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Measuring Instrument Product List and Ranking from 1166 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Aug 12, 2026～Sep 08, 2026
This ranking is based on the number of page views on our site.

Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Aug 12, 2026～Sep 08, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. 水戸工業 Tokyo//Industrial Machinery
  3. FOSS JAPAN Co., Ltd. Tokyo//Testing, Analysis and Measurement
  4. 4 日本電色工業 Tokyo//Testing, Analysis and Measurement
  5. 5 null/null
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Measuring Instrument Product ranking

Last Updated： Aggregation Period:Aug 12, 2026～Sep 08, 2026
This ranking is based on the number of page views on our site.

  1. 液量測定機『LUMINA』、微量分注装置『I.DOTシリーズ』 水戸工業
  2. Comprehensive Catalog of Color, Reflection/Transmittance, Gloss, Haze, Turbidity, and Chromaticity Measurement Instruments 日本電色工業
  3. Raw milk bacterial count/somatic cell count measurement device "Baxomatic" FOSS JAPAN Co., Ltd.
  4. 4 Handheld Raman spectrometer "miniRaman Pro" オプトシリウス
  5. 5 [Nationwide business trip support available] Contracted 3D measurement and 3D scanning ソプラ・クリエーション

Measuring Instrument Product List

751～780 item / All 3744 items

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EMC Tester SESD 30 T 1000 <Option>

EMC Tester SESD 30 T 1000 <Option>

Introduction of EMC-related products (options)! Support arm with balancer.

We would like to introduce the "SESD 30 T 1000" that we handle. EMC-related products (optional) from Schloeder GmbH. The type is a support arm with a balancer. Detailed information is available in the catalog, so please refer to the downloadable materials. 【Specifications】 ■ Type: Support arm with balancer * You can download the English version of the catalog. * For more details, please feel free to contact us.

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EMC Tester CWG 520 <Option>

EMC Tester CWG 520 <Option>

The applicable standards are IEC/EN 61000-4-4, IEC/EN 61000-4-5! Three-phase coupling network.

We would like to introduce the 'CWG 520' from Schloeder GmbH that we handle. The type is a three-phase coupling network, and the applicable standards are IEC/EN 61000-4-4 and IEC/EN 61000-4-5. Please refer to the downloadable materials for more details. 【Specifications (partial)】 ■ Type: Three-phase coupling network ■ Applicable standards: IEC/EN 61000-4-4, IEC/EN 61000-4-5 * You can download the English version of the catalog. * For more information, please feel free to contact us.

  • Other network tools
  • Measuring Instrument

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EMC Tester SFT 415 <Option>

EMC Tester SFT 415 <Option>

The type is capacitive coupling clamp! Introduction of EMC-related products.

We would like to introduce the "SFT 415" from Schloeder GmbH that we handle. The type is a capacitive coupling clamp. The applicable standard is IEC/EN 61000-4-4. You can find more details about the product in the catalog. 【Specifications】 ■Type: Capacitive coupling clamp ■Applicable standard: IEC/EN 61000-4-4 *You can download the English version of the catalog. *For more information, please feel free to contact us.

  • Vice Clamps
  • Measuring Instrument

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EMC Tester SFT 430 <Option>

EMC Tester SFT 430 <Option>

The applicable standard is IEC/EN 61000-4-4! Here is an introduction to high voltage cables.

We would like to introduce the 'SFT 430' from Schloeder GmbH that we handle. The applicable standard is IEC/EN 61000-4-4, and the type is high voltage cable. For more details about the product, please refer to the downloadable materials. 【Specifications】 ■Type: High voltage cable ■Applicable standard: IEC/EN 61000-4-4 *You can download the English version of the catalog. *For more information, please feel free to contact us.

  • cable
  • Measuring Instrument

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EMC Measuring Instrument ST 450-Set <Option>

EMC Measuring Instrument ST 450-Set <Option>

Necessary for independent verification of burst impulse! Corresponding standard is IEC/EN 61000-4-4.

We would like to introduce the 'ST 450-Set' from Schloeder GmbH that we handle. The type is an attenuator, and it complies with the IEC/EN 61000-4-4 standard. It is necessary for independent verification of burst impulses using a 50+1000Ω attenuator, generator, or coupling clamp (SFT415). Please refer to the downloadable materials for more details. 【Specifications】 ■ Type: Attenuator ■ Compliance Standard: IEC/EN 61000-4-4 * You can download the English version of the catalog. * For more information, please feel free to contact us.

