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Measuring Instrument Product List and Ranking from 1154 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jan 28, 2026～Feb 24, 2026
This ranking is based on the number of page views on our site.

Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jan 28, 2026～Feb 24, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. システムクリエイト Osaka//Industrial Machinery
  3. null/null
  4. 4 フォス･ジャパン Tokyo//Testing, Analysis and Measurement
  5. 5 日東精工アナリテック Kanagawa//Industrial Machinery
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Measuring Instrument Product ranking

Last Updated： Aggregation Period:Jan 28, 2026～Feb 24, 2026
This ranking is based on the number of page views on our site.

  1. VR-6000 Series One-Shot 3D Shape Measuring Machine
  2. Fully Automatic Image Dimension Measuring Instrument 'IM-X1000 Series'
  3. 3D scanner type three-dimensional measuring instrument "VL-800 series"
  4. 4 I tried measuring the gauge with a tabletop measuring device! システムクリエイト
  5. 5 Mitarepo: An amateur tried 3D measurement! Fulcrum システムクリエイト

Measuring Instrument Product List

751～780 item / All 3782 items

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[Demo unit available for loan] Dot measurement device 'AccuDot'

[Demo unit available for loan] Dot measurement device 'AccuDot'

Demo units available for loan! Reliable results with high performance and operability!

The "AccuDot" is a handheld dot measurement device. It is equipped with a large color LCD. The actual image of the measurement area is displayed on the device, allowing you to check not only the dots on the plate but also the enlarged images of the dots on printed materials. Additionally, it supports operation with either hand through mode switching. Language selection is also available. Furthermore, this product is available in two types, "Basic" and "Advanced," tailored to your usage and applications. Upgrades after purchase are also possible. 【Features】 ■ Handheld type ■ Color graphic LCD ■ Interactive assist function included ■ Easy updates ■ Model selection available *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices
  • Measuring Instrument

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EMC Measurement Device SESD 270 <Option>

EMC Measurement Device SESD 270 <Option>

The type is horizontal coupling plane ground plane!

We would like to introduce the 'SESD 270' from Schloeder GmbH that we handle. The type is a horizontal coupling plane and ground plane, and it complies with the standards IEC/EN 61000-4-2, -4-4, -4-5, -4-6, and ISO 10605. Please refer to the downloadable materials for more details. 【Specifications】 ■ Type: Horizontal coupling plane and ground plane ■ Compliant standards: IEC/EN 61000-4-2, -4-4, -4-5, -4-6, ISO 10605 * You can download the English version of the catalog. * For more information, please feel free to contact us.

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EMC Tester SESD 280/281 <Option>

EMC Tester SESD 280/281 <Option>

The type is silicone sheet! The applicable standards are IEC/EN 61000-4-2, ISO 10605.

We would like to introduce the 'SESD 280/281' from Schloeder GmbH that we handle. The type is a silicone sheet, and it complies with the standards IEC/EN 61000-4-2 and ISO 10605. Detailed information is available in the catalog, so please refer to the downloadable materials. 【Specifications】 ■ Type: Silicone sheet ■ Compliant standards: IEC/EN 61000-4-2, ISO 10605 * An English version of the catalog is available for download. * For more details, please feel free to contact us.

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EMC Tester SESD 3036 <Option>

EMC Tester SESD 3036 <Option>

ESD simulator hanging hook! Introduction of EMC-related products.

We would like to introduce the "SESD 3036" that we handle. It is an EMC-related product (optional) from Schloeder GmbH, and the type is a hook for hanging ESD simulators. Please refer to the downloadable materials for more details. 【Specifications】 ■ Type: Hook for hanging ESD simulators * You can download the English version of the catalog. * For more information, please feel free to contact us.

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EMC Tester SESD 30 T 1000 <Option>

EMC Tester SESD 30 T 1000 <Option>

Introduction of EMC-related products (options)! Support arm with balancer.

We would like to introduce the "SESD 30 T 1000" that we handle. EMC-related products (optional) from Schloeder GmbH. The type is a support arm with a balancer. Detailed information is available in the catalog, so please refer to the downloadable materials. 【Specifications】 ■ Type: Support arm with balancer * You can download the English version of the catalog. * For more details, please feel free to contact us.

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EMC Tester CWG 520 <Option>

EMC Tester CWG 520 <Option>

The applicable standards are IEC/EN 61000-4-4, IEC/EN 61000-4-5! Three-phase coupling network.

