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Measuring Instrument Product List and Ranking from 1165 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Apr 08, 2026～May 05, 2026
This ranking is based on the number of page views on our site.

Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Apr 08, 2026～May 05, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. null/null
  3. 大栄無線電機 Tokyo//Trading company/Wholesale
  4. 4 トリイ Aichi//others
  5. 5 シロ産業 Osaka//Industrial Electrical Equipment
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Measuring Instrument Product ranking

Last Updated： Aggregation Period:Apr 08, 2026～May 05, 2026
This ranking is based on the number of page views on our site.

  1. [OPIE'26 Exhibition] Lens Measurement: Optical 3D Surface Roughness Measurement Device
  2. MCS8A type 8-input multi-stop TDC (80 ps resolution) 大栄無線電機
  3. VR-6000 Series One-Shot 3D Shape Measuring Machine
  4. 4 全窒素・全りん/COD測定装置レンタルサービス『NP-Rent』 トリイ
  5. 5 Fully Automatic Image Dimension Measuring Instrument 'IM-X1000 Series'

Measuring Instrument Product List

2521～2550 item / All 3837 items

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Power-supplied spectroscopic measurement device LSCM

Power-supplied spectroscopic measurement device LSCM

Control signals and synchronization of the inline inspection system, measuring electrical and optical characteristics online.

LSCM synchronizes with the inspection system control signals of the LED manufacturing line, enabling the high-speed measurement and sorting of the electrical and optical characteristics of LEDs online, and providing judgment information to the system. In addition to being equipped with inspection measurement functions for electrical and optical characteristics based on power supply and application conditions to the target, it also includes a measurement preparation function that automatically executes contact and polarity judgments, as well as a pre-registration function for inspection and judgment conditions necessary for conducting inspections. The start of inspections and the output of judgment results utilize the I/O signal control line, allowing inspections to be conducted in accordance with the timing of the LED inspection system. Furthermore, by using the accompanying software library (DLL), it is also possible to control from the customer's software and receive judgment results. In the optical characteristic inspection, which is considered the most important in the LED inspection system, the adoption of a high-performance Czerny-Turner type spectroscopic method enables distortion-free spectral measurement. It becomes possible to obtain high-precision light source color information compliant with JIS (CIE), achieving an inter-device difference in xy chromaticity coordinates (JIS Z8724) of 0.004 or less for the RGB three colors.

  • Spectroscopic Analysis Equipment
  • Analytical Equipment and Devices
  • Optical Measuring Instruments
  • Measuring Instrument

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Measuring device "Total Light Flux Measurement System"

Measuring device "Total Light Flux Measurement System"

Measuring the electrical and optical characteristics of LED lighting! A high-precision measuring device with simple operation.

The full luminous flux measurement system can measure light sources with 2π and 4π luminous distribution in accordance with the measurement standards LM-78 and LM-79 set by IESNA (Illuminating Engineering Society of North America). Additionally, it features a calibration function that allows for self-absorption correction and spectral sensitivity configuration using measurement methods compliant with JISC8152. It enables high-precision measurement of total luminous flux for lighting sources such as LED lighting, LED backlights, and organic EL with simple operation. 【Features】 ○ Selection of integrating sphere sizes (from 2 inches to 3m (120 inches)) ○ Long-term stable measurements enabled by high-weather-resistance materials for the inner surface of the integrating sphere ○ Capable of measuring light sources up to 100,000lm ○ Support fixtures and sockets available for various light sources ○ Installation of standard LED-compatible holders is possible For more details, please contact us or download the catalog.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Measuring device "LSCM"

Measuring device "LSCM"

High-speed measurement of electrical and optical properties online!

The "LSCM" is a device that synchronizes with the control signals of the LED production line inspection system to rapidly measure and classify the electrical and optical characteristics of LEDs online, providing the judgment information to the system. It is capable of various optical and electrical measurements, such as luminous intensity, dominant wavelength, peak wavelength, polarity judgment, forward voltage/current, etc. The start of inspection and output of judgment results can be performed according to the timing of the LED inspection system using the I/O signal control line. Additionally, by utilizing the accompanying software library (DLL), control can be executed from the customer's software, and judgment results can be received. 【Features】 ■ Abundant measurement items ■ Achieves distortion-free spectral measurement ■ Provides judgment information to the system ■ Rapidly measures and classifies the electrical and optical characteristics of LEDs online ■ Control can be executed from the customer's software, allowing for the reception of judgment results *For more details, please refer to the catalog or feel free to contact us.

