Last Updated： Aggregation Period:Apr 15, 2026～May 12, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Apr 15, 2026～May 12, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Apr 15, 2026～May 12, 2026
This ranking is based on the number of page views on our site.
2251～2280 item / All 3835 items
Instantly measure the resistance of silicon ingots/blocks non-contact and non-destructively using eddy current technology.
We can also provide devices for mapping measurements of solar cell blocks/wafers/cells.
Crystal Defect Measurement Device (Light Scattering Tomography)
Crystal defects in silicon wafers can be measured quickly.
Measurement device for the development of high-efficiency solar cells
The PV-2000 is a comprehensive measurement device for solar cell development that combines the technologies of Semilab and SDI. It can be equipped with various heads for developing high-efficiency solar cells, such as for passivation layer evaluation.
Fully automatic spreading resistance measurement device
The SRP (Spreading Resistance Profiler) device measures the resistivity profile of silicon in the depth direction, the thickness of the EPI layer, the depth of the PN junction, and the carrier concentration distribution by making contact with two probes on a diagonally polished silicon wafer in the depth direction and measuring the spreading resistance value between the probes.
Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!
The JPV method (Junction Photo Voltage method) allows for fast and reproducible mapping measurements. 【Features】 - Non-contact, non-destructive measurement - No adjustment of probes required - No special sample preparation needed for measurement - Measurement possible even with oxide films or coatings on the surface - High spatial resolution distribution measurement (mapping) can be performed quickly - Highly reproducible measurements are possible - Can be integrated with Semilab's benchtop platforms WT-2000, WT-2500, WT-3000, or inline wafer testing equipment.
Non-contact heavy metal contamination, CV/IV, membrane evaluation device. The sensitivity of iron concentration measurement achieves E8 by adopting DSPV!
This is a non-contact heavy metal contamination, CV/IV, and film evaluation device with over 400 units in operation worldwide. The sensitivity for iron concentration measurement has achieved E8 by adopting DSPV, contributing to the improved yield of recent CMOS image sensors. It is capable of CV measurement of compound semiconductors and can measure the concentration distribution and profile in the plane non-contactly.
Measurement of various semiconductor carrier transport characteristics is possible! Non-contact mobility measurement using microwave reflection!
For the manufacturing of semiconductor devices, carrier mobility is a very important parameter. The "LEI-1610 Series" is a non-contact mobility measurement device capable of measuring various semiconductor carrier transport characteristics such as mobility, carrier concentration, and sheet resistance. Carrier mobility, sheet resistance, and sheet charge density can be measured non-contact and destructively on Si wafers ranging from 2 inches to a maximum of 8 inches, as well as on compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 ■ Non-contact mobility measurement using microwave reflection ■ Standard measurement device for high-frequency device characteristics ■ High correlation with measurement results from the Hall effect ■ Multi-carrier modeling option *For more details, please refer to the related link page or feel free to contact us.
Measure the depth of PN junction and carrier concentration distribution! Surface resistance measurement available as an option!
We would like to introduce our spread resistance measurement device, the 'SRP-170/2100'. By making contact with two probes in the depth direction on a diagonally polished Si wafer, we can measure the specific resistivity profile in the depth direction of Si, the thickness of the EPI layer, the depth of the PN junction, and the carrier concentration distribution from the spread resistance value between the probes. The "SRP2000" automates the conditioning of the probes, measurement of the bevel angle, and data input for standard samples, allowing for continuous automatic measurement of multiple samples, with a maximum of 6 samples able to be loaded simultaneously. 【Features】 ■ World-standard carrier concentration distribution and profile measurement device ■ Supports measurement automation (SRP-2100) ■ Surface resistance measurement available as an option (SRP-170) *For more details, please refer to the PDF document or feel free to contact us.
Achieving high-precision measurements over a wide measurement range without causing physical damage to the sample!