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EMC Tester SFT 470 <Option>

EMC Tester SFT 470 <Option>

Magnetic field probe set! The applicable standard is IEC/EN 61000-4-4.

We would like to introduce the 'SFT 470' from Schloeder GmbH that we handle. This product is a magnetic field probe set, and it complies with the IEC/EN 61000-4-4 standard. For more details, please refer to the downloadable materials. 【Specifications】 ■ Type: Magnetic Field Probe Set ■ Compliance Standard: IEC/EN 61000-4-4 * You can download the English version of the catalog. * For more information, please feel free to contact us.

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EMC Measuring Device EMV-SOFT <Option>

EMC Measuring Device EMV-SOFT <Option>

Options for EMC-related products! Introducing Schloeder software for EMC devices.

We would like to introduce "EMV-SOFT," which we handle. Schloeder GmbH's EMC-related products (optional). This is software for Schloeder EMC devices. You can find detailed information about the product in the catalog. 【Specifications】 ■ Type: Software for Schloeder EMC devices * You can download the English version of the catalog. * For more details, please feel free to contact us.

  • Software (middle, driver, security, etc.)
  • Measuring Instrument

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Automated Measurement Software Business

Automated Measurement Software Business

It is possible to display and output as 3D data! We have extensive experience in connecting production lines with PC applications!

In the "Automated Measurement Software Business," we develop software that supports the measurement of various parts and products using non-contact machines. We perform automated measurements from multiple angles with three-dimensional sensors, and the results can be displayed and output as three-dimensional data. So far, we have a track record of developing software that enables the measurement of errors such as part distortion and coordinate measurement, and we have extensive experience in connecting production lines (NC, robots, various measuring instruments) with PC applications. 【Features】 ■ Supports measurement of various parts and products using non-contact machines ■ Performs automated measurements from multiple angles and displays/outputs as three-dimensional data ■ Proven track record in software development for measuring distortion errors and coordinate measurements ■ Connection of measuring instruments to PCs and control of devices via PC ■ PLC NC data collection *For more details, please refer to the related links or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Software (middle, driver, security, etc.)
  • Measuring Instrument

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High-precision measuring instrument "Logitool LGT Series"

High-precision measuring instrument "Logitool LGT Series"

[Demo unit available for loan] Achieving high precision at a low price! A measuring instrument that allows easy data editing on a computer.

The "LogiTool LGT Series" is a high-precision measuring instrument that connects to a computer, allowing for easy display, acquisition, and storage of measurement data. It is battery-operated, enabling the storage of measurement data and easy editing on a computer. With its compact design, it takes up little space on a desk and can be conveniently used near a PC. 【Features】 ■ A measuring instrument specialized in one function for display and operation connected to a PC ■ Achieves high precision at a low price ■ PC-connected unit ■ Compact design ■ Operable with free control software (available for download from the website) *For more details, please refer to the catalog or feel free to contact us.

  • Voltage Meter
  • Ammeter
  • Measuring Instrument

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[Production Example] Product Hardness Measuring Machine

[Production Example] Product Hardness Measuring Machine

Good manufacturing starts with a commitment to machinery! We provide fully customized production equipment.

We would like to introduce the production of our "Product Hardness Measurement Machine," which measures the thickness/hardness of products. Our strength lies in accurately hearing our clients' requests and proposing machines tailored to their usability. Additionally, we will continue to contribute to society by maintaining our high technical skills and rich accumulation of know-how. Please feel free to contact us when you need our services. 【Product Details】 ■ Measures the thickness/hardness of products *For more details, please download the PDF or feel free to contact us.

  • Hardness Tester
  • Measuring Instrument

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[Information] Basics of Vibration Control

[Information] Basics of Vibration Control

Attention those troubled by vibrations in machinery, equipment, and devices! Understand the steps for vibration countermeasures with "three visualizations."