  • Light source/lighting
  • Other measurement and measuring equipment
  • LED
  • Measuring Instrument

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[Presenting measurement equipment and case study materials] We have X-ray CT three-dimensional measuring machines!

[Presenting measurement equipment and case study materials] We have X-ray CT three-dimensional measuring machines!

[Free materials comparing with conventional measurement methods] We have non-destructive three-dimensional measuring machines, high-speed CNC three-dimensional coordinate measuring machines, and more!

We would like to introduce Daibu Seiken Co., Ltd.'s "Measurement Equipment." We possess equipment capable of measuring single metal products such as aluminum and iron, as well as composite materials, including the "X-ray CT 3D Measurement Machine" and the "High-Speed CNC 3D Coordinate Measuring Machine," which achieves stable and high-precision measurements. In addition, we also have equipment such as "Surface Roughness and Shape Measuring Machines" and "Microscopes." 【Measurement Equipment Owned (Partial List)】 ■ X-ray CT 3D Measurement Machine ■ 3D Measurement Machine ■ Scanning Electron Microscope (SEM) ■ Energy Dispersive X-ray Spectroscopy (EDS) ■ 3D Optical Profiler *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Takegami Machine Design - Inspection and Measurement Equipment

Takegami Machine Design - Inspection and Measurement Equipment

We are engaged in a wide range of activities from planning to design and production.

We are working towards achieving low cost, short delivery times, and high quality.

  • others
  • Measuring Instrument

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[Example] I would like a dedicated measuring device, could you cooperate with me?

[Example] I would like a dedicated measuring device, could you cooperate with me?

Are you having trouble with product measurement? Here are some examples of custom measuring instrument production.

"We are forcibly measuring the measurement section with the current measuring instruments." "The measured item is an important product and has repeatability." This was happening within Yamagishi Manufacturing. While the measurements themselves were being taken, there was the drawback that "the measurement accuracy varied depending on the measurer." Then, prompted by a customer's feedback, the site was asked to consider a dedicated measuring instrument, leading to the implementation of this project. If you are facing similar issues, please feel free to consult with us. 【What we did】 ■ Conducted meetings with the site ■ Based on the meeting results, performed reverse engineering with the actual item and made decisions ■ Retrieved and disassembled the actual item ■ Created drawings for each part ■ Manufactured parts based on the drawings ■ Conducted accuracy checks after assembly *For more details, please refer to the related link page or feel free to contact us.

  • Other processing machines
  • Measuring Instrument

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Non-contact measuring device

Non-contact measuring device

"Pioneer of carbon jigs" - This is a case study of Akebono Seiki Kogyo's non-contact measuring device.

From the design and manufacturing of three-dimensional labor-saving devices that incorporate semiconductor components into carbon (graphite) jigs from flat tools, we respond to our customers' needs as the "unsung heroes" behind the scenes.

  • Processing Jig
  • Inspection fixture
  • Assembly Jig
  • Measuring Instrument

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MFR・MVR

MFR・MVR

Evaluation of the melt flow properties of thermoplastic resins (MFR, MVR)

Melt Mass Flow Rate (MFR) and Melt Volume Rate (MVR) are both numerical values that represent the flowability of thermoplastic resins during melting. The amount of resin extruded from a die with a specified diameter, located at the bottom of a cylinder, is measured under constant temperature and load conditions over a period of 10 minutes. The values are expressed in units of g/10min (MFR) and cm3/10min (MVR), respectively. There are two testing methods: Method A, which involves manually cutting the extrudate, and Method B, which automatically measures time (or distance). Method A is applicable to materials with an MFR of 0.1 to 25 (g/10min), while Method B is applicable to materials with an MFR of 0.1 to 50 (g/10min). Additionally, MI (Melt Index) is synonymous with MFR and was used in the polyolefin industry.

  • Other polymer materials
  • Measuring Instrument

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Disc Heat Flow Meter Method (ASTM E1530)

Disc Heat Flow Meter Method (ASTM E1530)

This is a method for measuring accurate thermal conductivity without performing absolute measurements of heat quantity, by simultaneously measuring a reference sample with known thermal conductivity.

