Last Updated： Aggregation Period:Aug 12, 2026～Sep 08, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Aug 12, 2026～Sep 08, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Aug 12, 2026～Sep 08, 2026
This ranking is based on the number of page views on our site.
631～660 item / All 3747 items
Lifetime measurement device for single crystal silicon blocks
The lifetime measurement device WT-2000PI uses e-PCD technology to measure minority carrier lifetime in single crystal silicon ingot state without passivation treatment.
The world's only spectroscopic ellipsometer technology for measuring pore rate and pore distribution using an EP (optical porosimeter).
No pre-treatment is required, and measurements can be taken quickly at 20 minutes per point compared to conventional methods.
Thin-film solar cell panel measurement device
In the flat panel display manufacturing market, we have a significant track record in quality control applications.
No need for electrode formation with mercury probes! Provides reduced development time and lower costs in R&D.
The "MCV-530/530L/2200/2500" is a device that enables the evaluation of electrical characteristics of semiconductor silicon wafers and the characteristics of MOS device oxide films, among others. Traditionally, gate electrodes such as Poly-Si or Al were deposited on the wafer, and after forming MOS structures or Schottky structures, CV/IV characteristic evaluations were conducted. This product has its own gate electrode, allowing for the acquisition of electrical characteristics of oxide films and wafers without the need to create a metal gate. It provides quick feedback through process monitoring, reduces development time in R&D, and lowers costs. 【Features】 ■ No need for electrode formation due to the mercury probe ■ Excellent reproducibility ・Schottky: 0.3% (1σ) / MOS: 0.1% (1σ) ■ Mapping of the wafer surface is possible ■ Safe and easy mercury exchange enabled by a newly developed mercury exchange mechanism *For more details, please refer to the PDF document or feel free to contact us.
Trench Depth Measurement Device
Non-contact measurement of deep trenches and TSV shapes of power devices, the depth of DRAM capacitor trenches, CD measurements, and recess measurements. High aspect ratio trench measurements are possible with the proprietary technology MBIR (Model Based Infrared). It also supports the measurement of the vertical profile of the doping concentration of epitaxial films.
Thin film thickness and Young's modulus measurement device
It is possible to measure the thin film thickness, Young's modulus, and Poisson's ratio of a wafer substrate in a non-contact and non-destructive manner.
Effective for analyzing defects and crystal defects! Equipped with interfaces for a wide range of cryostats.
The "DLS-83D/1000" is a measurement device capable of measuring bulk defects and interface states, including temperature, frequency scans, and C-V characteristics. The "DLS-1000" supports high-sensitivity measurements of bulk defects and interface states at the level of 10^8 cm³. It comes standard with a library for easy analysis. It features a unique system that employs a high-sensitivity analog/digital method (analog for measurement and digital for data processing) and is equipped with user-friendly software. 【Features】 ■ Capable of high-sensitivity contamination detection (2x10^8 atoms/cm³) ■ Equipped with a wide range of interfaces for cryostats ■ Capable of measuring temperature, frequency scans, and C-V characteristics ■ Over 100 units delivered worldwide, demonstrating extensive track record *For more details, please refer to the PDF document or feel free to contact us.
Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.
The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.
Function to measure surface and nano structures! Covers from millimeters to atomic level.
We introduce a combined system of Scanning Electron Microscope (SEM) and Atomic Force Microscope (AFM). Using the zoom function of the SEM, the AFM chip can be directly moved to the target area. Information about surface morphology and mechanical, electrical, and magnetic properties can be obtained with nanometer resolution. AFM can be utilized with the Merlin series and Crossbeam series, and existing systems can be updated with a simple door replacement. 【Features】 ■ SEM and FIB intersect with a cantilever chip ■ Composite measurements of all three methods can be performed at the exact same point in space and on the sample ■ Designed to achieve 3D resolution at the single atom level ■ Maintains a minimum SEM working distance of 5mm while allowing a viewing angle of 0° to 85° with the SEM ■ Supports in-situ chip sharpening with FIB *For more details, please refer to the PDF document or feel free to contact us.
Measurement device that enables the use of IR reflectance measurement heads! Achieves high-throughput measurement of epitaxial film thickness.
The "EIR-2500" is a unique epitaxial film thickness measurement device equipped with an infrared spectroscopic reflectometer and FTIR functionality. It achieves high-throughput epitaxial film thickness measurements and fully complies with applicable SEMI/CE standards. Additionally, the EIR product series is based on high-performance and reliable electronic components, improving equipment uptime and reducing maintenance needs. 【Features】 ■ Wafer size: 4 to 12 inches ■ Materials: Si, SOI, SiC, SiGe, III-V, etc. ■ FTIR functionality ■ High-precision measurement of epitaxial film thickness ■ Measurement of film thickness in the transition region *For more details, please refer to the related link page or feel free to contact us.