This document introduces the procedures and basics of vibration countermeasures. It includes visualizations such as "visualizing disturbance vibrations numerically and clarifying acceptable vibration standards," "visualizing the effectiveness of countermeasure products for reliable product selection," and "visualizing the effects of countermeasures." Additionally, it provides information on services that support visualization and offers simple explanations of complex vibration elements. 【Contents (partial)】 ■ Visualization 01 / Visualizing disturbance vibrations numerically and clarifying acceptable vibration standards ■ Visualization 02 / Visualizing the effectiveness of countermeasure products for reliable product selection ■ Visualization 03 / Visualizing the effects of countermeasures ■ Self-vibration measurement service / Rental of vibration measurement equipment and provision of analysis reports ■ Engineer dispatch measurement / On-site measurement and analysis report support through engineer dispatch *For more details, please download the PDF or feel free to contact us.

  • others
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Love Concept Nano

Love Concept Nano

A measuring instrument that has reached the pinnacle of precision.

The Love Concept Nano is the latest standard in the field of dimensional measurement. This device is the culmination of 40 years of measurement technology and continuous improvement, making it ideal for all measurements that require ultra-high precision. Due to the uncompromising design of the Love Concept Nano, this device can be used as a reference instrument for the inspection and calibration of all gauges and measuring devices. With motor-driven XYZ axes, it can also perform automatic measurements of inner and outer diameters. Furthermore, the user-friendly Win DHI software makes measurements smoother for anyone. The Love Concept Nano is designed and manufactured based on Swiss quality, renowned for its high precision in industries such as watchmaking. The Swiss traditions of robustness, reliability, and longevity are our pride.

  • Other machine elements
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Inner Diameter Automatic Measuring Machine

Inner Diameter Automatic Measuring Machine

Strong support for automation and labor-saving.

This single machine automatically inspects from workpiece sending out to inner diameter measurement to workpiece removal.

  • Other machine elements
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Portable Gap and Step Measuring Device 'GAPGUN 6'

Portable Gap and Step Measuring Device 'GAPGUN 6'

An alternative to calipers, step gauges, and radius gauges! This system eliminates variability caused by individuals and enables quality control.

Wouldn't you like to improve dimension measurements for assembly inspections and the like, making them simpler and faster? "Inspection labor is inevitably required." "There is variability in inspection results depending on the person." "Input errors occur when creating reports." "There are times when there are too many inspection items, making it unclear whether the work has been done." The 'GAPGUN' is a portable gap and step measurement device that uses lasers to measure the two-dimensional cross-section of inspection points without contact. It combines measurement speed, ease of use, portability, and robustness, allowing for high-precision measurements of steps, gaps, arcs, edge chipping, holes, sealing areas, angles, and more. Additionally, it navigates the user according to a pre-set inspection plan for the measurement points, and the measurement results are transferred to a PC to generate inspection result reports. 【Features】 ■ Non-contact gap, step, and R measurement tool ■ Fast non-contact measurement ■ Rich measurement functions accommodating various shapes ■ Consistent measurement accuracy ■ User-friendly navigation system ☆ Click the link below if you would like to see the list of features!

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  • Other inspection equipment and devices
  • Measuring Instrument

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Right angle measuring instrument Right angle measuring instrument

Right angle measuring instrument Right angle measuring instrument

Original products from Kurita Techno!! We handle everything from design to development in-house.

This is an announcement from Kurita Techno regarding the "Right Angle Measuring Instrument."

  • Distance measuring device
  • Measuring Instrument

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Control valve, NDX digital smart positioner for control valves

Control valve, NDX digital smart positioner for control valves

[TIIS Explosion-Proof Certification Product] Easy installation structure, automatic calibration, and large capacity spool for low air consumption. Vibration-resistant, non-contact structure smart positioner.

At Valmet, we offer a wide range of products including rotary valves (ball/butterfly), globe valves, and smart digital products. <Features> - Compact design - No feedback lever linkage required - Front cover for malfunction prevention - Easy installation structure - Auto calibration - Front-mounted operation panel - Non-contact structure to avoid wear and misalignment of levers - Low air consumption due to large capacity spool Spool capacity 80Nm3/h, air consumption 0.1Nm3/h <Track Record> World sales volume of NDX in 2016 & 2017 Approximately 5,000 – 6,000 units in 2016 Approximately 3,000 units in 2017 Sales volume of the current model ND9000 Approximately 50,000 units in 2016, approximately 25,000 units in 2017 <Applications> Petrochemical (refinery) Pulp and paper (approximately 80%) Mining / Pharma / Food & Beauty / Offshore projects, etc. *For more details, please download the catalog or contact us.