We would like to introduce the 'CWG 520' from Schloeder GmbH that we handle. The type is a three-phase coupling network, and the applicable standards are IEC/EN 61000-4-4 and IEC/EN 61000-4-5. Please refer to the downloadable materials for more details. 【Specifications (partial)】 ■ Type: Three-phase coupling network ■ Applicable standards: IEC/EN 61000-4-4, IEC/EN 61000-4-5 * You can download the English version of the catalog. * For more information, please feel free to contact us.

  • Other network tools
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EMC Tester SFT 415 <Option>

EMC Tester SFT 415 <Option>

The type is capacitive coupling clamp! Introduction of EMC-related products.

We would like to introduce the "SFT 415" from Schloeder GmbH that we handle. The type is a capacitive coupling clamp. The applicable standard is IEC/EN 61000-4-4. You can find more details about the product in the catalog. 【Specifications】 ■Type: Capacitive coupling clamp ■Applicable standard: IEC/EN 61000-4-4 *You can download the English version of the catalog. *For more information, please feel free to contact us.

  • Vice Clamps
  • Measuring Instrument

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EMC Tester SFT 430 <Option>

EMC Tester SFT 430 <Option>

The applicable standard is IEC/EN 61000-4-4! Here is an introduction to high voltage cables.

We would like to introduce the 'SFT 430' from Schloeder GmbH that we handle. The applicable standard is IEC/EN 61000-4-4, and the type is high voltage cable. For more details about the product, please refer to the downloadable materials. 【Specifications】 ■Type: High voltage cable ■Applicable standard: IEC/EN 61000-4-4 *You can download the English version of the catalog. *For more information, please feel free to contact us.

  • cable
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EMC Measuring Instrument ST 450-Set <Option>

EMC Measuring Instrument ST 450-Set <Option>

Necessary for independent verification of burst impulse! Corresponding standard is IEC/EN 61000-4-4.

We would like to introduce the 'ST 450-Set' from Schloeder GmbH that we handle. The type is an attenuator, and it complies with the IEC/EN 61000-4-4 standard. It is necessary for independent verification of burst impulses using a 50+1000Ω attenuator, generator, or coupling clamp (SFT415). Please refer to the downloadable materials for more details. 【Specifications】 ■ Type: Attenuator ■ Compliance Standard: IEC/EN 61000-4-4 * You can download the English version of the catalog. * For more information, please feel free to contact us.

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EMC Tester SFT 470 <Option>

EMC Tester SFT 470 <Option>

Magnetic field probe set! The applicable standard is IEC/EN 61000-4-4.

We would like to introduce the 'SFT 470' from Schloeder GmbH that we handle. This product is a magnetic field probe set, and it complies with the IEC/EN 61000-4-4 standard. For more details, please refer to the downloadable materials. 【Specifications】 ■ Type: Magnetic Field Probe Set ■ Compliance Standard: IEC/EN 61000-4-4 * You can download the English version of the catalog. * For more information, please feel free to contact us.

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EMC Measuring Device EMV-SOFT <Option>

EMC Measuring Device EMV-SOFT <Option>

Options for EMC-related products! Introducing Schloeder software for EMC devices.

We would like to introduce "EMV-SOFT," which we handle. Schloeder GmbH's EMC-related products (optional). This is software for Schloeder EMC devices. You can find detailed information about the product in the catalog. 【Specifications】 ■ Type: Software for Schloeder EMC devices * You can download the English version of the catalog. * For more details, please feel free to contact us.

  • Software (middle, driver, security, etc.)
  • Measuring Instrument

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Automated Measurement Software Business

Automated Measurement Software Business

It is possible to display and output as 3D data! We have extensive experience in connecting production lines with PC applications!

In the "Automated Measurement Software Business," we develop software that supports the measurement of various parts and products using non-contact machines. We perform automated measurements from multiple angles with three-dimensional sensors, and the results can be displayed and output as three-dimensional data. So far, we have a track record of developing software that enables the measurement of errors such as part distortion and coordinate measurement, and we have extensive experience in connecting production lines (NC, robots, various measuring instruments) with PC applications. 【Features】 ■ Supports measurement of various parts and products using non-contact machines ■ Performs automated measurements from multiple angles and displays/outputs as three-dimensional data ■ Proven track record in software development for measuring distortion errors and coordinate measurements ■ Connection of measuring instruments to PCs and control of devices via PC ■ PLC NC data collection *For more details, please refer to the related links or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Software (middle, driver, security, etc.)
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High-precision measuring instrument "Logitool LGT Series"

High-precision measuring instrument "Logitool LGT Series"

[Demo unit available for loan] Achieving high precision at a low price! A measuring instrument that allows easy data editing on a computer.