"DELCOM" is a non-contact sheet resistance measurement system using the DC eddy current method. It is used in research and development, inspection processes, and manufacturing lines for semiconductor/LCD substrates, solar cell cells, flexible materials, and various conductive films, achieving high-precision measurements over a wide measurement range without causing physical damage to the samples. The measurement applications include semiconductors, ITO films, graphene & carbon, capacitive metal wheels, and electromagnetic wave absorbing materials. 【Features】 ■ Non-contact sheet resistance measurement system using the DC eddy current method ■ Does not cause physical damage to samples in research and development, inspection processes, and manufacturing lines ■ Achieves high-precision measurements over a wide measurement range ■ The measurement range can be selected from four ranges according to the resistance range *For more details, please refer to the PDF document or feel free to contact us.
Signal processing close to visual inspection
This is an introduction to the carbon dispersion measurement device handled by Asahi Measurement Co.
Automatically reset the measured value to zero after a set time! Interval settings can be adjusted between 0.1 to 3 seconds.
We would like to introduce our "Torque Management Measuring Device for Electric Screwdrivers." The "KTM-6/KTM-15/KTM-150" allows for pass/fail judgment of measurement values with adjustable upper and lower limits. The "KTM-250" can measure up to 25Nm, making it suitable for high-torque tools. We also offer the dedicated measuring device for the HS series, the "KTM-50S." It can be used anywhere and is convenient for transport to job sites. A dedicated charger is included. Please feel free to contact us if you have any inquiries. 【Features】 ■ Displays maximum, minimum, and average values ■ Allows for setting of arbitrary upper and lower torque limits, with notifications via LED or other means when measurements fall inside or outside this range ■ Capable of storing up to 300-400 data points ■ Facilitates easy data management on a computer ■ Automatically powers off after 10 minutes of inactivity ■ Outputs data on the applied load torque approximately every 1/180 seconds *For more details, please refer to the PDF document or feel free to contact us.
Automatically reset the measured value to zero after a set time! Interval settings can be adjusted between 0.1 to 3 seconds.
The "KTM-50S" is a dedicated model of the HS series cushion clutch electric screwdriver. It measures the torque of a semi-auto type screwdriver. Additionally, it can be used anywhere and is convenient for carrying to job sites. A dedicated charger is also included. 【Features (excerpt)】 ■ Average value calculation ■ Pass/fail judgment ■ Auto power off ■ USB output ■ Auto zero clear *For more details, please download the PDF or feel free to contact us.
When observation of the condition is necessary.
A coating observation instrument that combines a blade for cutting coatings and a 50x microscope (with a 100 division scale). It allows for easy examination of the properties and thickness of the coating by cutting it in a V-shape. Compliant with ISO 2808, ASTM D4138, and DIN 50 986.
Display measurement values on the gauge. We have applied polishing and other treatments to significantly improve accuracy and durability.
The N-6500 is an analog type that displays rebound values on a gauge. The main components are heat-treated and hard chrome plated. With polishing and the addition of a breather function, both accuracy and durability have significantly improved. This product is manufactured in accordance with the "Guidelines for Compression Strength Determination Methods (Draft)" by the Japan Society for Materials Science. 【Features】 ■ Displays rebound values on a gauge ■ Main components are heat-treated and hard chrome plated ■ Equipped with a breather function ■ Significant improvements in accuracy and durability ■ Complies with the "Guidelines for Compression Strength Determination Methods (Draft)" *For more details, please refer to the PDF document or feel free to contact us.
Precision measurement with a probe type is possible. A handy type that allows surface roughness management on-site.
The SJ-310 is a surface roughness measuring instrument equipped with a color LCD touch panel that offers good visibility. It has a built-in printer that allows for the output of calculation results and waveforms. *For more details, please feel free to contact us.
High-precision magnetic thickness gauge
- Non-magnetic material thickness measured non-destructively with high precision - Direct data import into evaluation software - Quick calibration function using AI
Compact and comfortable operation.
The SJ-220 is a surface roughness measuring instrument equipped with a color LCD touch panel that offers good visibility. *For more details, please feel free to contact us.*
Supply air and measure the air discharge amount from the nozzle tip hole! Achieve automation and more.
