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Measuring Instrument Product List and Ranking from 1170 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. テストー Kanagawa//Testing, Analysis and Measurement
  3. トリニティーラボ 中央事業所 Tokyo//Testing, Analysis and Measurement
  4. 4 TA Instruments Japan （TAInstruments） Tokyo//Testing, Analysis and Measurement
  5. 5 null/null
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Measuring Instrument Product ranking

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. What are the risks of "micro temperature excursions" in the cold chain? テストー
  2. VR-6000 Series One-Shot 3D Shape Measuring Machine
  3. Tactile evaluation measurement device 'TL201Sf' トリニティーラボ 中央事業所
  4. 4 Fully Automatic Image Dimension Measuring Instrument 'IM-X1000 Series'
  5. 5 Ultra-high precision inline profile measurement device "LJ-X8000 Series"

Measuring Instrument Product List

1081～1110 item / All 3818 items

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[Presscale Utilization Case] Cylinder Head Gasket

[Presscale Utilization Case] Cylinder Head Gasket

Improvement in efficiency and stability of quality is possible! Introducing a case where design efficiency has significantly increased.

We would like to introduce a case where we utilized press scale to continuously check the sealing performance of gaskets, with the aim of enhancing design efficiency and quality. Previously, there was no means to confirm whether the air/cooling water/engine oil inside the cylinders of prototypes and newly manufactured products were securely sealed, and we had no choice but to verify this through practical running tests. After implementation, we were able to significantly improve design efficiency compared to the trial-and-error approach in practical applications. [Case Overview] ■Challenges - Sealing performance could not be confirmed until practical running tests ■Effects - Evaluation under actual operating conditions became possible without running the engine *For more details, please refer to the PDF document or feel free to contact us.

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Automotive Industry Use Case Collection: Prescale 'Pressure Film'

Automotive Industry Use Case Collection: Prescale 'Pressure Film'

Contributing to the creation of high-quality and safe products! Introducing various applications in the automotive industry.

This document presents a wide range of applications for "Presscale," which broadly supports the development and manufacturing processes of automobiles. It includes numerous examples of its use in EVs, HEVs, FCVs, and in engine compartments. In the future, as electric vehicles, hybrid vehicles, and fuel cell vehicles are expected to be mass-produced, this product will play an important role in their development and manufacturing processes, contributing to the creation of higher quality and safer products. [Contents] ■ Examples of use in EVs, HEVs, and FCVs ■ Examples of use in engine compartments ■ Other examples of use in the automotive electronics field ■ Examples of Presscale measurement results ■ Examples of use throughout the automobile *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Spectral Sensitivity and Quantum Efficiency Measurement Device 'QE-R'

Spectral Sensitivity and Quantum Efficiency Measurement Device 'QE-R'

Improve the conversion efficiency of solar cells! Total solution for solar cell measurement!

The "QE-R" is a system developed in accordance with IEC and ASTM standards, allowing for the determination of the spectral sensitivity/quantum efficiency of solar cells by referencing the measurement procedures of each primary measurement institution. As options, it offers functions for internal quantum efficiency measurement (reflectance measurement) and transmittance measurement, as well as an LED bias function that allows selection of white light and wavelengths, and a variety of sample stages tailored to customer requirements. It provides a total solution for measuring the spectral sensitivity/quantum efficiency of solar cells in a single unit. 【Features】 ■ Compliant with IEC and ASTM standards ■ Compact body measuring D60×W60×H60cm ■ High-speed measurement (120 seconds @300–1100nm) and high reproducibility (over 99.5%) ■ Utilizes globally renowned optical components to provide reliable measurements *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices
  • Measuring Instrument

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Tool Grinding Machine Measurement Device 'TM-1000'

Tool Grinding Machine Measurement Device 'TM-1000'

Active in various tool processing scenes! Can be grasped without removing the tool from the grinding machine.

The "TM-1000" is a tool measurement device that can accommodate various tools and grinding machines. By setting this product on the grinding machine, the shape of the tool's tip can be grasped without removing the tool from the grinding machine. With the CAD comparison function, it is possible to compare the tool in its chucked state with the CAD drawing, eliminating the need for projectors or chart diagrams. 【Features】 ■ Compatible with various tools and grinding machines ■ Clearly displays the edges of the tool's tip ■ Measurement of tip R0.05mm ■ No risk of misalignment during re-chucking *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Other work tools
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Surface Gloss Meter "Micro-Tri-Gloss"

Surface Gloss Meter "Micro-Tri-Gloss"

【3-angle support】Capable of measuring the gloss of various material surfaces. Compact and lightweight. Can measure for long periods without calibration!