The "LogiTool LGT Series" is a high-precision measuring instrument that connects to a computer, allowing for easy display, acquisition, and storage of measurement data. It is battery-operated, enabling the storage of measurement data and easy editing on a computer. With its compact design, it takes up little space on a desk and can be conveniently used near a PC. 【Features】 ■ A measuring instrument specialized in one function for display and operation connected to a PC ■ Achieves high precision at a low price ■ PC-connected unit ■ Compact design ■ Operable with free control software (available for download from the website) *For more details, please refer to the catalog or feel free to contact us.

  • Voltage Meter
  • Ammeter
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[Production Example] Product Hardness Measuring Machine

[Production Example] Product Hardness Measuring Machine

Good manufacturing starts with a commitment to machinery! We provide fully customized production equipment.

We would like to introduce the production of our "Product Hardness Measurement Machine," which measures the thickness/hardness of products. Our strength lies in accurately hearing our clients' requests and proposing machines tailored to their usability. Additionally, we will continue to contribute to society by maintaining our high technical skills and rich accumulation of know-how. Please feel free to contact us when you need our services. 【Product Details】 ■ Measures the thickness/hardness of products *For more details, please download the PDF or feel free to contact us.

  • Hardness Tester
  • Measuring Instrument

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[Information] Basics of Vibration Control

[Information] Basics of Vibration Control

Attention those troubled by vibrations in machinery, equipment, and devices! Understand the steps for vibration countermeasures with "three visualizations."

This document introduces the procedures and basics of vibration countermeasures. It includes visualizations such as "visualizing disturbance vibrations numerically and clarifying acceptable vibration standards," "visualizing the effectiveness of countermeasure products for reliable product selection," and "visualizing the effects of countermeasures." Additionally, it provides information on services that support visualization and offers simple explanations of complex vibration elements. 【Contents (partial)】 ■ Visualization 01 / Visualizing disturbance vibrations numerically and clarifying acceptable vibration standards ■ Visualization 02 / Visualizing the effectiveness of countermeasure products for reliable product selection ■ Visualization 03 / Visualizing the effects of countermeasures ■ Self-vibration measurement service / Rental of vibration measurement equipment and provision of analysis reports ■ Engineer dispatch measurement / On-site measurement and analysis report support through engineer dispatch *For more details, please download the PDF or feel free to contact us.

  • others
  • Measuring Instrument

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Right angle measuring instrument Right angle measuring instrument

Right angle measuring instrument Right angle measuring instrument

Original products from Kurita Techno!! We handle everything from design to development in-house.

This is an announcement from Kurita Techno regarding the "Right Angle Measuring Instrument."

  • Distance measuring device
  • Measuring Instrument

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Control valve, NDX digital smart positioner for control valves

Control valve, NDX digital smart positioner for control valves

[TIIS Explosion-Proof Certification Product] Easy installation structure, automatic calibration, and large capacity spool for low air consumption. Vibration-resistant, non-contact structure smart positioner.

At Valmet, we offer a wide range of products including rotary valves (ball/butterfly), globe valves, and smart digital products. <Features> - Compact design - No feedback lever linkage required - Front cover for malfunction prevention - Easy installation structure - Auto calibration - Front-mounted operation panel - Non-contact structure to avoid wear and misalignment of levers - Low air consumption due to large capacity spool Spool capacity 80Nm3/h, air consumption 0.1Nm3/h <Track Record> World sales volume of NDX in 2016 & 2017 Approximately 5,000 – 6,000 units in 2016 Approximately 3,000 units in 2017 Sales volume of the current model ND9000 Approximately 50,000 units in 2016, approximately 25,000 units in 2017 <Applications> Petrochemical (refinery) Pulp and paper (approximately 80%) Mining / Pharma / Food & Beauty / Offshore projects, etc. *For more details, please download the catalog or contact us.

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  • Metso-NDX-281215-004.jpg
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[Data] Shirutoku Report No. 63 # The Ideal and Reality of Circuit Diagrams (2)

[Data] Shirutoku Report No. 63 # The Ideal and Reality of Circuit Diagrams (2)

Even parasitic impedance not shown in the circuit diagram can be detected by a professional!