We would like to introduce a case study on the design of the flow measurement device for matched nozzles by Aitec Co., Ltd. To optimize our customers' operational efficiency, we conduct an analysis of their operations and propose suitable robot implementations tailored to each customer. We achieve automation, labor-saving, and unmanned operations based on the results of our customers' businesses, so please feel free to consult us for any requests. 【Case Overview】 ■Device Name: Flow Measurement Device for Matched Nozzles ■Workpiece: Diesel Engine Fuel Injection Nozzle & Needle ■Specifications - Air is supplied as a substitute for diesel fuel to the nozzles and needles combined in the previous process, and the air discharge amount from the nozzle tip hole is measured. *For more details, please refer to the PDF document or feel free to contact us.
For compressor rotors! Measurement of vane grooves is possible with air micro.
We would like to introduce a case study on the design of Aitec Co., Ltd.'s "Vane Groove Measuring Machine." To optimize our customers' operational efficiency, we conduct an analysis of their operations and propose suitable robot implementations tailored to each customer. We achieve automation, labor-saving, and unmanned operations based on the results of our customers' businesses, so please feel free to consult us for any requests. 【Case Overview】 ■ Device Name: Vane Groove Measuring Machine ■ Workpiece: Rotor for Compressor ■ Process: Measurement ■ Specifications: Air micro measurement of the vane groove of the rotor for compressor *For more details, please refer to the PDF document or feel free to contact us.
![Image tool measuring instrument "Just Scope" [Easily measure various dimensions of tools!]](https://image.mono.ipros.com/public/product/image/dd4/2000286885/IPROS28159409405587097935.png?w=280&h=280)
A new image tool measuring device has arrived that allows you to take pictures of tools with a camera and easily measure various dimensions! The intuitive and simple operation screen is suitable for anyone who uses it!
"Just Scope" is an image tool measuring device that allows you to photograph tools with a camera and measure various dimensions. The tool can be rotated 0 to 90° relative to the camera, enabling photography from the front, side, or any arbitrary direction. To measure, simply place the tool on a V-block and adjust the lighting and camera focus. The intuitive and simple operation screen makes it accessible for anyone to use. 【Features】 ■ Capable of photographing from any direction ■ Enables measurement of various dimensions ■ Easy to use for anyone ■ Compact tabletop size that doesn't require much space ■ Reliable optical performance *For more details, please request materials or view the PDF data from the download.
An upgraded model with enhanced measurement features such as an expanded rotation range and a 4K camera. Easy to operate.
The "Just Scope-RX" is an image measuring instrument that can capture tools with a camera and measure various dimensions. While maintaining the simple operability of the conventional series, it has expanded the swivel range to 0-135° and adopted a 4K camera capable of high-definition imaging, thereby enhancing its measurement functions. Lenses for medium and small diameters are also available as options. 【Features】 ■ Swivel angle is displayed digitally ■ Can confirm clearance for stepped drills and more ■ Comes standard with a PC integrated with the device via an arm ■ Intuitive and simple operation screen *For more details about the "Just Scope-RX," please refer to the documentation. Feel free to contact us with any inquiries.
Adhesive Holding Force Tester
Adhesive holding power measurement, measure the adhesive holding force, adhesive retention, retention measurement, retention, measurement Instrument measures the adhesive holding force retention pressure sensitive adhesive tape adhesive. Adhesive retention instrument conforms to JIS Z0237 standard. Contact phone :0086-531-8581102 E-mail: trade2@labthink.cn thank you to love the sink Instruments Incorporated.
Organic gas permeability measurement device
Organic vapor transmission rate measurement system, measurements of organic vapor transmission, gas transmission rate of organic transmission rate measurement system Organic vapor transmission rate measurement system films, foils, complex films, bottles and other materials like Purasuchikkufimuru sheet, bags, make quantitative measurements of organic vapor transmission rate of the finished product packing box containers.
