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Measuring Instrument Product List and Ranking from 1154 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated: Aggregation Period:Jan 28, 2026~Feb 24, 2026
This ranking is based on the number of page views on our site.

Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Jan 28, 2026~Feb 24, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. システムクリエイト Osaka//Industrial Machinery
  3. null/null
  4. 4 フォス・ジャパン Tokyo//Testing, Analysis and Measurement
  5. 5 日東精工アナリテック Kanagawa//Industrial Machinery

Measuring Instrument Product ranking

Last Updated: Aggregation Period:Jan 28, 2026~Feb 24, 2026
This ranking is based on the number of page views on our site.

  1. VR-6000 Series One-Shot 3D Shape Measuring Machine
  2. Fully Automatic Image Dimension Measuring Instrument 'IM-X1000 Series'
  3. 3D scanner type three-dimensional measuring instrument "VL-800 series"
  4. 4 I tried measuring the gauge with a tabletop measuring device! システムクリエイト
  5. 5 Mitarepo: An amateur tried 3D measurement! Fulcrum システムクリエイト

Measuring Instrument Product List

631~660 item / All 3780 items

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Skin stratum corneum moisture measurement device "SKICON-200EX-USB"

Easy to carry! For pharmacological or physiological research on the stratum corneum of the skin.

The "SKICON-200EX-USB" is a skin stratum corneum moisture measurement device that anyone can easily use. By conducting an in vivo moisturizer efficacy test, it allows for the assessment of the moisture condition of the stratum corneum and the evaluation of the moisturizing effects of cosmetics and topical agents. 【Features】 ■ Easy operation ■ Various sensor probes available ■ Focus on low distortion high-frequency sine voltage and linearity ■ Easy data processing ■ Lightweight *For more details, please refer to the PDF materials or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Differential Scanning Calorimeter (DSC) with Heat Flux Type Single Furnace

A high-sensitivity heat flux DSC that combines compactness with excellent versatility and reliability, capable of a wide range of applications from research to routine analysis.

Introducing the Differential Scanning Calorimeter (Single Furnace DSC) "DSC 4000 / 6000." This high-sensitivity heat flux DSC combines compact design with excellent versatility and reliability, making it suitable for a wide range of applications from research to routine analysis. Compared to conventional models, it achieves a stable and flat baseline with improved sensitivity. 【Features】 ◆ Equipped with a high-sensitivity sensor disk that enables excellent temperature detection ◆ Utilizes a low heat capacity furnace made of robust, corrosion-resistant, long-lasting inert aluminum ◆ Built-in digital mass flow controller compatible with two types of gases *For more details, please refer to the PDF document or feel free to contact us.

  • Other industrial robots
  • Other physicochemical equipment
  • Gas Generator
  • Measuring Instrument

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Input compensation type double furnace DSC 8000

Achieve excellent program temperature tracking! Wavelet Analysis further reduces noise.

The "Input Compensation Type Double Furnace DSC 8000" is a differential scanning calorimeter that achieves excellent program temperature tracking with a low-mass furnace. It features a built-in mass flow controller, allowing for automatic switching between two gas lines. With a stable baseline provided by SmartScan, Wavelet Analysis further reduces noise. 【Features】 ■ Low-mass furnace achieves excellent program temperature tracking ■ Stable baseline with SmartScan ■ Wavelet Analysis further reduces noise ■ Automatic switching between two gas lines (built-in mass flow controller) ■ Auto sampler with automatic diagnostic function (optional) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • others
  • Measuring Instrument

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Dust concentration measurement device for exhaust gas - Dustack Sampler ESA-703

It is a standard automatic sampling device based on the measurement method for dust concentration in exhaust gas according to JIS Z 8808.

In advance, set parameters such as moisture content, exhaust gas density, and nozzle diameter, and continuously measure exhaust gas temperature, dynamic pressure (flow velocity), static pressure, and atmospheric pressure to calculate the theoretical constant suction flow rate. The calculated theoretical value and the actual suction flow rate measured by the gas meter are fed back via a pulse signal, allowing the device's internal valves to be automatically controlled to ensure that the theoretical value and the actual value continuously match.

  • Other environmental analysis equipment
  • Measuring Instrument

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Create/measure a long time difference with picosecond (ps) resolution.

This explains the configuration of creating a time difference with the T560 delay/pulse generator and measuring the time difference with the MCS8A multi-stop TDC/TOF.