[Free test available] Instantly measure airflow! An airflow measuring device that provides accurate measurement values.
■Free testing is available If you would like to test whether the airflow of air purifiers, dust collectors, air conditioners, blowers, small cooling fans, etc., is functioning correctly, testing can be conducted at our in-house test center. Please contact us for conditions and details. The "Wind Watcher χ (WWA)" is a suction-type measuring device based on the measurement method of JIS A1431, capable of instantaneously and accurately measuring the airflow at the outlet and inlet. To ensure that the static pressure of the collection hood is equal to the static pressure outside the hood, the operating frequency of the suction fan is automatically controlled, and the airflow at the outlet is measured using a calibrated airflow meter installed downstream of the suction fan. The airflow meter incorporates a rectifying grid and utilizes the "Air Measure," which has excellent installation characteristics. 【Features】 ■ Analog output is also available ■ Minimal measurement error and excellent reproducibility ■ Flexible duct adopted ■ Measurement of airflow at the inlet is also possible ■ NETIS registration number: KT-240015-A *For more details, please refer to the catalog. Feel free to contact us with any inquiries.
Supports measurement range up to 25Nm! For torque management of high-torque electric screwdrivers! Capable of pass/fail judgment, average value calculation, and real-time data output!
The "KTM Series" allows for torque checks on electric screwdrivers, torque wrenches, and torque drivers, and can also be used for torque management. It is a torque measuring device that can determine the pass/fail status of measurement values based on upper and lower limits, and displays numerical data from the measuring instrument. Inspection reports, calibration certificates, and traceability system diagrams are issued, and calibration support is also available. The "KTM-250" has a measurement range from 5N·m to 25N·m, making it suitable for high-torque tools. We also offer "KTM-6/KTM-15" for small torque tools, capable of measuring minimum torque down to 0.20cN·m, allowing for the measurement of very low torque tools. 【Features】 ＜KTM-250＞ ■ Suitable for moment management of various components during continuous work ■ Pass/fail determination of measurement values possible with upper and lower limit settings ＜KTM-6/KTM-15/KTM-150＞ ■ Pass/fail determination of measurement values possible with upper and lower limit settings ■ Battery-operated for convenient portability <Common Specifications> ■ Average value calculation ■ Auto power off ■ USB output ■ Auto zero clear ■ Data memory For more details, please refer to the catalog or feel free to contact us.
Battery-operated and easy to carry! For continuous tasks such as moment management of various components.
The "KTM Series" allows for torque checks on electric drivers, torque wrenches, and torque drivers, and can also be used for torque management. It is a torque measuring device that can determine the pass/fail status of measurement values based on upper and lower limit settings. Inspection reports, calibration certificates, and traceability diagrams are issued for all products, and calibration support is also available. The "KTM-6/KTM-15" displays the maximum, minimum, and average values of expected data up to 30 data points, and data output is also possible. We also offer high torque tools "KTM-150/KTM-250," which can measure up to a maximum range of 25Nm, allowing for the measurement of high torque tools. 【Features】 <KTM-6/KTM-15/KTM-150> ■ Pass/fail determination of measurement values is possible with upper and lower limit settings. ■ Battery-operated for convenient portability. <KTM-250> ■ Suitable for moment management of various components during continuous work. ■ Pass/fail determination of measurement values is possible with upper and lower limit settings. *For more details, please refer to the PDF document or feel free to contact us.
For torque management of electric screwdrivers! Capable of pass/fail judgment, average value calculation, and real-time data output.
The "KTM Series" allows for torque checks on electric screwdrivers, torque wrenches, and torque drivers, and can also be used for torque management. It is a torque measuring device that can determine the pass/fail status of measurements based on upper and lower limit settings. Inspection reports, calibration certificates, and traceability diagrams are issued for all products, and calibration support is also available. The "KTM-150" displays the maximum, minimum, and average values of expected values up to 30 data points, and data output is also possible. With a separately sold measuring joint, torque measurements can be performed in the range of "5-15 N·m." Additionally, the small torque measuring device "KTM-15" can measure minimum torque down to 0.20 cN·m, and tools for measuring extremely small torque are also available. The high torque measuring device "KTM-250" supports high torque up to a maximum of 25 N·m. 【Features】 <KTM-6/KTM-15/KTM-150> ■ Pass/fail determination of measurements is possible with upper and lower limit settings. ■ Battery-operated for convenient portability. <KTM-250> ■ Suitable for moment management of various components during continuous work. ■ Pass/fail determination of measurements is possible with upper and lower limit settings. *For more details, please refer to the PDF document or feel free to contact us.