This measurement method, also known as the steady-state comparison method, is referred to as the protective heat flow meter method in ASTM E1530. In this method, a reference sample with a known thermal conductivity is measured simultaneously, allowing for the accurate measurement of thermal conductivity without the need for absolute heat flow measurements. A heater and a reference calorimeter are in close contact to create a steady state with a temperature difference of approximately 30K between the top and bottom of the test specimen. The thermal conductivity is then determined from the temperature difference at both ends of the test specimen and the output of the reference calorimeter.

  • Contract measurement
  • Measuring Instrument

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Volume resistivity and surface resistivity of insulators

Volume resistivity and surface resistivity of insulators

Measure the electrical resistance using an insulation resistance meter between the circular electrodes, and determine the volume resistivity and surface resistivity from the electrode shape.

Double Ring Electrode Method (IEC60093, ASTM D257, JIS K6911, JIS K6271) Measurement of resistivity of insulators in the range of 10^8 to 10^16 Ω. The electrical resistance is measured using an insulation resistance meter between circular electrodes, and the volume resistivity and surface resistivity are calculated from the electrode geometry. Measurement method: Apply 500V between the electrodes and measure the resistance value after 1 minute.

  • Contract measurement
  • Measuring Instrument

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ASC IMU 7 Series Inertial Measurement Unit

ASC IMU 7 Series Inertial Measurement Unit

Main markets: automotive, railway, agriculture, civil engineering, marine

The ASC Inertial Measurement Unit (IMU) is a 6-axis system that uses a combination of gyroscopes and accelerometers to measure linear and angular motion. The ASC MEMS IMU 7.x.y incorporates precision inertial sensors, including a 3-axis accelerometer and a 3-axis gyroscope. This allows the IMU to output raw acceleration signals and rotational velocity signals, which can be integrated to obtain actual position and orientation. The ASC IMU 7.x.y is equipped with either an ASC LN series (low noise) accelerometer or an ASC MF series (medium frequency) accelerometer, with an acceleration range of ±2g to ±50g. The IMU 7.x.y features a MEMS vibrating ring gyro with a range of ±75°/s to ±900°/s. Users can configure the IMU by selecting from a wide range of acceleration and rotational velocity ranges. It is lightweight, low power consumption, and has a wide temperature range.

  • Sensors
  • Testing Equipment and Devices
  • Measuring Instrument

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Tohoku Univ. Technology : New apparatus and method for permittivity measurement : T20-3118

Tohoku Univ. Technology : New apparatus and method for permittivity measurement : T20-3118

For measuring the permittivity of samples with large leaks or nano-sized samples

Dielectric materials are used in various electronic devices. Due to the recent miniaturization of electronic devices, dielectric materials used in electronic devices tend to become smaller. Therefore, it is desirable to develop a technology that can accurately measure the permittivity of a fine capacitor structure. In addition, even in cases where the capacitor structure is not fine, it may be difficult to determine the permittivity through impedance measurement of a capacitor structure composed of a conventional electrode pair (e.g., a diameter of 100 μm or more) due to the existence of a region of locally high conductivity, called a leak path, in some dielectrics. 　As one method to enable measurement of the permittivity even for dielectrics having such a leak path, it may be considered that the electrode size is extremely small (For example, 1 μm or less) and capacitance measurement is performed while avoiding the existence of the leak path. However, when the capacitor structure becomes small, the influence of parasitic capacitance becomes relatively large, and it becomes difficult to accurately measure the capacitance of the dielectric, so that it becomes difficult to accurately measure the permittivity. The present invention is made in view of the above problems, and relates to a method for measuring the permittivity which can accurately measure the permittivity of a small region.

  • others
  • Measuring Instrument

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Tohoku University Technology: Magnetic DC/AC susceptibility measurement device: T22-278

Tohoku University Technology: Magnetic DC/AC susceptibility measurement device: T22-278

Able to measure AC susceptibility of thin film and nanoparticle Able to measure simultaneously DC & AC susceptibility

In conventional magnetic AC susceptibility measurement to measure magnetic material property, the susceptibility is detected by AC frequency. This disable to measure small amount of sample such as thin film and nanoparticle at low frequency (< 1 kHz) due to crowding of unbalanced voltage and detected voltage. Therefore, it is not possible to apply it to biomagnetic sensing.　 　DC / AC susceptibility is measured by different methods, and although measuring equipment with both measurement modes exists, simultaneous measurement is not possible. 　This invention combines magnetic AC susceptibility measurement and new analysis method based on Vibrating Sample Magnetometry (VSM), a method to measure DC susceptibility. 　This enables AC susceptibility detection in sideband frequency, improving detection sensitivity and enabling AC susceptibility measurement of small amount of sample that could not be measured so far. Moreover, simultaneous measurement of DC and AC susceptibility is also possible. Another major advantage is that it could be simply producedd by combining analysis method with conventional measurement equipment.