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  • Other process controls
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Optical 3D Measuring Instrument "OPS-1000"

Optical 3D Measuring Instrument "OPS-1000"

An ultra-sensitive model with over 100 times the minimum light reception sensitivity compared to conventional methods!

The "OPS-1000" is an optical three-dimensional measuring device that applies the technology of high-speed wavelength-variable lasers to interferometric measurement. With high-speed measurement of up to 100,000 points per second, it enables complete automated inspection in the manufacturing process. Coaxial measurement allows for easy measurement of complex shapes. It achieves a minimum light reception sensitivity of 100 dB and a dynamic range of 70 dB. It offers world-class performance among three-dimensional measuring devices. 【Features】 ■ Ultra-high sensitivity - Minimum light reception sensitivity of 100 dB and a dynamic range of 70 dB ■ High-speed measurement - Enables complete automated inspection in the manufacturing process with high-speed measurement of up to 100,000 points per second ■ Coaxial measurement - Allows for easy measurement of complex shapes through coaxial measurement *For more details, please download the PDF or feel free to contact us.

  • 3D measuring device
  • Measuring Instrument

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[Data] Shirutoku Report No. 63 # The Ideal and Reality of Circuit Diagrams (2)

[Data] Shirutoku Report No. 63 # The Ideal and Reality of Circuit Diagrams (2)

Even parasitic impedance not shown in the circuit diagram can be detected by a professional!

★★Shirutoku Report: Useful Information You Can Benefit From★★ In this report, we will introduce an important invisible element, "impedance," in addition to parasitic components that are not visible on circuit diagrams. Impedance refers to AC resistance and is often specified as 50Ω for single-ended and 100Ω for differential. In high-frequency circuit design, impedance becomes a critical issue. Even parasitic impedance that is not shown in the circuit diagram can be discerned by professionals. If you are interested, please feel free to contact us. 【Contents】 ■ An example of a circuit diagram created with LT-spice *For more details, please refer to the PDF document or feel free to contact us.

  • Other semiconductors
  • connector
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X-ray Reflectivity Method

X-ray Reflectivity Method

XRR：X-ray Reflectivity

XRR measures the reflection intensity of X-rays incident on the sample surface at a very shallow angle. By comparing the reflection X-ray intensity profile obtained from this measurement with simulation results and optimizing the simulation parameters, this method determines the film thickness and density of the sample. - Evaluation of film thickness is possible (approximately 2 to 300 nm) - Evaluation of density is possible - Evaluation of surface roughness is possible (Rms ≤ 5 nm) - Non-destructive analysis is possible - Average information over a wide area of approximately 10×20 mm can be obtained

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  • Contract Analysis
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[EBIC] Electron Beam Induced Current

[EBIC] Electron Beam Induced Current

A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).

By irradiating an electron beam within a SEM device, electron-hole pairs are generated in the sample. Normally, these pairs recombine and disappear, but if they are generated in regions with an internal electric field, such as a depletion layer, the carriers can be drifted by the internal electric field and extracted as a current. This current is referred to as EBIC (Electron Beam Induced Current), and by obtaining it alongside the SEM image, it is possible to visualize the position of the pn junction and the extent of the depletion layer. - Evaluation of pn junctions and crystal defects (dislocations, stacking faults, etc.) is possible. - By overlaying with the SEM image, the positions of the junctions and crystal defects can be identified.

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Regarding the depth conversion of SRA

Regarding the depth conversion of SRA

SRA: Spread Resistance Measurement Method

SR measurement involves diagonally polishing the sample and moving two probes in contact with the sample surface while measuring the electrical resistance directly beneath. The depth from the sample surface at a certain measurement point is determined by the product of the value of Sinθ (bevel angle) when the angle of diagonal polishing of the sample is θ and the distance from the bevel edge to that measurement point. The distance from the bevel edge is calculated as [X-step] × [number of measurement points].

  • Contract Analysis
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[Analysis Case] Evaluation of Hydrogen Concentration in Hydrogen Water

[Analysis Case] Evaluation of Hydrogen Concentration in Hydrogen Water

It is possible to measure the hydrogen concentration in solutions such as hydrogen water.