Coating hardness and adhesion strength evaluation testing device
A testing device that evaluates the hardness and adhesion strength (resistance, plastic deformation, cohesive failure, etc.) of a coating film by scratching it with the lead of a pencil of known hardness, assessing the extent of the resulting scratches. It has various functions to ensure uniform testing conditions, making it user-friendly and convenient. Compliant with JIS K5600-5-4, ISO/DIS 15184, and ASTM 3363.
It is possible to add interfacial tension measurement (surface tension measurement) using the pendant drop method as an option for the contact angle meter.
It also supports interfacial tension measurement (pendant drop method), which is closely related to the wetting phenomenon.
No license required, performance measurement of electromagnetic wave shielding possible in a short time!
【Features】 No need for large measuring instruments, antennas, or other equipment. Simple inspection of shielding performance can be done with two small devices. 〇 Intuitive interface that anyone can use 〇 License-free specific low-power radio equipment 【Two Measurement Modes】 Attenuation Measurement Mode (Displays shielding performance numerically on the LCD) Leakage Detection Mode (Real-time detection of radio wave leakage from the shielded room using numerical values and sound)
We introduce devices that enable high-precision measurement of tool dimensions using a 4K camera with simple operations, as well as back-boring tools that allow for smooth cutting.
Our company will exhibit at "JIMTOF2022" from November 8 to 13, 2022. You can see our recommended products at the venue, including the 'Just Scope-RX' which measures tool dimensions with high precision using a 4K camera, as well as the small diameter series of back counterbore tools and a new series with OH. 【Product Features】 'Just Scope-RX' - Capable of rotating from 0 to 135° - Equipped with a 4K camera for high-resolution imaging - Comes standard with a PC and monitor, allowing for space-saving 'Back Counterbore Cutter Small Diameter Backfire' - Improved rigidity of the main body enables more stable cutting - New lineup from D3 to D36 - D10 and D12 types have improved cutting performance due to the adoption of new 4-corner inserts *For more details, please refer to the materials. Feel free to contact us with any inquiries.
Oxygen permeability measurement device
Love Sync Instruments Co., Ltd. strives to provide the best and most comprehensive quality management solutions in the pharmaceutical, food, cosmetics, packaging, printing, adhesives, automotive, petrochemical, environmental, biological, new energy, construction, aerospace, and electronics industries as an excellent provider of measuring instruments and measurement services.
Gas permeability measurement device (double method)
Love Sync Instruments Co., Ltd. strives to provide the best and most comprehensive quality control solutions in the pharmaceutical, food, cosmetics, packaging, printing, adhesives, automotive, petrochemical, environmental, biological, new energy, construction, aerospace, and electronics industries as an excellent provider of measurement instruments and measurement services.
Automotive interior material permeability measurement device
Automotive interior material porosity measuring device, measuring automotive interior material porosity, permeability automotive interior materials, automobile interior material, air permeability measurement system Automotive interior material porosity measuring device is a car seat material PVE, form, leather, textiles, etc. Automotive interior material porosity measuring device is JIS P8117, ISO 9237, ISO 4638, ISO 5636 and other standards.
Gas permeability measurement device
The gas permeability measuring device film, foil, film composite Rezaroido will be used to measure gas permeability of various packaging materials and other materials like Purasuchikkufimuru. The gas transmission rate measurement system solubility coefficient of gas permeation of materials at various temperatures, we measured the diffusion coefficient and permeability. The gas transmission rate measurement system JIS K7126-A, ISO2556, ISO15105-1, ASTM D1434 and other standards.
Water vapor permeability measurement device
Water vapor transmission rate measuring equipment, plastic film to measure the water vapor transmission rate of various materials in the medical field and health barrier and laminated packaging materials. The water vapor transmission rate measuring device complies with standards such as JIS Z0208, JIS K7129, ASTM E96, ASTM D1653, ASTM F1249, ASTM E398, ASTM F372, ISO 2528, ISO 15106-1, ISO 15106-2, and ISO 15106-3.
Specialized in high-speed measurement and compatible with inline inspection, high-speed and stable measurement of uniformity.
The Uniformity Measuring Device UA-10A is a compact and lightweight imaging measurement instrument that achieves high-speed evaluation. It is designed with specifications suitable for production processes and comes standard with an SDK for external control. 【Features】 1. High-speed uniformity measurement in just 0.98 seconds 2. Equipped with a 2.3-megapixel CMOS camera 3. Wide-range brightness measurement 4. Three types of lens variations 5. A diverse lineup of analysis software
Elimination of measurement errors by edge sensors! A 2D automatic measuring device that enables efficient measurements.