The micro-gloss series is used as a standard measuring instrument for gloss measurement in various industries. The light source comes with a 10-year warranty, reducing the hassle and cost of lamp replacement. It is equipped with an automatic self-diagnosis function that provides accurate data, allowing measurement checks to be completed simply by turning on the power. The micro-trigloss is a gloss meter that can simultaneously measure at three angles: 20°, 60°, and 85°. By having three measurement angles in one device, it enables quick recognition of quality variations in accordance with international standards. It can measure high-reflective metals with a gloss range of 0-2000 GU. 【Features】 ■ Uses LED for the light source, which has a 10-year warranty ■ Equipped with a color display ■ Automatic self-diagnosis with an internal calibration plate in the holder *For more details, please contact us or download the PDF.

  • Testing Equipment and Devices
  • Visual Inspection Equipment
  • Measuring Instrument

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Yuzu skin / Imaging clarity measurement device 'micro wave-scan'

Yuzu skin / Imaging clarity measurement device 'micro wave-scan'

Compact and lightweight yuzu skin, orange peel, and image clarity (DOI) measuring device.

The "micro wave-scan" is a compact model of a measurement device specialized for high-gloss surfaces, narrow spaces, and small parts, designed for measuring orange peel, skin texture, and image clarity (DOI). It can measure values from Wa to Wd. It features scroll wheel operation and a multilingual menu. Additionally, it has an easy-to-hold design for one-handed use and includes a statistical processing function with selectable memory storage. 【Features】 ■ Supports dullness up to <40, enabling measurement of high-gloss surfaces ■ Capable of measuring with narrow curvature ■ Can measure the smallest samples ■ Measurement possible from 0cm (only du, Wa, Wb) ■ Small measurement area: 4mm × scan length ■ Easy to hold design for one-handed use *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Visual Inspection Equipment
  • Measuring Instrument

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Coating and Printing Surface Uniformity Measurement Device 'cloud-runner'

Coating and Printing Surface Uniformity Measurement Device 'cloud-runner'

Objective evaluation of paint unevenness (mottling) during metallic painting.

The "cloud-runner" is the only measuring device capable of measuring paint and printing unevenness and mottling. To objectively measure unevenness and mottling, it is necessary to measure brightness variations over a wide area and from different angles. The "cloud-runner" can measure at three angles that correlate with visual assessment. It features a design that is easy to hold with one hand and includes selectable memory storage and statistical processing functions. 【Features】 ■ Measures small to large unevenness sizes under three angles (15°/45°/60°) ■ Measurement distance can be taken within the range of 10cm to 100cm ■ Allows for objective measurements that are not affected by surface gloss, color, or curvature ■ Easy to hold with one hand *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Visual Inspection Equipment
  • Measuring Instrument

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Color measurement, fluorescence, and surface gloss measurement device 'spectro 2 guide'

Color measurement, fluorescence, and surface gloss measurement device 'spectro 2 guide'

For the first time, it is possible to quantify fluorescent characteristics with a handy device. It is also equipped with a gloss meter, which is important for color evaluation, allowing for the management of color, gloss, and fluorescence all in one unit.

German-made BYK-Gardner spectrophotometer and color difference meter. The Spectro 2 Guide (spectrophotometer and color difference meter) is a measurement device that combines a colorimeter with fluorescence and gloss meters, providing a total solution for color measurement. It enables comprehensive color management with high performance while pursuing simplicity in operation, featuring a 3.5-inch touch color display. The live view displayed on the screen allows for pinpoint measurements, creating a new tactile experience as if you are touching the color. Additionally, it includes a dedicated calculation formula for blackness evaluation, specifically designed for the increasingly popular piano black decorative assessment, enabling evaluations that were previously impossible (available only in the Spectro 2 Guide Pro type).

  • Visual Inspection Equipment
  • Spectroscopic Analysis Equipment
  • Testing Equipment and Devices
  • Measuring Instrument

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Yuzu skin / Imaging clarity measurement device 'wave-scan 3 dual'

Yuzu skin / Imaging clarity measurement device 'wave-scan 3 dual'

A design that is easy to hold with one hand for measuring yuzu skin, orange peel, and image clarity (DOI).