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  • Measuring Instrument

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Tohoku University Technology: Measurement of Magnetic Material Losses at High Frequencies: T22-265

Tohoku University Technology: Measurement of Magnetic Material Losses at High Frequencies: T22-265

High-precision loss measurement is possible over a wide frequency range from low frequency to high frequency (tens of MHz).

To miniaturize electronic components using magnetic materials, it is necessary to measure the losses of magnetic materials with low permeability accurately at high frequencies. Traditionally, in the evaluation method for loss measurement using a wound ring-shaped sample, it is necessary to reduce the number of turns of the search coil to shift the self-resonant frequency towards the high-frequency side for loss measurement at high frequencies. However, reducing the number of turns leads to an underestimation of the loss measurement values due to leakage magnetic flux from the sample. The present invention enables high-precision loss measurement from low frequencies to high frequencies without depending on the number of turns by correcting the difference between the permeability during loss measurement and the separately measured permeability. Furthermore, the addition of this invention to existing loss measurement devices is considered to have a relatively low technical hurdle.

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Tohoku University Technology: Absolute position measurement device and measurement method: T18-501

Tohoku University Technology: Absolute position measurement device and measurement method: T18-501

High resolution and high accuracy absolute position measurement using diffracted light

Optical linear encoder is used as high accuracy displacement sensor for semiconductor manufacturing equipment and various absolute position detection methods have been implemented. However, complex micro-pattern combinations and detection opticsare necessary. For this purpose, an optical single-axis encoder thatuses white light source and diffraction grating with unequal tickspacing is proposed to detect the absolute position based on the spectrum of the analyzer. However, the rotational motion error of thegrating affects the position detection. 　The present invention is able to provide an optical absolute positionmeasurement device and method with high resolution and accuracyin single or double axis by analyzing the spectrum of a diffractedbunch light. An unequal spaced grating is provided to incident thebunch white light, and the absolute position is detected from the peakwavelengths detected on the optical spectrum of the analyzer.

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Tohoku University Technology: Lymph Node Metastasis Risk Assessment Method: T13-196

Tohoku University Technology: Lymph Node Metastasis Risk Assessment Method: T13-196

It is possible to assess the risk of lymph node metastasis of cancer cells at an early stage.

The presence or absence of metastasis of cancer cells to lymph nodes significantly affects the survival rate of patients. Given the high mortality rate after metastasis, it is desirable to assess the risk of lymph node metastasis early. However, conventional methods (such as ultrasound, CT, MRI, and PET) make it difficult to identify micro-metastatic foci with a maximum short diameter of 10 mm or less, making early assessment of lymph node metastasis risk challenging. The inventors of this study found that when cancer cells metastasize to the associated lymph nodes, the pressure within the lymph nodes increases, using a lymph node swelling model in mice. By measuring the pressure within the lymph nodes, it is possible to assess the risk of lymph node metastasis early.

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Tohoku Univ. Technology : New method to assess severity risk of COVID-19 infection : T20-3125

Tohoku Univ. Technology : New method to assess severity risk of COVID-19 infection : T20-3125

Contribute to both prevention of the spread of infection and economic activities

In the COVID-19 pandemic, which has been raging since 2020, the health care crisis and economic stagnation have become major problems. We must solve these challenges and prepare for other pandemics by emerging or re-emerging infectious diseases in the future. 　 　Although neutralizing antibodies are protective against viral challenge, the adaptive T cell immune response is a major determinant of the clinical outcome after viral infection. 　In this study, the inventor aims the establishment of the technique that predicts disease severity by means of specific or cross-reactive mobilization of T cell immunity to four subtypes of human common cold coronavirus (HCoVs-229E, -OC43, -NL63, and -HKU1) and SARS-CoV-2 from convalescent COVID-19 patients and SARS-CoV-2–unexposed donors. Using ELISPOT technology, this study succeeded in developing a prediction equation for severe disease, thus establishing a prediction method (see figure). 　In addition, the data accumulated and the knowledge obtained in this study are very useful for the countermeasures against emerging and re-emerging infectious diseases of concern in the future. We believe this novel technique is able to release many people from excess behavioral restrictions or a deterioration in the economy.