Oxygen permeability measurement device
The oxygen transmission rate measurement in air or 100% plastic films and packaging containers in oxygen (such as plastic bottles and plastic containers) are used to measure oxygen permeability. The oxygen transmission rate measurement system JIS K7126-2, ASTM D3985, ASTM F1307, ASTM F1927, ISO 15105-2 and other standards.
Measure the minute resistance changes of the wire during the cable bending test and monitor it on a computer!
This device is a measuring instrument designed to accurately measure the resistance value of connected wires. It applies low voltage and high current in a pulsed manner to the wire being measured, allowing for high-precision measurement of the resistance value of the wire. Additionally, by connecting to a PC via a USB cable, it enables real-time display of continuous measurement values and the ability to graph these values. 【Features】 ■ Applies low voltage and high current in a pulsed manner to the wire being measured ■ Measures the resistance value of the wire with high precision ■ Since current is not continuously flowing, there is no damage to the wire being measured ■ Can be used as a standalone resistance measuring device for the wire being measured, as well as a tester for measuring changes over time with GO/NG judgment *For more details, please refer to the PDF document or feel free to contact us.
Measurement of printed circuit boards! A measuring device that eliminates measurement errors caused by edge sensors.
The Dynatron's "MasterSCALE III" is a Gerber standard two-dimensional automatic measuring machine capable of measuring artwork films and printed circuit boards. It performs continuous automatic measurements based on Gerber data and is equipped with autofocus and shape automatic recognition functions. It eliminates measurement errors caused by edge sensors and outputs measurement reports and Excel data. 【Features】 ■ Standard equipped with LED reflective lighting and transmitted lighting ■ Elimination of measurement errors using edge sensors ■ Automatic measurement of V-cut width and position ■ Automatic recognition of etching line top/bottom ■ Automatic pass/fail judgment of measurement results *For more details, please refer to the PDF materials or feel free to contact us.
Non-contact tool measurement and detection laser control. Reliable even in harsh environments.
Achieving high reliability even in poor environments Laser control for non-contact tool measurement and detection 【Features】 ○ High-precision processing ○ Contributes to preventing significant losses caused by tool breakage ○ Reduction of tool setup time ○ Unmanned operation ○ Reduction of defective product rate ○ Improvement of productivity ○ Single blade detection in actual processing rotation range ○ Customization according to needs with built-in microprocessor ● For other functions and details, please download the catalog.
We will quantify and represent the number of suspended particles.
"Air cleanliness (class)" is an indicator of the extent to which airborne particles are permitted in the air. It is quantified by counting the number of airborne particles per unit volume. The most common standard is "Federal Standard/FED-STD-209D." [Number of particles with a diameter of 0.5μm or larger contained in a space of 1 cubic foot] ■1 particle = Class 1 ■10 particles = Class 10 ■100 particles = Class 100 ■1000 particles = Class 1000 ■10000 particles = Class 10000 ■100000 particles = Class 100000 *For more details, please refer to the catalog or feel free to contact us.
Particles in the solution are surrounded by an electric double layer (EDL) that characterizes the inter-particle interactions.
The measurement of zeta potential is directly related to the charged environment of particles and provides information about dispersion stability. This is widely used for chemical synthesis and particle functionalization. In the design of dip cells, sample preparation has become simple and easy, preventing the formation of bubbles. It is compatible with standard cuvette cells and has made various materials available, such as polystyrene, glass, or quartz, which are fully compatible with organic solvents. The innovative glass carbon electrode has been made long-lasting, and non-oxidizing electrodes can be easily cleaned with standard treatments such as ultrasonic baths or acid-base cleaning. WALLIS has optimized the dip cell electrode design to prevent artifacts like the electrokinetic effect caused by suppressive solvents that induce displacement along the walls of the cuvette. As a result, software correction for measurement signals is not necessary.
Infrared lens MTF measurement device
This is an improved version of the highly acclaimed "YY-304." By standardizing the collimator and adopting a new stand, we have maintained measurement accuracy while achieving a price reduction. For specifications and further details, please feel free to contact us.