"MasterSCALEIII" is an automatic measuring device that can perform preliminary setup using Gerber data as a master. It allows for tolerance settings and outputs measurement result reports in Excel format indicating OK or NG. Additionally, it comes in four types to match measurement sizes, accommodating up to a maximum of 1000×1000mm. 【Features】 ■ An automatic measuring device that can perform preliminary setup using Gerber data as a master ■ Allows for tolerance settings and outputs measurement result reports in Excel format indicating OK or NG ■ Copper foil top/bottom measurement with a revolver head (MS-400, 600 option) ■ Four types available to match measurement sizes, supporting a maximum of 1000×1000mm *For more details, please refer to the PDF document or feel free to contact us.
Automatic measurement just by placing the circuit board on the table! Simultaneous measurement and inspection of multiple circuit boards.
"QuickSCALE" is a data reference image measurement device that requires no alignment and is alignment-free. It can measure multiple circuit boards simultaneously. Simply place the circuit boards on the table, and it will automatically measure the board outline, slits, hole diameters, and more in an instant. 【Features】 ■ Alignment-free and requires no positioning ■ Measurement points can be set from Gerber data ■ Tolerances can be set, and pass/fail judgment is made during board dimension measurement ■ Measurement results can be output as reports in print or Excel ■ Capable of measuring multiple circuit boards simultaneously *For more details, please refer to the PDF materials or feel free to contact us.
Quick and accurate measurement of adhesion force of fine particles such as toner and drugs is possible! [Contract Measurement]
It is a device that can measure the adhesion force of fine particles (a few microns) using our unique know-how. It allows for easy measurement of the adhesion force of individual particles. In addition to adhesion force, it is also capable of measuring rolling friction force, and the ratio of adhesion force to friction force can be examined. 【Features】 ■ Can evaluate the adhesion force of general powders ■ Can evaluate the adhesion of toner (Quantification of adhesion force between toner and OPC, transfer belt, etc.) ■ Can evaluate the temperature-dependent adhesion force of toner (Quantification of adhesion force changes due to temperature) ■ Can evaluate the adhesion of raw powder to manufacturing equipment ■ Can predict and evaluate cleaning performance for semiconductors and other applications *For more details, please refer to the PDF document or feel free to contact us.
Measure static electricity! Numerical measurement of the static electricity diffusion rate on the surface of various materials!
The "NS-D100 model" is a device that can measure the electrostatic charge diffusion rate under environmental conditions specified by the Japanese Industrial Standard JISC61340-2-1 (international standard IEC61340-2-1) at a temperature of 23°C ± 2°C and relative humidity of 12 ± 3%. It allows for the numerical evaluation of electrostatic phenomena that have previously been perceived intuitively. This will enhance the understanding of the significant effects of static electricity and charging phenomena. 【Features】 ■ Can evaluate the diffusion rate of static electricity on the surfaces of various materials ■ Effective across a wide range of material fields including powders, metals, plastic surfaces, rubber, fabric, ceramics, etc. ■ Measurement is possible even with oils (non-volatile) and aqueous solutions ■ Differences in surfaces due to cleaning can be measured through electrostatic phenomena ■ Can evaluate the relationship between adhesion force and static electricity *For more details, please refer to the PDF document or feel free to contact us.
It is possible to measure the drying weight loss of tablets, granules, and powdered raw materials, as well as the amount of moisture absorption [contract measurement].
Simultaneous measurement of moisture behavior, such as drying weight reduction and moisture adsorption, can be conducted on multiple samples. Our unique weight measurement system, which withstands high-load environments, has expanded the application range of moisture measurement. Various measurements related to moisture behavior, such as drying rate measurement of solutions and drying tests for food, are possible. 【Features】 ■ Compact, tabletop design for space-saving ■ Measurement possible even at 20°C ■ Capable of measuring the moisture permeability constant of membranes and films ■ Simultaneous measurement of up to 9 samples under the same conditions allows for quick measurements ■ Analysis of drying speed for inks and other materials is possible *For more details, please refer to the PDF document or feel free to contact us.
A device suitable for evaluating the flowability of powders has arrived! It enables high-precision and reproducible assessments!
The "NS-S Series" is a powder property evaluation device that can provide highly accurate and reproducible assessments of the powder properties of raw materials and intermediate products (flowability, internal friction angle, adhesion, and stress relaxation). The powder layer shear force measurement device can evaluate various mechanical powder properties by simultaneously measuring the vertical compressive force and the horizontal shear force of the powder layer. Furthermore, we will provide the analysis data from contract measurements! (*For a fee) 【Features】 ■ Measurement is possible with just 1cc of powder ■ Both constant pressure shear tests and constant volume shear tests can be conducted with this single device ■ Easy cleaning after each measurement, allowing for measurements in just 10 minutes ■ Can also be used to evaluate sticking phenomena ■ Capable of measuring various powders such as resin powders, pharmaceutical raw material powders, and cosmetic ingredient powders *For more details, please refer to the PDF document or feel free to contact us.