◆T560 Delay/Pulse Generator - Delay time and pulse width can be specified individually for 4 channels, with settings possible in 10ps increments up to a maximum of 10 seconds. - Input/output delay (insertion delay): 21ns - Maximum trigger rate: 16MHz ◆MCS8A Multi-Stop TDC/TOF - An 8-input digitizer capable of recording multiple event times. - The time difference between START and STOP can be detected with a resolution of 80ps for up to 8.3 days. - STOP can be detected on the rising edge, falling edge, or both edges. - The threshold levels for START and STOP can be set in 1mV increments within the range of -1 to +1.5V. - A multi-event time digitizer with 80ps per time bin and no dead time. ◆MPA4T Combined TDC/TOF and Multi-Parameter MPA - A 5-input digitizer derived from the MCS8A, with 100ps per time bin. - Equipped with an 8-channel ADC input port, functioning as a multi-parameter data acquisition system (MPA). ⇒ Operates as a high-speed list mode system. ⇒ Each ADC input can also connect to multi-scalers or TOF devices.

  • Other inspection equipment and devices
  • Radiation detector
  • Analytical Equipment and Devices
  • Measuring Instrument

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Lifetime measurement device

Mapping measurements using the u-PCD method are possible, and there are numerous achievements in the solar cell and semiconductor markets.

Various electrical measurement mapping can be performed as an option. (Diffusion length, iron concentration, resistivity, sheet resistance, LBIC, reflectivity, IQE, PN determination)

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Measuring Instrument

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Lifetime measurement device for single crystal silicon blocks

Lifetime measurement device for single crystal silicon blocks

The lifetime measurement device WT-2000PI uses e-PCD technology to measure minority carrier lifetime in single crystal silicon ingot state without passivation treatment.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Measuring Instrument

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Optical pore size and pore distribution measurement device

The world's only spectroscopic ellipsometer technology for measuring pore rate and pore distribution using an EP (optical porosimeter).

No pre-treatment is required, and measurements can be taken quickly at 20 minutes per point compared to conventional methods.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Measuring Instrument

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Thin-film solar cell panel measurement device

Thin-film solar cell panel measurement device

In the flat panel display manufacturing market, we have a significant track record in quality control applications.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Measuring Instrument

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Mercury Probe CV/IV Measurement Device "MCV Series"

No need for electrode formation with mercury probes! Provides reduced development time and lower costs in R&D.

The "MCV-530/530L/2200/2500" is a device that enables the evaluation of electrical characteristics of semiconductor silicon wafers and the characteristics of MOS device oxide films, among others. Traditionally, gate electrodes such as Poly-Si or Al were deposited on the wafer, and after forming MOS structures or Schottky structures, CV/IV characteristic evaluations were conducted. This product has its own gate electrode, allowing for the acquisition of electrical characteristics of oxide films and wafers without the need to create a metal gate. It provides quick feedback through process monitoring, reduces development time in R&D, and lowers costs. 【Features】 ■ No need for electrode formation due to the mercury probe ■ Excellent reproducibility ・Schottky: 0.3% (1σ) / MOS: 0.1% (1σ) ■ Mapping of the wafer surface is possible ■ Safe and easy mercury exchange enabled by a newly developed mercury exchange mechanism *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Measuring Instrument

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Trench Depth Measurement Device IR2100

Trench Depth Measurement Device

Non-contact measurement of deep trenches and TSV shapes of power devices, the depth of DRAM capacitor trenches, CD measurements, and recess measurements. High aspect ratio trench measurements are possible with the proprietary technology MBIR (Model Based Infrared). It also supports the measurement of the vertical profile of the doping concentration of epitaxial films.

  • Other inspection equipment and devices
  • Measuring Instrument

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Thin Film Thickness and Young's Modulus Measurement Device SW3300

Thin film thickness and Young's modulus measurement device

It is possible to measure the thin film thickness, Young's modulus, and Poisson's ratio of a wafer substrate in a non-contact and non-destructive manner.

  • Other inspection equipment and devices
  • Measuring Instrument

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Ultra-high sensitivity DLTS bulk defect and interface level measurement device

Effective for analyzing defects and crystal defects! Equipped with interfaces for a wide range of cryostats.