  • others
  • Measuring Instrument

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Tohoku University Technology: Measurement Method for Physical Properties of Soft Thin Films: T06-028

Tohoku University Technology: Measurement Method for Physical Properties of Soft Thin Films: T06-028

Using ultrasound to measure the density of a polymer film with a thickness of several micrometers.

The present invention is a method for accurately measuring the physical properties of a single soft thin film, such as a thin polymer film with a thickness of several micrometers, by analyzing the amplitude spectrum of ultrasonic echoes and utilizing the acoustic resonance phenomenon that occurs when ultrasonic waves pass through the soft thin film. While conventional methods allowed for the measurement of the physical properties of thin films adhered to a substrate, measuring a standalone thin film was considered difficult. In this measurement method, the thin film is held by a specially structured jig and evacuated to adhere the thin film to the substrate, completely removing the air layer that would interfere during ultrasonic measurement, thereby enabling the measurement of physical properties such as acoustic impedance and density.

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Tohoku University Technology: High-frequency magnetic field measurement-device: T11-125_T12-162

Tohoku University Technology: High-frequency magnetic field measurement-device: T11-125_T12-162

High-frequency magnetic field measurement-method with sub-micron spatial resolution

The problem of electromagnetic noise entering to analog circuit from digital circuit in RFICs (Radio Frequency ICs) for portable terminals (smartphone, tablet, etc.) which are capable of ultra high speed GHz class communication, is becoming a serious subject. 　In order to measure high frequency magnetic field on IC chip,methods with "high spatial resolution" and "GHz measurement frequency" are necessary, but none of the existing high-frequency magnetic field measurement-methods (shielded loop coil type magnetic field probe, magneto-optical probe, giant magnetic resistive sensor, etc.) satisfy these requirements. 　This invention is about a high-frequency magnetic field measurement-device using a magnetic force microscope (MFM) probe, and the beating field method which uses the field undulation. Specifically, a configuration that enables the separation (removal) of electric field that interferes with magnetic field measurement, and a configuration that modifies the cantilever drive and detection component are added in this invention.

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Tohoku University Technology: Method to measure independent elastic modulus without restriction on material type, form and measurement environment　: T22-140

Tohoku University Technology: Method to measure independent elastic modulus without restriction on material type, form and measurement environment　: T22-140

Possible to measure 9 independent elastic modulus in a single vibration experiment and analysis without sample machining or surface treatment

The measurement of elastic modulus, which is a fundamental parameter, is essential to characterize the material property. As an example of object with a simple linear shape, such as a stick, the elastic modulus can be obtained experimentally by tensile testing. 　Today, a wide variety of object with complex shape can be formed due to the recent development of 3D printer technology. On the other hand, the elastic modulus of such object with complex shape having mechanical anisotropy, was difficult to simply measure by the conventional method. 　This invention is about a simple method for measuring elastic modulus of object with complex shape having mechanical anisotropy. This invention compares at first the vibration mode obtained experimentally by the object resonance frequency using ultrasonic resonance method, with the estimated vibration mode. Then, the elastic modulus is determined after the inverse analysis so that the estimated vibration mode matches the experimental value. The elastic modulus is determined with high precision by applying an algorithmic tip to this comparison. The most significant feature of this measurement method is its simplicity since it requires only one vibration experiment and analysis to measure the 9 independent elastic modulus.

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Tohoku University Technology: Non-destructive Radioactivity Measurement Device: T13-220

Tohoku University Technology: Non-destructive Radioactivity Measurement Device: T13-220

Measure the radioactivity of the test object in its original shape, easily, quickly, and with high precision.