The "wave-scan 3 dual" is the flagship model of a gloss meter that supports measurements from high gloss to medium gloss, including measurements for pear skin, orange peel, and image clarity (DOI). It is capable of measuring Wa to We values. It features a touch panel operation and a multilingual menu. Additionally, it has an easy-to-hold design for one-handed use and is equipped with a statistical processing function that allows for selectable memory storage. 【Features】 ■ Supports dullness up to <65 and can measure medium gloss surfaces ■ Good measurement performance on high to medium gloss surfaces ■ Capable of measuring Wa to We values ■ High reproducibility and instrument tolerance ■ Easy-to-hold design for one-handed use *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
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Petroleum product color tester 'LCM IV' capable of measuring APHA/Gardner color numbers.

Petroleum product color tester 'LCM IV' capable of measuring APHA/Gardner color numbers.

Equipped with a standard Gardner color number, Hazen unit color number (APHA), iodine color number, and Saybolt/Mineral oil scale all in one device!

LCM IV is a color measurement device that replaces traditional visual color assessment accompanied by objective measurements. It is ideal for quality control in everyday clear and transparent liquids such as resins, adhesives, and solutions. Automatic container identification prevents incorrect data measurement. Additionally, it features an easy-to-use, intuitive large-screen touchscreen with user guidance. 【Features】 ■ Large-screen touchscreen with intuitive user guidance ■ Containers of 11mm diameter, 10mm, and 50mm square for appropriate accuracy ■ Includes standard scales for Gardner, Hazen (APHA/PtCo), Iodine, Saybolt, and Mineral oil ■ Portability with optional use of lithium-ion batteries ■ USB interface for connection to a computer *For more details, please refer to the PDF document or feel free to contact us.

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P/N judgment, resistivity measurement sorting machine (CJT-01 type)

P/N judgment, resistivity measurement sorting machine (CJT-01 type)

Measurement of Si wafer thickness, front and back surface P/N determination.

Thickness measurement of 4”, 5”, 6”, and 8” Si wafers, determination of front and back P/N, and resistivity measurement will be conducted, and based on the results, sorting will be performed into cassettes that have been pre-set in the recipe.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Measuring Instrument

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Wafer thickness measurement device (TMR)

Wafer thickness measurement device (TMR)

This is a device that extracts silicon wafers from a dedicated cassette using edge handling and measures the thickness of a set pattern.

By holding three points on the outer circumference of the silicon wafer and rotating the θ table, the thickness at any location can be measured. Our unique "non-contact earth" method allows for safe, non-contact handling.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Measuring Instrument

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450mm wafer thickness measurement device (FTM-01 type)

450mm wafer thickness measurement device (FTM-01 type)

Large-diameter silicon wafer measuring instrument

- The thickness of the silicon wafer will be measured non-contact. - A laser length measuring device will be used to measure the thickness. - The thickness measurement data will be saved on a PC.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Measuring Instrument

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SiC wafer thickness measurement device (TME-05 type)

SiC wafer thickness measurement device (TME-05 type)

This is a device for measuring the thickness of SiC wafers adhered to a glass plate and the thickness of the adhesive, as well as measuring the thickness of individual SiC wafers.

- The thickness is measured non-contact using an optical probe/sensor. - A porous chuck-type wafer stage is used to uniformly hold thin wafers. - Measurement data is saved in CSV format, in addition to being displayed on the monitor of the accompanying computer. Graphical display is also possible.

  • Other semiconductor manufacturing equipment
  • Semiconductor inspection/test equipment
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Wafer Thickness Measurement Device (TME-07 Type)

Wafer Thickness Measurement Device (TME-07 Type)

This is a device that removes silicon wafers from a dedicated cassette and measures the thickness at the set points.

- The wafer thickness is measured non-contact using a capacitance sensor. - Wafer size changes are possible through recipe settings, eliminating the need for setup changes. - The measurement point is set to one point at the center, with cross measurements configured in the recipe. The number of points and their positions during cross measurements can also be specified. - The measured data is saved on the accompanying computer.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Measuring Instrument

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Manual Wafer Thickness Measurement Device (Model STM-06)

Manual Wafer Thickness Measurement Device (Model STM-06)

Thickness measurement of various types of wafers below φ4"

This machine is a device that manually measures the thickness of various materials' wafers with a diameter of 4 inches or less. The thickness measurement is performed using a confocal chromatic aberration sensor, measuring the difference between a block gauge or reference wafer and the target wafer in a one-sided measurement.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
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Career thickness measuring instrument (CME-06 type: semi-automatic type)

Career thickness measuring instrument (CME-06 type: semi-automatic type)

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and double-sided polishing process.