The "DLS-83D/1000" is a measurement device capable of measuring bulk defects and interface states, including temperature, frequency scans, and C-V characteristics. The "DLS-1000" supports high-sensitivity measurements of bulk defects and interface states at the level of 10^8 cm³. It comes standard with a library for easy analysis. It features a unique system that employs a high-sensitivity analog/digital method (analog for measurement and digital for data processing) and is equipped with user-friendly software. 【Features】 ■ Capable of high-sensitivity contamination detection (2x10^8 atoms/cm³) ■ Equipped with a wide range of interfaces for cryostats ■ Capable of measuring temperature, frequency scans, and C-V characteristics ■ Over 100 units delivered worldwide, demonstrating extensive track record *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment
  • Measuring Instrument

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Non-contact sheet resistance measurement device "LEI-1510 Series"

Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.

The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment
  • Measuring Instrument

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Composite SEM-AFM system

Function to measure surface and nano structures! Covers from millimeters to atomic level.

We introduce a combined system of Scanning Electron Microscope (SEM) and Atomic Force Microscope (AFM). Using the zoom function of the SEM, the AFM chip can be directly moved to the target area. Information about surface morphology and mechanical, electrical, and magnetic properties can be obtained with nanometer resolution. AFM can be utilized with the Merlin series and Crossbeam series, and existing systems can be updated with a simple door replacement. 【Features】 ■ SEM and FIB intersect with a cantilever chip ■ Composite measurements of all three methods can be performed at the exact same point in space and on the sample ■ Designed to achieve 3D resolution at the single atom level ■ Maintains a minimum SEM working distance of 5mm while allowing a viewing angle of 0° to 85° with the SEM ■ Supports in-situ chip sharpening with FIB *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
  • Measuring Instrument

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Epi film thickness measurement device "EIR-2500"

Measurement device that enables the use of IR reflectance measurement heads! Achieves high-throughput measurement of epitaxial film thickness.

The "EIR-2500" is a unique epitaxial film thickness measurement device equipped with an infrared spectroscopic reflectometer and FTIR functionality. It achieves high-throughput epitaxial film thickness measurements and fully complies with applicable SEMI/CE standards. Additionally, the EIR product series is based on high-performance and reliable electronic components, improving equipment uptime and reducing maintenance needs. 【Features】 ■ Wafer size: 4 to 12 inches ■ Materials: Si, SOI, SiC, SiGe, III-V, etc. ■ FTIR functionality ■ High-precision measurement of epitaxial film thickness ■ Measurement of film thickness in the transition region *For more details, please refer to the related link page or feel free to contact us.

  • Coating thickness gauge
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Airflow measurement device for discharge/inlet ports Wind Watcher χ (WWA)

[Free test available] Instantly measure airflow! An airflow measuring device that provides accurate measurement values.

■Free testing is available If you would like to test whether the airflow of air purifiers, dust collectors, air conditioners, blowers, small cooling fans, etc., is functioning correctly, testing can be conducted at our in-house test center. Please contact us for conditions and details. The "Wind Watcher χ (WWA)" is a suction-type measuring device based on the measurement method of JIS A1431, capable of instantaneously and accurately measuring the airflow at the outlet and inlet. To ensure that the static pressure of the collection hood is equal to the static pressure outside the hood, the operating frequency of the suction fan is automatically controlled, and the airflow at the outlet is measured using a calibrated airflow meter installed downstream of the suction fan. The airflow meter incorporates a rectifying grid and utilizes the "Air Measure," which has excellent installation characteristics. 【Features】 ■ Analog output is also available ■ Minimal measurement error and excellent reproducibility ■ Flexible duct adopted ■ Measurement of airflow at the inlet is also possible ■ NETIS registration number: KT-240015-A *For more details, please refer to the catalog. Feel free to contact us with any inquiries.

  • Wind Speed/Volume Meter
  • Measuring Instrument

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High torque tool measurement compatible Torque measuring device 'KTM-250'

Supports measurement range up to 25Nm! For torque management of high-torque electric screwdrivers! Capable of pass/fail judgment, average value calculation, and real-time data output!

The "KTM Series" allows for torque checks on electric screwdrivers, torque wrenches, and torque drivers, and can also be used for torque management. It is a torque measuring device that can determine the pass/fail status of measurement values based on upper and lower limits, and displays numerical data from the measuring instrument. Inspection reports, calibration certificates, and traceability system diagrams are issued, and calibration support is also available. The "KTM-250" has a measurement range from 5N·m to 25N·m, making it suitable for high-torque tools. We also offer "KTM-6/KTM-15" for small torque tools, capable of measuring minimum torque down to 0.20cN·m, allowing for the measurement of very low torque tools. 【Features】 <KTM-250> ■ Suitable for moment management of various components during continuous work ■ Pass/fail determination of measurement values possible with upper and lower limit settings <KTM-6/KTM-15/KTM-150> ■ Pass/fail determination of measurement values possible with upper and lower limit settings ■ Battery-operated for convenient portability <Common Specifications> ■ Average value calculation ■ Auto power off ■ USB output ■ Auto zero clear ■ Data memory For more details, please refer to the catalog or feel free to contact us.

