Curved Surface Correspondence / Micro Defect Inspection Optical Inspection Technology OneShotBRDF
It does not miss tiny scratches and foreign objects with a depth of a few micrometers. Defect detection, which relied on visual inspection, is captured and detected in one shot using our unique scattered light detection technology!
Are there any issues with "curved and fine defect inspection" in the manufacturing site and appearance inspection process? ● Fine scratches and unevenness are not visible due to curved and 3D shapes ● Strong reflections on glossy and matte surfaces make stable inspection difficult ● Imaging from multiple directions is necessary, slowing down the inspection cycle ● The equipment configuration is complex and high-cost due to the need for curved surface compatibility ▼ Leave it to the optical inspection technology OneShotBRDF! ――― Features ―――――――――――――――――――――― ◆ Compatible with curved and 3D shapes ◆ High-speed inspection through one-shot imaging ◆ Scattered light is color-separated to visualize fine defects ――――――――――――――――――――――――――― OneShotBRDF is an optical inspection technology that utilizes Toshiba's unique scattered light analysis technology. By using a multi-wavelength coaxial aperture filter that selects the angle of light reflection, it visualizes fine scratches and unevenness in complex surface conditions such as curved, glossy, and matte surfaces in a single shot.
- Company:東芝情報システム
- Price:Other