Set the carrier, move to the pre-set measurement position by operating the [Start] switch, and perform the measurement by operating the [Measure] switch. The θ-axis direction depends on the operator's setting. The measurement values will be displayed on the counter. It is also possible to record the data on a computer as an option.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Measuring Instrument

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Non-contact diameter measuring instrument (DMC-02 type)

Non-contact diameter measuring instrument (DMC-02 type)

This is a device that detects the wafer edge using laser light and measures the diameter by comparing it with a calibration wafer (reference wafer).

- The diameter of the wafer is measured non-contact. - By rotating the stage, the A diameter (3 points) and B diameter can be measured. - The LOT NO. and other information can be read using a barcode reader. - The measurement values are saved in Excel format on the accompanying computer.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Measuring Instrument

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Resistance Measurement Device (Model RTS-02)

Resistance Measurement Device (Model RTS-02)

Classified by resistivity and thickness categories.

This is a device that measures the thickness and resistance of silicon wafers and classifies them into specified resistivity categories or categories based on resistivity and thickness.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Measuring Instrument

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Thickness measuring ｍachine (TME-11 type)

Thickness measuring ｍachine (TME-11 type)

This machine is a device for measuring the thickness of φ8” silicon wafers.

It is a device that performs non-contact, automatic measurements of the thickness of Si wafers and various measurements of Si step parts.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Measuring Instrument

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Semiconductor substrate diameter measurement device (DMC-03 type)

Semiconductor substrate diameter measurement device (DMC-03 type)

This is a device that detects the wafer edge using green LED light and measures the diameter by comparing it with a calibration wafer (reference wafer).

The diameter measurement values (average diameter values, etc.) will be saved in Excel format on the attached computer.

  • Semiconductor inspection/test equipment
  • Measuring Instrument

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Light Measurement Device "Effect Optical System II"

Light Measurement Device "Effect Optical System II"

We contribute to the speed of LED development, workability, and improvement of product quality.

The "Effect Optical System II (EOS-II)" is a measurement device fully specialized in LED optical measurement, achieving both optical and electrical measurements in one go and in a short time. It accurately analyzes a wide wavelength range from 200 to 850 nm, contributing to the speed of LED development, work efficiency, and product quality improvement. The combination of a spectrometer and a system source meter allows for easy acquisition of optical and electrical characteristics. 【Features】 ○ Optical measurement - measures spectral characteristics, light intensity, and color rendering ○ Compatible with MacAdams ellipses ○ Electrical measurement - measures current, voltage, and leakage current ○ Compatible with gimbal for light distribution measurement For more details, please contact us or download the catalog.

  • Optical Measuring Instruments
  • Other electric meters
  • Other electronic measuring instruments
  • Measuring Instrument

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Measuring device "Illuminance Monitor"

Measuring device "Illuminance Monitor"

A measuring device compatible with various types from excimer ultraviolet to LED ultraviolet!

Quark Technology Co., Ltd.'s illuminance monitor supports a variety of applications from excimer ultraviolet to LED ultraviolet. There are three types of monitors based on measurement wavelength, each used for measuring different wavelengths. With a low price, easy operation, and compact size, we encourage you to make a purchase. 【Features】 ■ Supports excimer ultraviolet to LED ultraviolet ■ Simple operation ■ Compact size ■ Low price *For more details, please refer to the catalog or feel free to contact us.

  • Other measurement and measuring equipment
  • Measuring Instrument

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Measuring device "Portable Contact Angle Meter"

Measuring device "Portable Contact Angle Meter"

Measurement can be performed just by placing it on the surface of the object being measured!

The "portable contact angle meter" is a measuring instrument that can measure the surface of objects such as wafers and photomasks before and after surface treatment simply by placing it on the surface. There is no need to cut the sample during measurement, and it can measure samples with small surface areas or curved surfaces. When using this instrument for measurement, the sample, which is the object of measurement, must have a measurement area larger than 10mm x 16mm. 【Features】 ■ Measurement is possible just by placing it on the surface of the object ■ No need to cut the sample ■ Can measure even with small surface areas ■ Can measure even with curved surface areas *For more details, please refer to the catalog or feel free to contact us.

  • Other measurement and measuring equipment
  • Measuring Instrument

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Measurable by contact/non-contact ◆ROMER Absolute Arm

Measurable by contact/non-contact ◆ROMER Absolute Arm

Quality control, inspection, in-flight certification, reverse engineering, and 3D modeling are possible! We also support measurements brought to the manufacturing site.