In gamma-ray measurements using a radiation measurement device, self-absorption of gamma rays within the measured object, such as food, cannot be ignored, so it is necessary to correct for self-absorption. Therefore, the measured object is finely crushed and packed tightly into a Marinelli container for radiation measurement. However, the process of chopping and packing the measured object is complicated and labor-intensive. Additionally, because the food is crushed into small pieces, there is a challenge in distributing the food used for measurement. This invention makes it possible to provide a non-destructive radiation measurement device and method that can easily measure the specific radioactivity of the measured object, such as food, without finely destroying it. The non-destructive radiation measurement device of this invention includes a gamma-ray detection unit, a counting unit, a mass measurement unit, and a calculation unit for calculating the specific radioactivity of the measured object. This allows for easy, quick, and highly accurate radiation measurement of the measured object, such as food, without the need to chop it up.

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Tohoku Univ. Technology : Distributed curvature crystal lens and X-ray reflectance measurement device : T07-098

Tohoku Univ. Technology : Distributed curvature crystal lens and X-ray reflectance measurement device : T07-098

Distributed curvature crystal lens and X-ray reflectance measurement device

　In a conventional X-ray monochromator, the spectroscopic crystal is elastically bent slightly, then polished to obtain a uniform diffraction. However, this method where the crystal is deformed within the elastic limit, cannot be applied for a large curvature bending, so it can only be used for a big X-ray device. Moreover, there is also an issue on the deformation stability and aging due to keeping the crystal deformed.　 　This invention is able to realize a distributed curvature crystal lens with a wide incident angle and high light focusing accuracy. This distributed curvature crystal lens is made by plastic deformation of Ge or Si (110) single crystal plate pressed by a mold at high temperature. The X-ray reflectance measurement system of this invention is equipped with above lens which enables to focus a wide angle and significantly increase X-ray intensity.

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Tohoku Univ. Technology : Biophotoacoustic spectroscopy system : T21-342

Tohoku Univ. Technology : Biophotoacoustic spectroscopy system : T21-342

Noninvasive method for measuring blood sugar level without blood sampling

　Although invasive methods involving blood sampling are the mainstream methods for blood glucose measurement in diabetic patients, it is desirable to develop non-invasive methods that do not cause physical pain or risk of infection from the puncture site. As one of the non-invasive measurement methods, a method using a microphone to detect acoustic waves generated when a measurement object is irradiated with light has been proposed. However, the above method has a problem that it is easily affected by environmental sounds and water vapor generated from living organisms.　 　This invention is a method for measuring blood glucose levels by a transducer method using a piezoelectric element to detect ultrasonic waves generated when a measurement object is irradiated with mid-infrared light. The advantage of the transducer method is that it is not easily affected by environmental sounds and water vapor, which are problems in the microphone method. Furthermore, the photoacoustic cell used in the microphone method is not required, allowing for a simpler system configuration. It is expected that this invention makes it possible to measure blood glucose levels simply and non-invasively.

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Cell Measurement Device Check Master II

Cell Measurement Device Check Master II

High-performance microscope for cylinder surface cell measurement

This is a device for measuring the surface engraving and corrosion (etching) of gravure printing cylinders, as well as laser direct engraving, embossing, and other cells. It allows for both automatic and manual measurements, and with the high-precision video microscope and image processing system, area, depth, volume, diagonal, screen line count, and more can be measured easily and accurately. In particular, the automatic focus function for the bottom surface of the cell, depending on the type of cell surface and engraving/etching, demonstrates its effectiveness in precise depth measurement. Measurement conditions and procedures can be registered according to the type of cylinder being measured, such as engraved cells, etched cells, and laser-processed cells, enabling efficient continuous cylinder measurements under optimal conditions. It also features PDF output of measurement results and integration with Microsoft Excel.

  • Microscope
  • Measuring Instrument

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Surfactant measurement device (potentiometric automatic titration device)

Surfactant measurement device (potentiometric automatic titration device)

Easy measurement of surfactants using a dedicated electrode with an automatic titration device!

Surfactants (anionic, cationic, nonionic) can be easily measured using a dedicated electrode with an automatic titration device. Complicated and time-consuming pretreatment is not necessary. The concentration of various surfactants can be accurately measured in a short time using the same process as conventional titration methods. By changing the electrode, general potentiometric titrations (such as neutralization titrations or precipitation titrations) can also be performed, of course. It is also convenient for measuring cleaning solutions and wastewater in manufacturing sites.