★★Shirutoku Report: Useful Information You Can Benefit From★★ In this report, we will introduce an important invisible element, "impedance," in addition to parasitic components that are not visible on circuit diagrams. Impedance refers to AC resistance and is often specified as 50Ω for single-ended and 100Ω for differential. In high-frequency circuit design, impedance becomes a critical issue. Even parasitic impedance that is not shown in the circuit diagram can be discerned by professionals. If you are interested, please feel free to contact us. 【Contents】 ■ An example of a circuit diagram created with LT-spice *For more details, please refer to the PDF document or feel free to contact us.

  • Other semiconductors
  • connector
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X-ray Reflectivity Method

X-ray Reflectivity Method

XRR：X-ray Reflectivity

XRR measures the reflection intensity of X-rays incident on the sample surface at a very shallow angle. By comparing the reflection X-ray intensity profile obtained from this measurement with simulation results and optimizing the simulation parameters, this method determines the film thickness and density of the sample. - Evaluation of film thickness is possible (approximately 2 to 300 nm) - Evaluation of density is possible - Evaluation of surface roughness is possible (Rms ≤ 5 nm) - Non-destructive analysis is possible - Average information over a wide area of approximately 10×20 mm can be obtained

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[EBIC] Electron Beam Induced Current

[EBIC] Electron Beam Induced Current

A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).

By irradiating an electron beam within a SEM device, electron-hole pairs are generated in the sample. Normally, these pairs recombine and disappear, but if they are generated in regions with an internal electric field, such as a depletion layer, the carriers can be drifted by the internal electric field and extracted as a current. This current is referred to as EBIC (Electron Beam Induced Current), and by obtaining it alongside the SEM image, it is possible to visualize the position of the pn junction and the extent of the depletion layer. - Evaluation of pn junctions and crystal defects (dislocations, stacking faults, etc.) is possible. - By overlaying with the SEM image, the positions of the junctions and crystal defects can be identified.

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[OBIRCH] Light Beam Heating Resistance Variation Method

[OBIRCH] Light Beam Heating Resistance Variation Method

OBIRCH is a method that utilizes the change in resistance caused by the heat generated at defect locations when light is applied, to identify abnormal areas.

OBIRCH is a method that utilizes the change in resistance caused by the heat generated at defect locations when light is applied, allowing for the identification of abnormal areas. - It can identify the locations of voids and deposits within wiring and vias. - It can identify abnormal contact resistance. - It can identify short circuits in wiring. - It visualizes the DC current path. - It is capable of detecting micro-leaks in gate oxide films.

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[Analysis Case] Investigation of Curing Temperature and Glass Transition Temperature of Epoxy Resin

[Analysis Case] Investigation of Curing Temperature and Glass Transition Temperature of Epoxy Resin

Evaluation of thermal properties by DSC (Differential Scanning Calorimetry) measurement.

For the two-component mixed epoxy resin, we investigated the curing temperature and the glass transition temperature (Tg), which is an indicator of heat resistance, using Differential Scanning Calorimetry (DSC). When measuring the resin before curing with DSC, it was confirmed that a rapid exothermic reaction began around 103°C (Figure 1). This was due to the polymerization (curing) of the resin occurring as a result of the temperature increase. Furthermore, after air cooling the cured resin to room temperature, a second DSC measurement was conducted, which confirmed a shift of the baseline towards the endothermic side due to the glass transition of the resin, with Tg being approximately 116°C (Figure 2).

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[Analysis Case] Photoluminescence Mapping Measurement of SiC Diodes

[Analysis Case] Photoluminescence Mapping Measurement of SiC Diodes

Detection cases of stacking faults in SiC.

SiC has been actively researched and utilized in recent years for applications such as power devices. Due to the various polytypes of SiC, there is a problem where stacking defects, which can lead to disordered stacking arrangements, easily occur. One method for detecting these defects is photoluminescence (PL), which analyzes the light emitted when a sample is stimulated with light. We will introduce a case where mapping measurements were conducted to detect light emission caused by defects.

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[Analysis Case] SIMS Measurement of Specially Shaped Samples

[Analysis Case] SIMS Measurement of Specially Shaped Samples

Analysis is possible even for special shapes through innovative fixing methods.

Typically, SIMS measurements are conducted using chips with a flat surface of a few millimeters in size, but analysis can also be performed on small chips or samples with special shapes, typically less than 1 mm in size, by applying a fixed pre-treatment. Some samples that require investigation of trace components may have shapes that are not suitable for analysis under normal conditions, such as tiny chips or wire-like samples (Figure 1). In such cases, analysis is performed after fixation (Figure 2). Additionally, analysis may be possible for cross-sections, side surfaces, or samples with special shapes by applying pre-treatment.