Hydrogen water is said to be able to remove active oxygen in the body, and attention is being drawn to its antioxidant effects. However, the amount of hydrogen that dissolves in water is minimal, and when left in the air, hydrogen gradually escapes. Additionally, because hydrogen is a very small molecule, it is known that some storage containers cannot maintain it for long periods. Therefore, the choice of storage container and method is considered important. This case presents the results of a GC (TCD) analysis showing how much hydrogen has escaped from hydrogen water transferred to a paper cup compared to a pouch-type storage container.

  • Contract Analysis
  • Measuring Instrument

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[Analysis Case] Evaluation of Silicon Oxide Film by XAFS

[Analysis Case] Evaluation of Silicon Oxide Film by XAFS

Local structural analysis around silicon, quantification of intermediate oxides, evaluation of bulk and interfaces.

Silicon oxide films are widely used as gate dielectrics in MOS devices and as anode materials in lithium-ion secondary batteries, but it is known that the presence of intermediate oxides and the bonding states at the interface have a significant impact on device characteristics. XAFS measurements using synchrotron radiation can detect information from a depth of several tens of nanometers from the sample surface, allowing for non-destructive analysis of the structure and bonding states in both bulk and at the interface. This document presents a case study investigating the presence of intermediate oxides in silicon oxide films using XAFS.

  • Contract Analysis
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[Analysis Case] Evaluation of the Chemical State of RuO2 Catalyst using in-situ XAFS

[Analysis Case] Evaluation of the Chemical State of RuO2 Catalyst using in-situ XAFS

Measurement is possible under the specified gas atmosphere and temperature conditions.

In-situ XAFS allows for the evaluation of the chemical bonding state and local atomic structure of a sample under controlled conditions, focusing on the gas atmosphere and temperature surrounding the sample. Therefore, it is suitable for cases where state evaluation in special environments, such as catalysts, is necessary. This document presents a case where RuO2 powder was heated from room temperature to 400°C under a reducing atmosphere using in-situ XAFS, capturing the changes in the state of RuO2. From the shape of the spectrum, it was confirmed that RuO2 is reduced to Ru between 100°C and 200°C.

  • Contract Analysis
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Absolute PL quantum yield measurement

Absolute PL quantum yield measurement

Absolute PL quantum yield measurement is a method for determining the photoluminescence efficiency of materials.

Absolute PL quantum yield measurement is a method to determine the luminescence efficiency of a material, specifically how efficiently light (energy) absorbed by the material is converted into emitted light. - Since an excitation light source with a spectrometer is used, excitation at various wavelengths (approximately 350 to 800 nm) is possible. ■ Features of MST - The equipment is managed under controlled atmospheric conditions, allowing measurements of thin film samples without the influence of oxygen.

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[Analysis Case] Evaluation of Carrier Lifetime through Photoluminescence Lifetime Measurement

[Analysis Case] Evaluation of Carrier Lifetime through Photoluminescence Lifetime Measurement

Insights into the carrier lifetime of SiC can be obtained from the luminous lifetime.

Carrier lifetime refers to the time it takes for minority carriers among the excess carriers generated during the operation of electronic devices to decay to 1/e. Proper control of this is important for managing the electrical characteristics of the device. On the other hand, luminescence lifetime indicates the time until the luminescence intensity from the sample reaches 1/e, and it can be calculated from the luminescence decay curve. Since some minority carriers emit light during recombination, it is possible to indirectly evaluate the carrier lifetime from luminescence lifetime measurements. This document presents a case study on the evaluation of carrier lifetime for 4H-SiC epitaxial substrates. Measurement method: Fluorescence lifetime measurement Product fields: Power devices, LSI/memory, electronic components Analysis purposes: Failure analysis, defect analysis, product investigation, carrier lifetime, process evaluation For more details, please download the document or contact us.

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Identification of resistance anomalies due to absorption current

Identification of resistance anomalies due to absorption current

You can identify high resistance and open areas in the wiring from the absorption current image.

- Possible to identify high resistance abnormal areas - The current flowing through the wiring is weak (pA) - Measurement is possible even with a surface protective film present - Measurement is possible even with multilayered wiring - Measurement is possible under conditions almost identical to SEM observation

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