List of Semiconductor inspection/test equipment products

Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

• Other conveying machines

Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

• Other safety and hygiene products

This is a device that detects the wafer edge using green LED light and measures the diameter by comparing it with a calibration wafer (reference wafer).

• Semiconductor inspection/test equipment

It is a manufacturer of IC programmers certified by major semiconductor manufacturers worldwide, produced by "Leap Corporation" in Taiwan.

• Semiconductor inspection/test equipment

Electromagnetic scanner type (patented) allows for damage-free and non-destructive measurements at a low cost. It has functions equivalent to expensive AFM.

• Semiconductor inspection/test equipment

It is a high-voltage power supply for TFE electron guns!

• Semiconductor inspection/test equipment
• Electron beam lithography equipment
• Other processing machines

TFE electron gun, high-voltage power supply device "FE503XP" for electron beam lithography!

• Semiconductor inspection/test equipment
• Electron beam lithography equipment
• Other processing machines

This is the high-voltage power supply unit 'IB303XS' for FIB ion guns, which also helps shorten the development period!

• Semiconductor inspection/test equipment
• Electron beam lithography equipment
• Other processing machines

This is the "IB303XP," a high-voltage power supply for FIB ion guns that also helps shorten the development period!

• Semiconductor inspection/test equipment
• Electron beam lithography equipment
• Other processing machines

This is the drive power supply 'XE303XP' exclusively for soft X-ray tubes using a thermal FE emitter!

• Semiconductor inspection/test equipment
• Electron beam lithography equipment
• Other processing machines

It is a high-precision high-voltage power supply device for TFE electron guns!

• Semiconductor inspection/test equipment
• Electron beam lithography equipment
• Other processing machines

It is the high-voltage power supply unit "FE103XP" for CD-SEM and review SEM!

• Semiconductor inspection/test equipment
• Electron beam lithography equipment
• Other processing machines

Achieving high-precision inspection! Fully compatible with appearance inspection of chip components from fine chips to special sizes.

• Semiconductor inspection/test equipment
• Inspection robot

Achieving a flatness accuracy of 0.001mm or less (for φ12 inches).

• Semiconductor inspection/test equipment
• Wafer processing/polishing equipment
• Processing Jig

It is a positioning support unit that allows for precise positioning of workpieces and other items at each stage of the manufacturing process quickly and simply.

• Conveyor
• Semiconductor inspection/test equipment
• Wafer processing/polishing equipment

SiC semiconductor evaluation device using photoluminescence (PL) imaging method

• Semiconductor inspection/test equipment

This device measures the thickness of wafers fixed to ceramic plates without contact, using optical probes/sensors.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This machine is a device for measuring the thickness of φ8” silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This machine is a device that performs macro and micro inspections of φ8-inch wafers in the semiconductor manufacturing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device for drying wafers that have been stripped and cleaned.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a semi-automatic device for visual inspection of 8-inch silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a fixture for visual inspection of the front and back surfaces of the quartz mask.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for visual inspection and thickness measurement of 8-inch silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that performs macro inspection of wafers and micro inspection using a microscope.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for surface inspection of wafers after polishing.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for visually inspecting the edges of φ300 mm silicon wafers (chip and chipping inspection).

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Pass/Fail Judgment Device

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

A device capable of performing three types of operations.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for drying 300mm wafers that have been cleaned after double-sided polishing.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for simple cleaning (brush + water) of φ300 mm silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Loading and unloading of φ150 mm and φ125 mm silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for storing φ300 mm wafers, which have completed processing, one by one into a Teflon cassette for submersion.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that loads wafers one by one.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used for handling to perform P/N determination and visual inspection of silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device for inverting and transferring silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Classified by resistivity and thickness categories.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that detects the wafer edge using laser light and measures the diameter by comparing it with a calibration wafer (reference wafer).

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that detects the edge of a wafer and measures its diameter through image processing.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that measures the thickness of sapphire wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and rearranges them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of compound semiconductor wafers in sizes φ2”, φ4” or φ6”.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of various types of wafers below φ4"

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of Si, SiC, and other wafers with a diameter of φ100mm to φ150mm.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement device for silicon wafers with a diameter of φ200mm and φ300mm.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that removes silicon wafers from a dedicated cassette and measures the thickness at the set points.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for measuring the thickness of SiC wafers adhered to a glass plate and the thickness of the adhesive, as well as measuring the thickness of individual SiC wafers.

• Other semiconductor manufacturing equipment
• Semiconductor inspection/test equipment

The very popular TME series

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Large-diameter silicon wafer measuring instrument

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that extracts silicon wafers from a dedicated cassette using edge handling and measures the thickness of a set pattern.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Measurement of Si wafer thickness, front and back surface P/N determination.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

We provide advanced specialized technology as an integrated R&D foundry.

• Semiconductor inspection/test equipment
• Analytical Equipment and Devices
• Other contract services

A kit has been developed to modify the current FOUP load port for N2 purge functionality within 8 hours. There have been 3,000 units delivered.

• Other semiconductor manufacturing equipment
• Semiconductor inspection/test equipment

We will provide excellent products and services at a fair price, putting ourselves in the customer's position.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

We will introduce products related to semiconductors and cleanroom equipment.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment
• Other clean room equipment and facilities

Comprehensive catalog of electronic component production systems, cold forging automotive parts, and coolant-related machinery.

• Resist Device
• Etching Equipment
• Semiconductor inspection/test equipment

The semiconductor curve tracer is a state-of-the-art device capable of handling a maximum peak of 3000V and a maximum peak current of 1000A.

• Semiconductor inspection/test equipment

Low-cost solution for 1500A/5kV! 'Semiconductor Curve Tracer CS-5400' compatible with the latest power devices.

• Semiconductor inspection/test equipment