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Regarding the depth conversion of SRA

Regarding the depth conversion of SRA

SRA: Spread Resistance Measurement Method

SR measurement involves diagonally polishing the sample and moving two probes in contact with the sample surface while measuring the electrical resistance directly beneath. The depth from the sample surface at a certain measurement point is determined by the product of the value of Sinθ (bevel angle) when the angle of diagonal polishing of the sample is θ and the distance from the bevel edge to that measurement point. The distance from the bevel edge is calculated as [X-step] × [number of measurement points].

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[Analysis Case] Evaluation of the Chemical State of RuO2 Catalyst using in-situ XAFS

[Analysis Case] Evaluation of the Chemical State of RuO2 Catalyst using in-situ XAFS

Measurement is possible under the specified gas atmosphere and temperature conditions.

In-situ XAFS allows for the evaluation of the chemical bonding state and local atomic structure of a sample under controlled conditions, focusing on the gas atmosphere and temperature surrounding the sample. Therefore, it is suitable for cases where state evaluation in special environments, such as catalysts, is necessary. This document presents a case where RuO2 powder was heated from room temperature to 400°C under a reducing atmosphere using in-situ XAFS, capturing the changes in the state of RuO2. From the shape of the spectrum, it was confirmed that RuO2 is reduced to Ru between 100°C and 200°C.

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Absolute PL quantum yield measurement

Absolute PL quantum yield measurement

Absolute PL quantum yield measurement is a method for determining the photoluminescence efficiency of materials.

Absolute PL quantum yield measurement is a method to determine the luminescence efficiency of a material, specifically how efficiently light (energy) absorbed by the material is converted into emitted light. - Since an excitation light source with a spectrometer is used, excitation at various wavelengths (approximately 350 to 800 nm) is possible. ■ Features of MST - The equipment is managed under controlled atmospheric conditions, allowing measurements of thin film samples without the influence of oxygen.

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[Analysis Case] Evaluation of Carrier Lifetime through Photoluminescence Lifetime Measurement

[Analysis Case] Evaluation of Carrier Lifetime through Photoluminescence Lifetime Measurement

Insights into the carrier lifetime of SiC can be obtained from the luminous lifetime.

Carrier lifetime refers to the time it takes for minority carriers among the excess carriers generated during the operation of electronic devices to decay to 1/e. Proper control of this is important for managing the electrical characteristics of the device. On the other hand, luminescence lifetime indicates the time until the luminescence intensity from the sample reaches 1/e, and it can be calculated from the luminescence decay curve. Since some minority carriers emit light during recombination, it is possible to indirectly evaluate the carrier lifetime from luminescence lifetime measurements. This document presents a case study on the evaluation of carrier lifetime for 4H-SiC epitaxial substrates. Measurement method: Fluorescence lifetime measurement Product fields: Power devices, LSI/memory, electronic components Analysis purposes: Failure analysis, defect analysis, product investigation, carrier lifetime, process evaluation For more details, please download the document or contact us.

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[Analysis Case] Evaluation of the Imidization Reaction of Polyimide

[Analysis Case] Evaluation of the Imidization Reaction of Polyimide

The degree of imidization due to differences in heating conditions can be evaluated using XPS.

Polyimide has very high heat resistance and excellent electrical insulation and mechanical properties, making it an essential material not only for electronic components but also for a wide range of fields such as precision machinery, automobiles, and aerospace. In its reliability evaluation, research on imide bonds is important. This document presents an example of XPS measurements conducted on polyimide before and after heating. Changes in the amount of oxygen and the chemical shifts of carbon, nitrogen, and oxygen confirmed that imidization progressed after heating. Additionally, by performing waveform analysis, it is also possible to determine the proportion of polyimide present.

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Observation of structural changes in metallic materials through tensile testing using in situ X-ray CT.

Observation of structural changes in metallic materials through tensile testing using in situ X-ray CT.

Capable of evaluating three-dimensional structural changes according to tensile stress.

In situ X-ray CT measurements allow for internal structure analysis under conditions where a load (tension or compression) is applied to the sample. In this document, in situ X-ray CT measurements were conducted using an aluminum plate as the sample, both in its normal state and in an extended state. We calculated the tensile stress applied to the sample and monitored the internal structural changes under each stress condition. By combining in situ X-ray CT measurements with image analysis technology, it is possible to evaluate under actual usage conditions, which was previously difficult, and assess the impact of stress on the product.

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  • Contract measurement
  • Contract Inspection
  • Measuring Instrument

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