  • KTM-250-2-min.png
  • driver
  • Measuring Instrument

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Supports micro torque measurement Torque measuring devices 'KTM-6' 'KTM-15'

Battery-operated and easy to carry! For continuous tasks such as moment management of various components.

The "KTM Series" allows for torque checks on electric drivers, torque wrenches, and torque drivers, and can also be used for torque management. It is a torque measuring device that can determine the pass/fail status of measurement values based on upper and lower limit settings. Inspection reports, calibration certificates, and traceability diagrams are issued for all products, and calibration support is also available. The "KTM-6/KTM-15" displays the maximum, minimum, and average values of expected data up to 30 data points, and data output is also possible. We also offer high torque tools "KTM-150/KTM-250," which can measure up to a maximum range of 25Nm, allowing for the measurement of high torque tools. 【Features】 <KTM-6/KTM-15/KTM-150> ■ Pass/fail determination of measurement values is possible with upper and lower limit settings. ■ Battery-operated for convenient portability. <KTM-250> ■ Suitable for moment management of various components during continuous work. ■ Pass/fail determination of measurement values is possible with upper and lower limit settings. *For more details, please refer to the PDF document or feel free to contact us.

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  • Torque Meter
  • Measuring Instrument

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Driver torque measurement compatible Torque measuring device 'KTM-150'

For torque management of electric screwdrivers! Capable of pass/fail judgment, average value calculation, and real-time data output.

The "KTM Series" allows for torque checks on electric screwdrivers, torque wrenches, and torque drivers, and can also be used for torque management. It is a torque measuring device that can determine the pass/fail status of measurements based on upper and lower limit settings. Inspection reports, calibration certificates, and traceability diagrams are issued for all products, and calibration support is also available. The "KTM-150" displays the maximum, minimum, and average values of expected values up to 30 data points, and data output is also possible. With a separately sold measuring joint, torque measurements can be performed in the range of "5-15 N·m." Additionally, the small torque measuring device "KTM-15" can measure minimum torque down to 0.20 cN·m, and tools for measuring extremely small torque are also available. The high torque measuring device "KTM-250" supports high torque up to a maximum of 25 N·m. 【Features】 <KTM-6/KTM-15/KTM-150> ■ Pass/fail determination of measurements is possible with upper and lower limit settings. ■ Battery-operated for convenient portability. <KTM-250> ■ Suitable for moment management of various components during continuous work. ■ Pass/fail determination of measurements is possible with upper and lower limit settings. *For more details, please refer to the PDF document or feel free to contact us.

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  • Torque Meter
  • Measuring Instrument

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Pencil scratch test device

Coating hardness and adhesion strength evaluation testing device

A testing device that evaluates the hardness and adhesion strength (resistance, plastic deformation, cohesive failure, etc.) of a coating film by scratching it with the lead of a pencil of known hardness, assessing the extent of the resulting scratches. It has various functions to ensure uniform testing conditions, making it user-friendly and convenient. Compliant with JIS K5600-5-4, ISO/DIS 15184, and ASTM 3363.

  • Coating thickness gauge
  • Measuring Instrument

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Surface tension measurement license (pendant drop method)

It is possible to add interfacial tension measurement (surface tension measurement) using the pendant drop method as an option for the contact angle meter.

It also supports interfacial tension measurement (pendant drop method), which is closely related to the wetting phenomenon.

  • Other laboratory equipment and containers
  • Measuring Instrument

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Image tool measuring instrument - backfire for counterbore tool <Exhibited at JIMTOF>

We introduce devices that enable high-precision measurement of tool dimensions using a 4K camera with simple operations, as well as back-boring tools that allow for smooth cutting.

Our company will exhibit at "JIMTOF2022" from November 8 to 13, 2022. You can see our recommended products at the venue, including the 'Just Scope-RX' which measures tool dimensions with high precision using a 4K camera, as well as the small diameter series of back counterbore tools and a new series with OH. 【Product Features】 'Just Scope-RX' - Capable of rotating from 0 to 135° - Equipped with a 4K camera for high-resolution imaging - Comes standard with a PC and monitor, allowing for space-saving 'Back Counterbore Cutter Small Diameter Backfire' - Improved rigidity of the main body enables more stable cutting - New lineup from D3 to D36 - D10 and D12 types have improved cutting performance due to the adoption of new 4-corner inserts *For more details, please refer to the materials. Feel free to contact us with any inquiries.

  • Other work tools
  • Measuring Instrument

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Oxygen permeability measurement device

Oxygen permeability measurement device

Love Sync Instruments Co., Ltd. strives to provide the best and most comprehensive quality management solutions in the pharmaceutical, food, cosmetics, packaging, printing, adhesives, automotive, petrochemical, environmental, biological, new energy, construction, aerospace, and electronics industries as an excellent provider of measuring instruments and measurement services.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices
  • Measuring Instrument

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Gas permeability measurement device (double method)

Gas permeability measurement device (double method)

Love Sync Instruments Co., Ltd. strives to provide the best and most comprehensive quality control solutions in the pharmaceutical, food, cosmetics, packaging, printing, adhesives, automotive, petrochemical, environmental, biological, new energy, construction, aerospace, and electronics industries as an excellent provider of measurement instruments and measurement services.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices
  • Measuring Instrument

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Automotive interior material permeability measurement device

Automotive interior material permeability measurement device

Automotive interior material porosity measuring device, measuring automotive interior material porosity, permeability automotive interior materials, automobile interior material, air permeability measurement system Automotive interior material porosity measuring device is a car seat material PVE, form, leather, textiles, etc. Automotive interior material porosity measuring device is JIS P8117, ISO 9237, ISO 4638, ISO 5636 and other standards.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices
  • Measuring Instrument

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Gas permeability measurement device

Gas permeability measurement device

The gas permeability measuring device film, foil, film composite Rezaroido will be used to measure gas permeability of various packaging materials and other materials like Purasuchikkufimuru. The gas transmission rate measurement system solubility coefficient of gas permeation of materials at various temperatures, we measured the diffusion coefficient and permeability. The gas transmission rate measurement system JIS K7126-A, ISO2556, ISO15105-1, ASTM D1434 and other standards.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices
  • Measuring Instrument

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Water vapor permeability measurement device

Water vapor permeability measurement device

Water vapor transmission rate measuring equipment, plastic film to measure the water vapor transmission rate of various materials in the medical field and health barrier and laminated packaging materials. The water vapor transmission rate measuring device complies with standards such as JIS Z0208, JIS K7129, ASTM E96, ASTM D1653, ASTM F1249, ASTM E398, ASTM F372, ISO 2528, ISO 15106-1, ISO 15106-2, and ISO 15106-3.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices
  • Measuring Instrument

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Uniformity measuring instrument "UA-10A Series" high-speed inline inspection

Specialized in high-speed measurement and compatible with inline inspection, high-speed and stable measurement of uniformity.

The Uniformity Measuring Device UA-10A is a compact and lightweight imaging measurement instrument that achieves high-speed evaluation. It is designed with specifications suitable for production processes and comes standard with an SDK for external control. 【Features】 1. High-speed uniformity measurement in just 0.98 seconds 2. Equipped with a 2.3-megapixel CMOS camera 3. Wide-range brightness measurement 4. Three types of lens variations 5. A diverse lineup of analysis software

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Automatic Pass/Fail Judgment of Measurement Results MasterSCALEIII

Elimination of measurement errors by edge sensors! A 2D automatic measuring device that enables efficient measurements.

"MasterSCALEIII" is an automatic measuring device that can perform preliminary setup using Gerber data as a master. It allows for tolerance settings and outputs measurement result reports in Excel format indicating OK or NG. Additionally, it comes in four types to match measurement sizes, accommodating up to a maximum of 1000×1000mm. 【Features】 ■ An automatic measuring device that can perform preliminary setup using Gerber data as a master ■ Allows for tolerance settings and outputs measurement result reports in Excel format indicating OK or NG ■ Copper foil top/bottom measurement with a revolver head (MS-400, 600 option) ■ Four types available to match measurement sizes, supporting a maximum of 1000×1000mm *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • Circuit board design and manufacturing
  • Circuit board processing machine
  • Measuring Instrument

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