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  • Analytical Equipment and Devices
  • Pharmaceutical and cosmetic cleaners
  • Plant-based detergent
  • Measuring Instrument

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Corrosion Measurement under Pipe Flow Conditions by Electrochemical Measurement [Technical Paper Introduction]

Corrosion Measurement under Pipe Flow Conditions by Electrochemical Measurement [Technical Paper Introduction]

Corrosion measurements simulating actual pipe conditions in the lab using electrochemical measurements with a rotating cylinder electrode (RCE).

This technical document provides deeper insights into the specificities and parameters that affect electrochemical measurements, particularly under turbulent conditions (such as when using a rotating cylinder electrode), and presents a comprehensive best practice framework for the use of this measurement method. The appendix includes an overview of the parameters with brief explanations, as well as the laws applicable to the behavior of fluids within an electrochemical cell using RCE.

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  • Piping Materials
  • Steel
  • Defect Inspection Equipment
  • Measuring Instrument

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Measurement of Adsorptive Organic Fluorine Compounds (PFAS) in Water [Technical Document]

Measurement of Adsorptive Organic Fluorine Compounds (PFAS) in Water [Technical Document]

Total parameters for non-target screening of per- and polyfluoroalkyl substances (PFAS) in water.

Most organic fluorine compounds are assumed to be the total of all adsorbable organic fluorine (AOF) compounds in water. The measurement of AOF is simpler and faster than target analytical methods, and it is more sensitive than total fluorine (TF) measurements (which include all organic and inorganic F). Measuring AOF in water samples as an initial screening process allows for the screening of the actual amounts of organic fluorine compounds present. Following this, if indicated by high AOF concentrations, it can serve as a criterion for conducting target analysis of individual PFAS.

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  • Ion Chromatography
  • Environmental Test Equipment
  • Water quality testing
  • Measuring Instrument

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Technical Data: Voltammetry (VA) - Measurement of Selenium in Drinking Water

Technical Data: Voltammetry (VA) - Measurement of Selenium in Drinking Water

Direct measurement of selenium in the low μg/L range using voltammetry and scTRACE Gold electrodes.

The difference between the toxicity of selenium and its essential level is very subtle. Therefore, the current provisional guideline value for selenium (IV) in the World Health Organization's "Guidelines for Drinking-water Quality" and the European Drinking Water Directive is set at a maximum concentration of 10 μg/L. Voltammetry techniques conducted on non-denatured scTRACE Gold electrodes can be used to measure selenium concentrations as low as 0.5 μg/L. These lower limits can be further reduced by increasing the deposition time. The linear range at a deposition time of 30 seconds ends at approximately 100 μg/L.

  • Analytical Equipment and Devices
  • Polarograph
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The Birth of the Onboard Measuring Device 'NK-2000'

The Birth of the Onboard Measuring Device 'NK-2000'

Born from repeated trial and error! A camera-based measurement system for processing machines that breaks the conventional wisdom of processed product measurement.

The first on-machine measurement device was developed under the name "S-1000." Its features were targeted towards die-sinking electrical discharge machines and wire electrical discharge machines, and it was used in our company’s operations. We attempted to sell it beyond internal use, but it did not sell as well as we had hoped, leading to many challenges. In response, we established the Planning and Development Department in 2016 to overcome the challenges of the on-machine measurement device and seek further evolution. One year after its establishment, through trial and error, the new on-machine measurement device 'NK-2000' was born. Measurement work is essential in the manufacturing process of mold components. The NK-2000, developed by our company engaged in precision mold component manufacturing, is a measurement system using a camera that breaks the conventional wisdom of measuring processed products. *For more details, please refer to the PDF materials or feel free to contact us.*

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Alumina ceramic right angle measuring instrument (ST500)

Alumina ceramic right angle measuring instrument (ST500)

It is a high-precision reference instrument that uses alumina ceramics.

● It has excellent hardness and wear resistance, allowing for long-term use. ● It has high rigidity and is resistant to changes in load, resulting in minimal aging changes and the ability to maintain high precision over a long period. ● Its low specific gravity allows for weight reduction, making it a manageable material. ● It has excellent corrosion resistance, preventing oxidation and corrosion. ● Its thermal expansion coefficient is excellent, resulting in very little deformation due to temperature changes.

  • Other inspection equipment and devices
  • Other measurement, recording and measuring instruments
  • Fine Ceramics
  • Measuring Instrument

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