exchanged according to the measurement target. Simply place or touch the probe, and it will automatically measure. It can be customized in various ways according to customer requests. Additionally, it is available for purchase as just the main unit with the non-destructive probe or just the main unit with the contact probe. [Features] ■ Contact type ■ Exchangeable 2 probes ■ Handy type *For more details, please contact us or download the catalog.

• Semiconductors and ICs
• Other measurement and measuring equipment

The EC-80 is a simple measuring device that allows for measurements by simply placing a sample between the probes. You can easily switch between resistivity and sheet resistance measurement modes. Additionally, measurement conditions can be easily set using the JOG dial. Since it has fixed probes, you will need to choose one type from several probe types before purchase. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Manual type ■ Single-point measurement system *For more details, please contact us or download the catalog.

• Semiconductors and ICs
• Other measurement and measuring equipment

The "RT-70V Series" is a combination measuring instrument consisting of a measurement tester (RT-70V) and a measurement stage. Due to its contact type, measurements are conducted by bringing the needle-shaped probe head into contact with the sample. The "RT-70V Tester" allows for easy operation of thickness, temperature, and PN input using a JOG dial. It can be customized in various ways according to customer requirements. 【Features】 ■ Contact type ■ Manual type ■ Single-point observation system *For more details, please contact us or download the catalog.

• Semiconductors and ICs
• Other measurement and measuring equipment

The "NC-80MAP" is a resistance measuring device that supports a wide range of measurements using multiple types of non-contact probes. The number and type of probes can be changed according to your requirements. It is also capable of multi-point measurements from an edge of 8mm. Additionally, due to its non-contact eddy current method, measurements can be taken without causing any damage. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Semi-auto type ■ Multi-point measurement system *For more details, please contact us or download the catalog.

• Semiconductors and ICs
• Other measurement and measuring equipment

The WS-8800 is a contact-type resistance measuring instrument with a fully automatic type (fully automatic measurement system). It is capable of thickness measurement, PN measurement, and temperature measurement (for silicon wafers). It can accommodate any number of cassettes. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Fully automatic ■ Self-test function, wide measurement range ■ Thickness, peripheral position, and temperature correction functions (resistivity measurement) *For more details, please contact us or download the catalog.

• Semiconductors and ICs
• Other measurement and measuring equipment

Napson Co., Ltd. is a company engaged in the research and development, manufacturing, sales, export, and import of electronic mechanical devices (semiconductor-related measurement equipment). There are contact and non-contact methods for measuring resistivity and sheet resistance, and our company is actively involved in the development, manufacturing, and sales of both methods. We offer a wide range of products, from manual to fully automatic, non-stop inline systems, and we also provide detailed customization options that are not available from competing companies. Please feel free to contact us. 【Business Activities】 ■ Research and development, manufacturing, sales, export, and import of electronic mechanical devices (semiconductor-related measurement equipment) *For more details, please contact us or download the catalog.

• Semiconductors and ICs
• Other measurement and measuring equipment

"Napson Co., Ltd. Measurement Device Comprehensive Catalog" is the product catalog of Napson Co., Ltd., a manufacturer of electrical resistance measurement devices that can propose both contact and non-contact types. It features various measurement devices tailored to different applications, including the fully automatic type "Fully Automatic Measurement System," the manual type "Single Point Measurement System," and the semi-automatic type "Multi-Point Measurement System." Currently, we are giving away the catalog for free! [Contents] - Proposals for resistance measurement devices that solve customer problems - Napson's electrical resistance measurement technology contributing to a more livable future - Features of contact and non-contact resistance measurement - Device lineup - Principles of electrical resistance measurement (Contact type: 4-probe method, Non-contact type: Eddy current method), and more For more details, please contact us or download the catalog.

• Other measurement, recording and measuring instruments

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments