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Measuring Instrument Product List and Ranking from 1165 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated: Aggregation Period:Aug 12, 2026~Sep 08, 2026
This ranking is based on the number of page views on our site.

Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Aug 12, 2026~Sep 08, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. 水戸工業 Tokyo//Industrial Machinery
  3. FOSS JAPAN Co., Ltd. Tokyo//Testing, Analysis and Measurement
  4. 4 日本電色工業 Tokyo//Testing, Analysis and Measurement
  5. 5 null/null

Measuring Instrument Product ranking

Last Updated: Aggregation Period:Aug 12, 2026~Sep 08, 2026
This ranking is based on the number of page views on our site.

  1. 液量測定機『LUMINA』、微量分注装置『I.DOTシリーズ』 水戸工業
  2. Comprehensive Catalog of Color, Reflection/Transmittance, Gloss, Haze, Turbidity, and Chromaticity Measurement Instruments 日本電色工業
  3. Raw milk bacterial count/somatic cell count measurement device "Baxomatic" FOSS JAPAN Co., Ltd.
  4. 4 Handheld Raman spectrometer "miniRaman Pro" オプトシリウス
  5. 5 [Nationwide business trip support available] Contracted 3D measurement and 3D scanning ソプラ・クリエーション

Measuring Instrument Product List

481~510 item / All 3743 items

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Laser Micrometer "SUPER-MECLAB+.X"

High flexibility! Capable of measuring various components and dimensions without gauge remastering.

"SUPER-MECLAB+.X" is a high-precision measuring instrument for ultra-high precision diameter measurement. It employs NO-VAR technology, ensuring no measurement drift due to temperature changes. Through feed measurement allows for easy and quick multi-diameter measurement. Additionally, it enables checking multiple dimensions for high flexibility in measurement, allowing users to choose from various measurement types. 【Features】 ■ Capable of measuring details that cannot normally be detected ■ Can measure various components and dimensions without remastering the gauge ■ Reduces inspection time and improves measurement performance ■ Provides objective and highly reproducible measurement results that do not depend on the operator's skill ■ Non-contact measurement that does not damage or scratch the workpiece *For more details, please refer to the PDF materials or feel free to contact us.

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  • Other measurement, recording and measuring instruments
  • Other machine elements
  • Other inspection equipment and devices
  • Measuring Instrument

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Optical Interference Measuring Instrument 'NCG'

Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

The "NCG" is a thickness measurement device using optical interference technology. It calculates and measures the thickness of layers through the interference caused by the reflection of light waves at the joint surface of the workpiece. It is designed to manage the thickness of different materials such as glass, plastic, and silicon wafers. This product can be connected to various machines, allowing for high-precision and high-speed management of component thickness, and can be used in dry or wet environments within the specified limits of the specifications, either on the machine or inside the machine. 【Features】 ■ Guarantees processing accuracy within the desired tolerance ■ Reduces cycle time ■ Control for maintaining stable production under controlled conditions ■ Compensation for mechanical variations ■ History of measurement results *For more details, please refer to the PDF document or feel free to contact us.

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  • Optical Measuring Instruments
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Dice Diameter Measurement Device "D-Lab"

Measure dice diameter easily, quickly, and with high precision. Achieve stable and high-precision measurements in just 1 second, regardless of skill level.

D-Lab is a high-performance and user-friendly die diameter measurement device. It employs a telecentric optical system, LED collimated lighting, and image analysis using a 2D CMOS sensor to measure the diameter and ovality of dies with high precision and non-contact. Equipped with a robust all-in-one PC, it provides stable and reproducible measurement results in a factory environment, independent of the operator's skill level. ■ Features Management of various types of dies: Supports measurement of different types of dies without reconfiguration. Rapid quality assessment: Instant pass/fail determination through color display by comparing with set reference values and tolerance ranges. Data management and report generation: PC storage of measurement results, output in CSV/text format, and printing of statistical reports. *For more details, please refer to the PDF document or feel free to contact us.

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  • Other processing machines
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Radiation Detector 6150ADT

Survey meter for detecting radioactive materials and contamination.

We offer different types depending on the application, such as remote probe type, compact waterproof type, and underwater measurement type.

  • Radiation detector
  • Measuring Instrument

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Radiation Detector IF104

Survey meter for detecting radioactive materials and contamination.

We offer different types depending on the application, such as remote probe type, compact waterproof type, and underwater measurement type.

  • Radiation detector
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [NC-10]

Resistance rate / Sheet resistance measuring instrument [NC-10]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [WS-3000]

Resistance rate / Sheet resistance measuring instrument [WS-3000]

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [CRESBOX]

Resistance rate / Sheet resistance measuring instrument [CRESBOX]

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Napson Co., Ltd. Business Introduction

We propose a resistance measurement device to solve your problems.

Napson Co., Ltd. is a company engaged in the research and development, manufacturing, sales, export, and import of electronic mechanical devices (semiconductor-related measurement equipment). There are contact and non-contact methods for measuring resistivity and sheet resistance, and our company is actively involved in the development, manufacturing, and sales of both methods. We offer a wide range of products, from manual to fully automatic, non-stop inline systems, and we also provide detailed customization options that are not available from competing companies. Please feel free to contact us. 【Business Activities】 ■ Research and development, manufacturing, sales, export, and import of electronic mechanical devices (semiconductor-related measurement equipment) *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment
  • Measuring Instrument

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Non-contact resistance tester "NC-700"

Embedded non-contact (eddy current method) sheet resistance measurement module (for film samples)

The "NC-700" is a measuring instrument that continuously measures the sheet resistance of conductive films on substrates such as PET film in-line. It can be manufactured with the required number of lines (i.e., probes), making it suitable for a wide range of applications from research and development to production lines. Due to its offset-free specification, it can perform continuous measurements for up to 24 hours without shifting measurement values. It is also compatible with existing transport devices and film deposition equipment. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ In-line type (non-contact) ■ Embedded measurement module ■ Supports a wide range of applications ■ Continuous measurement for up to 24 hours is also possible *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment
  • Measuring Instrument

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Measuring instrument "FLA-200"

Wafer flatness measurement system!

The "FLA-200" is a non-contact flatness and thickness measurement system. It measures the flatness (TTV, BOW, WARP) and thickness of wafer samples. It supports measurements of thickness, TTV, BOW, warp, site flatness, and global flatness (in accordance with ASTM standards), and data output in CSV format is also possible. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Software compatible with 2-D and 3-D mapping display ■ High-precision measurement using a 5mmφ core capacitive probe ■ High-speed measurement of 12,000 points in under 60 seconds *For more details, please contact us or download the catalog.

  • Other measurement and measuring equipment
  • Semiconductors and ICs
  • Measuring Instrument

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Isothermal calorimeter TAM IV

For the evaluation of reactions of various substances.

TAM offers the highest level of sensitivity, flexibility, and performance. By using a highly sensitive microcalorimeter along with various accessories, it precisely controls various experimental conditions. Up to four calorimeters can be used simultaneously, allowing for repeated experiments and a variety of experiments to be conducted. Additionally, its modular design allows for the addition of multiple calorimeters, enhancing sample processing capacity and functionality. Adding a multi-calorimeter with six mini-calorimeters significantly improves sample throughput. The TAM 4 employs patented thermostat technology, controlling the temperature of the liquid constant temperature bath with an accuracy of 0.0001±730°C. There are three operating modes: isothermal, step isothermal, and temperature scanning mode.

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  • Analytical Equipment and Devices
  • Measuring Instrument

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Product catalog available: Thermal Gravimetric Analyzer 'Discovery TGA'

With the patented balance system, pure real-time weight data acquisition is now possible!

The "TGA Series" is a thermal gravimetric measurement device that achieves optimal performance without baseline correction or other post-test manipulations. The main components of this product are equipped with the patented "Tru-Mass Balance," which demonstrates excellent performance in weight drift and sensitivity. This series includes the "TGA 5500," which can handle demanding applications, as well as the "TGA 550," which offers advanced options and flexibility in configuration, and the "TGA 55," which exhibits outstanding performance. 【Features】 ■ Extremely low drift balance design accurately detects even slight weight changes ■ Exceptional sensitivity achieved with Tru-Mass balance, regardless of sample size ■ Efficient heat conduction and airflow around the sample ■ Thermally isolated balance with low drift and high sensitivity ■ Provides accurate real-time data *The comprehensive catalog can be downloaded from this page. Individual product catalogs are available only as covers, so if you would like the complete version, please contact our sales representative.

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  • Analytical Equipment and Devices
  • Measuring Instrument

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Product catalog available: Rotational viscoelastic measurement rheometer 'ARES-G2'

Independent measurement of stress and strain is possible! Introducing the rotational viscoelastic measurement device/reometer ARES-G2, equipped with excellent features.

The "ARES-G2" is an advanced rotational viscoelastic measurement device/rheometer for research and material development. It is equipped with dedicated actuators for deformation control for independent shear stress and normal stress measurements, as well as a torque balance transducer (TRT) and a force balance transducer (FRT). It allows for measurements free from device-induced effects across a wide range of stress, strain, and frequency. 【Features】 ■ Excellent data accuracy ■ Superior strain and new stress control ■ Fully integrated high-speed data sampling ■ Isolated power supply ■ New Smart Swap environmental system

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  • Analytical Equipment and Devices
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Laser Flash Method Thermal Property Measurement Device 'DLF'

Measurable over a wide temperature range! A thermal property measurement device with excellent accuracy and precision.

The "DLF" is a laser flash method thermal property measurement device that can measure thermal diffusivity over a wide temperature range, allowing for the measurement of specific heat capacity and thermal conductivity of materials with a broad range of thermal characteristics. All systems include a multi-sample testing function that significantly improves productivity and enhances specific heat capacity measurements. With a modular structure, they offer high flexibility, allowing for the addition of other environmental modules or light source modules to adapt to changing needs. We offer a tabletop model "DLF 1200" capable of measuring samples up to 1200°C, and a standalone model "DLF 1600" capable of measuring samples up to 1600°C. 【Features】 ■ Measurement over a wide temperature range ■ High accuracy and precision ■ Easy operation ■ Generates collimated monochromatic energy pulses with pulse widths of 300μs to 400μs

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  • Analytical Equipment and Devices
  • Measuring Instrument

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Quenching Dilatometer "DIL805" for Rapid Cooling Type Thermal Expansion Rate Measurement

Achieve high-precision measurements with the "DIL805 Series," capable of advanced characteristic evaluation and optimization!

The DIL 805 is a high-precision dilatometer provided by TA Instruments, specifically designed for detailed analysis of the thermal expansion properties of materials. This device is equipped with rapid heating and cooling capabilities, allowing it to simulate the thermal treatment processes of materials. The DIL 805 is an ideal tool for accurately measuring the coefficient of thermal expansion (CTE) of materials in research and development as well as quality control. 【Features】 ■ Advanced property evaluation and optimization in metal processing ■ Provides high-precision measurements ■ Real-time measurement of dimensional changes ■ Temperature range: 20°C to 1500°C

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  • Analytical Equipment and Devices
  • Measuring Instrument

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Differential Thermal Expansion Rate Measurement Device 'DIL802/802L'

This is an introduction to the "DIL802/802L," which is skilled in dynamic temperature programs used for shrinkage rate control sintering (RCS) and measurements in low-temperature regions.

The DIL 802 is a device that achieves true differential measurement, providing the highest measurement accuracy. By measuring only the difference between the sample and the reference material, it eliminates the effects of system expansion. This design is particularly beneficial for dynamic temperature programs and measurements at low temperatures. The DIL 802 is suitable for measurements in vacuum or inert gas, while the DIL 802L is specialized for measurements in air. The horizontally arranged furnace ensures temperature uniformity and eliminates the effects of air convection. A high-sensitivity LVDT is used to accurately measure even minute thermal expansion events.

  • Analytical Equipment and Devices
  • Measuring Instrument

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Analysis case: Evaluation of the viscoelasticity of suppositories and hair wax using a rheometer.

This is an introduction to case studies of pharmaceutical analysis by a specialist in analysis. This time, we will look at the pharmacokinetics of suppositories and the viscoelastic measurement of hair wax.

The viscoelastic measurement device, the "Discovery Hybrid Rheometer," controls the surrounding environment and performs measurements over a wide range of force, strain, and strain rate. We offer three models to meet the needs for sensitivity and capability, from the high-sensitivity HR-30 to the general-purpose HR-10. This product improves various performances and specifications, achieving accurate strain, strain rate, stress control, and normal force, and is equipped with our innovative patented Smart Swap geometry and Smart Swap temperature control system. 【Main Features】 ■ Ultra-low inertia drag cup motor (patented) ■ Magnetic bearings (patented) ■ High-resolution optical encoder ■ Optical encoder dual reader (patent pending) ■ Normal force rebalance transducer (FRT)

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Analysis Case: Evaluation of Cell Metabolism and Drug Efficacy Using Isothermal Calorimeter TAM

This is an introduction to case studies related to cells by a specialist in analysis. This time, we will present measurement examples using thermal analysis equipment that is useful for evaluations involving cells.

Measurement capabilities offered by TA Instruments ☆ Thermal analysis / glass transition, crystallization, thermogravimetric analysis, curing reactions, expansion rate, thermal conductivity, shrinkage rate, effects of moisture, etc. ☆ Viscoelastic measurements (rheology, rheometers) / viscoelasticity, elastic modulus, viscosity, stress relaxation, creep, master curves, residual strain, molecular weight, molecular weight distribution, etc. ☆ Microcalorimetry / intermolecular interactions, crystallization, amorphousness, aggregation/precipitation, dispersibility, solubility, compatibility, wettability, stability, adsorption, etc. ☆ Fatigue testing / tensile strength, temperature dependence, viscoelasticity, elastic modulus, viscosity, stress relaxation, creep, master curves, residual strain, etc.

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Measurement examples of lubricants using tribology options: rheometer

This is an introduction to a case study of lubricant analysis by a specialist in analysis. This time, we will clarify the shear rate and temperature dependence of frictional behavior using a rheometer.

Measurement capabilities offered by TA Instruments ☆ Thermal analysis / glass transition, crystallization, thermogravimetric analysis, curing reactions, expansion rate, thermal conductivity, shrinkage rate, effects of moisture, etc. ☆ Viscoelastic measurements (rheology, rheometers) / viscoelasticity, elastic modulus, viscosity, stress relaxation, creep, master curves, residual strain, molecular weight, molecular weight distribution, etc. ☆ Microcalorimetry / intermolecular interactions, crystallization, amorphousness, aggregation/precipitation, dispersibility, solubility, compatibility, wettability, stability, adsorption, etc. ☆ Fatigue testing / tensile strength, temperature dependence, viscoelasticity, elastic modulus, viscosity, stress relaxation, creep, master curves, residual strain, etc.

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Flatness Measuring Device "Monochromatic Light"

A light that makes interference fringes easier to see when used in conjunction with an optical flat.

The "Monochromatic Light" is a light used in conjunction with the "Optical Flat." It uses long-lasting sodium lamps to make interference fringes more visible. 【Features】 ■ A flatness measuring device that utilizes interference fringes ■ A light that makes interference fringes more visible *For more details, please refer to the PDF document or feel free to contact us.

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Fully automatic brainwave measurement device

Measurement device for the surface area of powder samples (Brunauer-Emmett-Teller value/powder particle size).

Automatically measures the brain value, which serves as a guideline for powder particle size measurement.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Angle Comparison Measurement Device ACMS-050

Provides high-precision calibration of rotary encoders in a short time!!

This device is a measurement apparatus capable of measuring angles with high precision and ease, using rotary encoders and various angle sensors. 【Features】 - Adopts the same measurement method as specific Japanese standards. (Calibration accuracy: 0.05 seconds) - Provides rotary encoder calibration unaffected by external environmental factors without the need for a standard. - Offers reproducible angle measurements through the use of air bearings. For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
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  • Measuring Instrument

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Angle measuring device with self-correction function

Index table with self-correction function (positioning accuracy ±0.1″)

This device is a rotating table equipped with a rotary encoder that has a self-calibration function. It is capable of calculating calibration values using the time conversion method for one rotation, making it ideal for evaluating mass-produced items. It allows for positioning control with correction angles, making it optimal for high-precision angle measurements. ○ Calibration accuracy ±0.1″ ○ Positioning accuracy ±0.1″ For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Measuring Instrument

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