Showa Seisakusho manufactures various types of casting wooden molds, models, and wooden products, enabling consistent high-precision manufacturing from product data creation and processing to inspection. As a company engaged in manufacturing, we can hold discussions from the product launch stage. Using the ROMER Absolute Arm, we can measure and scan not only metal and aluminum materials but also dark and glossy items. Additionally, we can stably measure and scan complex shapes and soft parts made of materials like urethane and sponge. 【Features】 ■ Measurement through contact and non-contact methods ■ Ability to scan various materials non-contact ■ Measurement and scanning possible for dark and glossy items in addition to metal and aluminum materials ■ Portable, allowing for on-site measurements in manufacturing environments ■ Measurement results expressed as point clouds and color maps ■ Arm length of 1.5m, capable of measuring up to a maximum range of 3m * Measurements over 3m can be accommodated upon request ● For more details, please contact us or download the catalog.

  • Wood products
  • Measuring Instrument

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Insulated fastener "DIPK"

Insulated fastener "DIPK"

Cost-effective fastening with plastic nails.

◆Applicable Base Materials - Concrete - Lightweight concrete porous blocks - Vertical hole bricks - Hole-punched limestone bricks ◆Applications Fastening the following insulation materials to facades, etc.: - Polyurethane boards - Wood wool lightweight building material boards - Cork boards / coir mats - PU panels

  • others
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Insulated fasteners "FID ii & FID ii Plus"

Insulated fasteners "FID ii & FID ii Plus"

Installation inside insulation to reduce heat bridges.

◆Applicable Base Materials - Bead method polystyrene foam (EPS) type - Extruded polystyrene foam (XPS) type - Wood fiber type - Rigid polyurethane foam type - Rock wool, etc. ◆Features - Dedicated fastening for direct installation to insulation materials, designed to reduce thermal bridging. - FID ii shape allows for easy installation without pre-drilling through a thin mortar layer, shortening the construction process. - FID ii is a high-load fastener specifically for insulation materials, suitable for insulation thicknesses starting from 60 mm, while FID ii Plus is for thicknesses starting from 100 mm. - Quick and economical installation using Torx T40.

  • others
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『LED Dot Correction Controller』

『LED Dot Correction Controller』

Applying technology to measure the brightness and color distribution of objects for quality control of LED displays!

The "LED Dot Correction Controller" is a product that applies the technology of analyzing images from a CCD camera to measure the luminance and chromaticity distribution of objects for quality control of LED displays. Even among LEDs of the same manufacturer and model, there can be variations in luminance and chromaticity. Therefore, to achieve a uniform luminance and chromaticity distribution in LED displays, it is necessary to perform output correction for the emission of each individual LED. By applying this system to address this issue, we capture the variations in luminance of each LED based on the measured results, and by adding feedback control to ensure uniformity, we correct the output levels to eliminate luminance unevenness. 【Features】 ■ Reduces variations in luminance of individual LEDs ■ Corrects output levels through feedback control ■ Eliminates luminance unevenness *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Other measurement, recording and measuring instruments
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Magnetic Field Measurement System (Human Protection Measurement) 7904A

Magnetic Field Measurement System (Human Protection Measurement) 7904A

Easy measurement and evaluation of human body protection.

Using the low-frequency magnetic field measuring device ELT-400 manufactured by Narda S.T.S., we analyze and evaluate human protection measurements based on the IEC62233 standard measurement method. The miniaturization and lightweight design of the data processing device make it easy to work in limited spaces. Measurement data can be recorded on external storage, supporting the analysis of evaluation results and report creation.

  • Other electronic measuring instruments
  • Measuring Instrument

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Testing equipment

Testing equipment

Transforming the diverse needs of our customers into reality with SANEI. We have inspection equipment such as three-dimensional measuring machines!

We would like to introduce the inspection equipment of San-ei Kogyo Co., Ltd. We own Tokyo Seimitsu's three-dimensional measuring machine "RVA600A" and contour tracer "1600D-12," as well as Nikon's projector "V-20B." In addition, we conduct inspections using equipment such as the Bühler metal flow inspection machine, Mitutoyo roundness measuring instrument, and Keyence digital microscope "VHX-600." 【Equipment Owned】 ■ Tokyo Seimitsu / Three-dimensional measuring machine "RVA600A" ■ Tokyo Seimitsu / Contour tracer "1600D-12" ■ Nikon / Projector "V-20B" ■ Bühler / Metal flow inspection machine ■ Mitutoyo / Roundness measuring instrument ■ Keyence / Digital microscope "VHX-600" *For more details, please refer to the PDF document or feel free to contact us.

  • Processing Contract
  • Other inspection equipment and devices
  • Contract Inspection
  • Measuring Instrument

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